Ok-Hyun Nam

Gallium nitride semiconductor structure including laterally offset patterned layers

Washington, DC: U.S. Patent and Trademark Office.

Gallium nitride semiconductor structures including lateral gallium nitride layers

Washington, DC: U.S. Patent and Trademark Office.

Methods of fabricating gallium nitride semiconductor layers by lateral overgrowth

Washington, DC: U.S. Patent and Trademark Office.

The influence of band offsets on the IV characteristics for GaN/SiC heterojunctions

Danielsson, E., Zetterling, C.-M., Östling, M., Linthicum, K., Thomson, D. B., Nam, O.-H., & Davis, R. F. (2002, June 1). Solid-State Electronics.

Lateral epitaxy and dislocation density reduction in selectively grown GaN structures

Zheleva, T. S., Nam, O.-H., Ashmawi, W. M., Griffin, J. D., & Davis, R. F. (2001, February 1). Journal of Crystal Growth.

Dry etching and metallization schemes in a GaN/SiC heterojunction device process

Materials Science Forum, 338(3), 1049–1052.

Gallium nitride semiconductor structures including a lateral gallium nitride layer that extends from an underlying gallium nitride layer

Washington, DC: U.S. Patent and Trademark Office.

Lateral- and pendeo-epitaxial growth and defect reduction in GaN thin films

Materials Science Forum, 338(3), 1471–1476.

Growth, doping and characterization of epitaxial thin films and patterned structures of AlN, GaN, and AlxGa1−xN

Hanser, A. D., Nam, O.-H., Bremser, M. D., Thomson, D. B., Gehrke, T., Zheleva, T. S., & Davis, R. F. (1999, March 1). Diamond and Related Materials.

Simulation and electrical characterization of GaN/SiC and AlGaN/SiC heterodiodes

Materials Science & Engineering. B, Solid-State Materials for Advanced Technology, 61-2(1999 July 30), 320–324.

Thermal mismatch stress relaxation via lateral epitaxy in selectively grown GaN structures

Zheleva, T. S., Ashmawi, W. M., Nam, O.-H., & Davis, R. F. (1999, April 26). Applied Physics Letters.

Acceptor and donor doping of AlxGa1−xN thin film alloys grown on 6H-SiC(0001) substrates via metalorganic vapor phase epitaxy

Bremser, M. D., Perry, W. G., Nam, O. H., Griffis, D. P., Loesing, R., Ricks, D. A., & Davis, R. F. (1998, April 1). Journal of Electronic Materials.

Electron emission characteristics of GaN pyramid arrays grown via organometallic vapor phase epitaxy

Ward, B. L., Nam, O.-H., Hartman, J. D., English, S. L., McCarson, B. L., Schlesser, R., … Nemanich, R. J. (1998, November 1). Journal of Applied Physics.

Electron emission properties of crystalline diamond and III-nitride surfaces

Nemanich, R. J., Baumann, P. K., Benjamin, M. C., Nam, O.-H., Sowers, A. T., Ward, B. L., … Davis, R. F. (1998, June 1). Applied Surface Science, Vol. 132, pp. 694–703.

Lateral epitaxial overgrowth of GaN films on SiO2 areas via metalorganic vapor phase epitaxy

Nam, O.-H., Zheleva, T. S., Bremser, M. D., & Davis, R. F. (1998, April 1). Journal of Electronic Materials.

Optical and structural properties of lateral epitaxial overgrown GaN layers

Journal of Crystal Growth, 190(1998 June), 92–96.

Optical characterization of lateral epitaxial overgrown GaN layers

Freitas, J. A., Nam, O.-H., Davis, R. F., Saparin, G. V., & Obyden, S. K. (1998, June 8). Applied Physics Letters.

Photoelectrochemical Capacitance-Voltage Measurements in GaN

Stutz, C. E., Mack, M., Bremser, M. D., Nam, O. H., Davis, R. F., & Look, D. C. (1998, May 1). Journal of Electronic Materials.

Growth of GaN and Al_0.2Ga_0.8N on Patterened Substrates via Organometallic Vapor Phase Epitaxy

Nam, O.-H., Bremser, M. D., Ward, B. L., Nemanich, R. J., & Davis, R. F. D. R. F. (1997, May 1). Japanese Journal of Applied Physics.

Growth, doping and characterization of AlxGa1 − xN thin film alloys on 6H-SiC(0001) substrates

Bremser, M. D., Perry, W. G., Zheleva, T., Edwards, N. V., Nam, O. H., Parikh, N., … Davis, R. F. (1997, March 1). Diamond and Related Materials, Vol. 6, pp. 196–201.

Lateral epitaxy of low defect density GaN layers via organometallic vapor phase epitaxy

Applied Physics Letters, 71(18), 2698–2640.

Variation of GaN valence bands with biaxial stress and quantification of residual stress

Edwards, N. V., Yoo, S. D., Bremser, M. D., Weeks, T. W., Nam, O. H., Davis, R. F., … Aspnes, D. E. (1997, April 14). Applied Physics Letters, Vol. 70, p. 2001.