1999 journal article

Bias dependent contrast mechanisms in EBIC images of MOS capacitors

JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 146(4), 1529–1535.

By: H. Kirk n, Z. Radzimski*, A. Romanowski n & G. Rozgonyi n

Source: Web Of Science
Added: August 6, 2018

1999 journal article

Oxide precipitate-induced dislocation generation in heavily boron-doped Czochralski silicon

JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 146(9), 3461–3465.

By: T. Ono n, A. Romanowski n, E. Asayama*, H. Horie, K. Sueoka, H. Tsuya*, G. Rozgonyi n

co-author countries: Japan 🇯🇵
Source: Web Of Science
Added: August 6, 2018

1999 journal article

Simulation of void and oxygen precipitation processes during high temperature annealing of silicon wafers

JOURNAL OF APPLIED PHYSICS, 85(9), 6408–6414.

By: A. Romanowski n, G. Rozgonyi n & M. Tamatsuka*

co-author countries: Japan 🇯🇵
Source: Web Of Science
Added: August 6, 2018

1998 journal article

Frequency-resolved microwave reflection photoconductance

JOURNAL OF APPLIED PHYSICS, 83(12), 7730–7735.

By: A. Romanowski n, A. Buczkowski*, A. Karoui n & G. Rozgonyi n

Source: Web Of Science
Added: August 6, 2018

1997 journal article

Metallic impurity gettering and secondary defect formation in megaelectron volt self-implanted Czochralski and float-zone silicon

JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 144(8), 2872–2881.

By: R. Brown n, O. Kononchuk n, I. Bondarenko n, A. Romanowski n, Z. Radzimski n, G. Rozgonyi n, F. Gonzalez n

Source: Web Of Science
Added: August 6, 2018

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