1999 journal article

Bias dependent contrast mechanisms in EBIC images of MOS capacitors

Journal of the Electrochemical Society, 146(4), 1529–1535.

By: H. Kirk, Z. Radzimski, A. Romanowski & G. Rozgonyi

Source: NC State University Libraries
Added: August 6, 2018

1998 journal article

Directional copper deposition using dc magnetron self-sputtering

Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures, 16(3), 1102–1106.

By: Z. Radzimski, W. Posadowski, S. Rossnagel & S. Shingubara

Source: NC State University Libraries
Added: August 6, 2018

1998 journal article

Medium field breakdown origin on metal oxide semiconductor capacitor containing grown-in Czochralski silicon crystal defects

Japanese Journal of Applied Physics. Part 1, Regular Papers, Short Notes & Review Papers, 37(3B), 1236–1239.

By: M. Tamatsuka, Z. Radzimski, G. Rozgonyi, S. Oka, M. Kato & Y. Kitagawara

Source: NC State University Libraries
Added: August 6, 2018

1997 journal article

Metallic impurity gettering and secondary defect formation in megaelectron volt self-implanted Czochralski and float-zone silicon

Journal of the Electrochemical Society, 144(8), 2872–2881.

By: R. Brown, O. Kononchuk, I. Bondarenko, A. Romanowski, Z. Radzimski, G. Rozgonyi, F. Gonzalez

Source: NC State University Libraries
Added: August 6, 2018

1997 journal article

The effect of oxygen on secondary defect formation in MeV self-implanted silicon

Nuclear Instruments & Methods in Physics Research. Section B, Beam Interactions With Materials and Atoms, 127(1997 May), 55–58.

By: R. Brown, O. Kononchuk, Z. Radzimski, G. Rozgonyi & F. Gonzalez

Source: NC State University Libraries
Added: August 6, 2018