1999 journal article
Bias dependent contrast mechanisms in EBIC images of MOS capacitors
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 146(4), 1529–1535.
1999 journal article
Oxide precipitate-induced dislocation generation in heavily boron-doped Czochralski silicon
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 146(9), 3461–3465.
1999 journal article
Simulation of void and oxygen precipitation processes during high temperature annealing of silicon wafers
JOURNAL OF APPLIED PHYSICS, 85(9), 6408–6414.
1998 journal article
Frequency-resolved microwave reflection photoconductance
JOURNAL OF APPLIED PHYSICS, 83(12), 7730–7735.
1997 journal article
Metallic impurity gettering and secondary defect formation in megaelectron volt self-implanted Czochralski and float-zone silicon
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 144(8), 2872–2881.
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