Works (5)
1999 journal article
Bias dependent contrast mechanisms in EBIC images of MOS capacitors
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 146(4), 1529–1535.
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1999 journal article
Oxide precipitate-induced dislocation generation in heavily boron-doped Czochralski silicon
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 146(9), 3461–3465.
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1999 journal article
Simulation of void and oxygen precipitation processes during high temperature annealing of silicon wafers
JOURNAL OF APPLIED PHYSICS, 85(9), 6408–6414.
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1998 journal article
Frequency-resolved microwave reflection photoconductance
JOURNAL OF APPLIED PHYSICS, 83(12), 7730–7735.
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1997 journal article
Metallic impurity gettering and secondary defect formation in megaelectron volt self-implanted Czochralski and float-zone silicon
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 144(8), 2872–2881.
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