Zbigniew J. Radzimski

Works (5)

Updated: March 10th, 2025 12:14

1999 article

Bias Dependent Contrast Mechanisms in EBIC Images of MOS Capacitors

Kirk, H. R., Radzimski, Z., Romanowski, A., & Rozgonyi, G. A. (1999, April 1). Journal of The Electrochemical Society.

By: H. Kirk n, Z. Radzimski*, A. Romanowski n & G. Rozgonyi n

topics (OpenAlex): Semiconductor materials and devices; Anodic Oxide Films and Nanostructures; Electron and X-Ray Spectroscopy Techniques
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Source: Web Of Science
Added: August 6, 2018

1998 journal article

Directional copper deposition using dc magnetron self-sputtering

Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures, 16(3), 1102–1106.

By: Z. Radzimski, W. Posadowski, S. Rossnagel & S. Shingubara

Source: NC State University Libraries
Added: August 6, 2018

1998 article

Medium Field Breakdown Origin on Metal Oxide Semiconductor Capacitor Containing Grown-in Czochralski Silicon Crystal Defects

Tamatsuka, M., Radzimski, Z., Rozgonyi, G. A., Oka, S., Kato, M., & Kitagawara, Y. (1998, March 1). Japanese Journal of Applied Physics.

By: M. Tamatsuka n, Z. Radzimski n, G. Rozgonyi n, S. Oka*, M. Kato * & Y. Kitagawara*

author keywords: grown-in defect; oxide breakdown; electron beam induced current; vacancy cluster; focused ion beam; local tunneling current; Fowler-Nordheim tunneling current
topics (OpenAlex): Thin-Film Transistor Technologies; Semiconductor materials and devices; Silicon and Solar Cell Technologies
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Source: Web Of Science
Added: August 6, 2018

1997 article

Metallic Impurity Gettering and Secondary Defect Formation in Megaelectron Volt Self‐Implanted Czochralski and Float‐Zone Silicon

Brown, R. A., Kononchuk, O., Bondarenko, I., Romanowski, A., Radzimski, Z., Rozgonyi, G. A., & Gonzalez, F. (1997, August 1). Journal of The Electrochemical Society.

By: R. Brown n, O. Kononchuk n, I. Bondarenko n, A. Romanowski n, Z. Radzimski n, G. Rozgonyi n, F. Gonzalez  n

topics (OpenAlex): Silicon and Solar Cell Technologies; Integrated Circuits and Semiconductor Failure Analysis; Semiconductor materials and devices
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Source: Web Of Science
Added: August 6, 2018

1997 article

The effect of oxygen on secondary defect formation in MeV self-implanted silicon

Brown, R. A., Kononchuk, O., Radzimski, Z., Rozgonyi, G. A., & Gonzalez, F. (1997, May 1). Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms.

By: R. Brown  n, O. Kononchuk  n, Z. Radzimski n, G. Rozgonyi n & F. Gonzalez *

topics (OpenAlex): Silicon and Solar Cell Technologies; Ion-surface interactions and analysis; Silicon Nanostructures and Photoluminescence
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Source: Web Of Science
Added: August 6, 2018

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