2019 journal article

Embedded void approach effects on intrinsic stresses in laterally grown GaN-on-Si substrate

MATERIALS SCIENCE AND ENGINEERING B-ADVANCED FUNCTIONAL SOLID-STATE MATERIALS, 242, 104–110.

By: S. Salah, T. Hatem, E. Khalil & S. Bedair

Source: Web Of Science
Added: May 13, 2019