2023 journal article
Evolution of dislocation loops and voids in post-irradiation annealed ThO<sub>2</sub>: A combined <i>in-situ</i> TEM and cluster dynamics investigation
JOURNAL OF NUCLEAR MATERIALS, 586.
author keywords: Thorium dioxide; Post-irradiation annealing; Loop coarsening; Void growth; Cluster dynamics; Interstitials and vacancies
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(Web of Science)
Source: Web Of Science
Added: October 16, 2023
The effect of isochronal annealing on the evolution of dislocation loop and void population in proton irradiated ThO2 has been investigated. Post-irradiation annealing in other actinide oxides like UO2 shows significant loop coarsening. ThO2 samples were irradiated with 2 MeV protons up to a dose of 0.1 dpa at 600 °C. Post-irradiation isochronal annealing was performed at 600, 800, 1000 and 1100 °C for 1 h at each temperature using in-situ TEM. Only faulted 1/3<111> type dislocation loops were observed, and their sizes and distribution were characterized. The population of self-interstitial atom (SIA) dislocation loops did not show any significant growth and coarsening. Additionally, nanometric voids were observed at annealing temperatures of 1000 and 1100 °C. Using cluster dynamics (CD), we have studied the nucleation and growth of point defects and defect clusters, i.e., SIA prismatic dislocation loops and nanometric and sub-nanometric voids in proton irradiated ThO2. The CD model was further utilized to predict the growth and coarsening of loops and voids during isochronal annealing at the experimental and higher temperatures. The model did not predict significant SIA loop growth which closely corresponds to the TEM observations. CD predicted SIA loop coarsening is insignificant even at high annealing temperature of 1500 °C because the model only considers the growth of defect clusters by absorption of like point defects, i.e., SIA loops absorb interstitials and voids absorb vacancies, and cannot account for their migration and coalescence due to elastic interaction. The CD model also predicts the evolution of nanometric voids having mean size within the error bounds of TEM observations.