2017 | conference paper

Investigating dielectric impedance spectroscopy as a non-destructive quality assessment tool for 3D cellular constructs

In Proceedings of the ASME 12th International Manufacturing Science and Engineering Conference - 2017, vol 4.

By: L. Narayanan, T. Thompson, A. Bhat, B. Starly & R. Shirwaiker

10.1115/msec2017-2725
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Source: NC State University Libraries