2017 conference paper

Investigating dielectric impedance spectroscopy as a non-destructive quality assessment tool for 3D cellular constructs

Proceedings of the ASME 12th International Manufacturing Science and Engineering Conference - 2017, vol 4.

By: L. Narayanan, T. Thompson, A. Bhat, B. Starly & R. Shirwaiker

Source: NC State University Libraries
Added: August 6, 2018