Phillip E. Russell Dhawan, A., Muth, J. F., Leonard, D. N., Gerhold, M. D., Gleeson, J., Vo-Dinh, T., & Russell, P. E. (2008, November). Focused in beam fabrication of metallic nanostructures on end faces of optical fibers for chemical sensing applications. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, Vol. 26, pp. 2168–2173. https://doi.org/10.1116/1.3013329 Parish, C. M., & Russell, P. E. (2007). Scanning cathodoluminescence microscopy. Advances in Imaging and Electron Physics, Vol 147, 147, 1–135. Parish, C. M., & Russell, P. E. (2006). On the use of Monte Carlo modeling in the mathematical analysis of scanning electron microscopy-electron beam induced current data. Applied Physics Letters, 89(19). Bunker, K. L., Garcia, R., & Russell, P. E. (2005). Scanning electron microscopy cathodoluminescence studies of piezoelectric fields in an InGaN/GaN quantum-well light-emitting diode. APPLIED PHYSICS LETTERS, 86(8). https://doi.org/10.1063/1.1868886 Mosselveld, F., Makarov, VV, Lundquist, T. R., Griffis, D. P., & Russell, P. E. (2004, June). Circuit editing of copper and low-k dielectrics in nanotechnology devices. JOURNAL OF MICROSCOPY, Vol. 214, pp. 246–251. https://doi.org/10.1111/j.0022-2720.2004.01337.x Edmond, J., Abare, A., Bergman, M., Bharathan, J., Bunker, K. L., Emerson, D., … Slater, D. (2004). High efficiency GaN-based LEDs and lasers on SiC. Journal of Crystal Growth, 272(04-Jan), 242–250. Russell, P. E., Griffis, D. P., & Gonzales Perez, J. C. (2003). Chemically enhanced focused ion beam micro-machining of copper. Washington, DC: U.S. Patent and Trademark Office. Bender, J. W., Salmon, M. E., & Russell, P. E. (2003). Combined atomic force microscopy and scanning tunneling microscopy imaging of cross-sectioned GaN light-emitting diodes. Scanning, 25(1), 45–51. Silva, M. I. N., Gonzalez, J. C., & Russell, P. E. (2003). Cross-sectional Scanning Probe Microscopy of GaN-based p-n heterostructures. MICROELECTRONICS JOURNAL, Vol. 34, pp. 571–573. https://doi.org/10.1016/S0026-2692(03)00051-X Gonzalez, J. C., Silva, M. I. N., Bunker, K. L., Batchelor, A. D., & Russell, P. E. (2003). Electrical characterization of InGaN quantum well p-n heterostructures. MICROELECTRONICS JOURNAL, Vol. 34, pp. 455–457. https://doi.org/10.1016/S0026-2692(03)00072-7 Wang, J. H., Griffis, D. P., Garcia, R., & Russell, P. E. (2003). Etching characteristics of chromium thin films by an electron beam induced surface reaction. SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 18(4), 199–205. https://doi.org/10.1088/0268-1242/18/4/302 Gonzalez, J. C., Silva, M. I. N., Griffis, D. P., & Russell, P. E. (2002). Improvements in focused ion beam micromachining of interconnect materials. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, Vol. 20, pp. 2700–2704. https://doi.org/10.1116/1.1515310 Leonard, D. N., Russell, P. E., Smith, S. D., & Spontak, R. J. (2002). Multiscale dewetting of low-molecular-weight block copolymer ultrathin films. MACROMOLECULAR RAPID COMMUNICATIONS, 23(3), 205–209. https://doi.org/10.1002/1521-3927(20020201)23:3<205::AID-MARC205>3.0.CO;2-X Leonard, D. N., Spontak, R. J., Smith, S. D., & Russell, P. E. (2002). Topological coarsening of low-molecular-weight block copolymer ultrathin films by environmental AFM. POLYMER, 43(25), 6719–6726. https://doi.org/10.1016/S0032-3861(02)00640-7 Gonzalez, J. C., Griffis, D. P., Miau, T. T., & Russell, P. E. (2001). Chemically enhanced focused ion beam micromachining of copper. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, Vol. 19, pp. 2539–2542. https://doi.org/10.1116/1.1418406 Gonzalez, J. C., Bunker, K. L., & Russell, P. E. (2001). Minority-carrier diffusion length in a GaN-based light-emitting diode. APPLIED PHYSICS LETTERS, 79(10), 1567–1569. https://doi.org/10.1063/1.1400075 Neves, B. R. A., Salmon, M. E., Troughton, E. B., & Russell, P. E. (2001, September). Self-healing on OPA self-assembled monolayers. NANOTECHNOLOGY, Vol. 12, pp. 285–289. https://doi.org/10.1088/0957-4484/12/3/315 Neves, B. R. A., Salmon, M. E., Russell, P. E., & Troughton, E. B. (2001). Spread coating of OPA on mica: From multilayers to self-assembled monolayers. LANGMUIR, 17(26), 8193–8198. https://doi.org/10.1021/la010909a Phillips, JR, Griffis, D. P., & Russell, P. E. (2000). Channeling effects during focused-ion-beam micromachining of copper. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, Vol. 18, pp. 1061–1065. https://doi.org/10.1116/1.582300 Jarausch, K. F., Kiely, J. D., Houston, J. E., & Russell, P. E. (2000). Defect-dependent elasticity: Nanoindentation as a probe of stress state. JOURNAL OF MATERIALS RESEARCH, 15(8), 1693–1701. https://doi.org/10.1557/JMR.2000.0244 Leonard, D. N., Spontak, R. J., & Russell, P. E. (2000). Environmental atomic force microscopy: Probing diblock polymer thin films and self-assembling molecules at various temperatures and pressures. In D. B. Williams & R. Shimizu (Eds.), Microbeam Analysis 2000: proceedings of the Second Conference of the International Union of Microbeam Analysis Societies held in Kailua-Kona, Hawaii, 9-14 July 2000 (Vol. 165, pp. 389–390). Bristol: Institute of Physics Publishing. Russell, P. E., Griffis, D. P., Shedd, G. M., Stark, T. J., & Vitarelli, J. (2000). Method for water vapor enhanced charged-particle-beam machining. Washington, DC: U.S. Patent and Trademark Office. Neves, B. R. A., Salmon, M. E., Leonard, D. N., Troughton, E. B., & Russell, P. E. (2000). Scratching and healing investigations on self-assembled monolayers using Atomic Force Microscopy. In D. B. Williams & R. Shimizu (Eds.), Microbeam Analysis 2000: proceedings of the Second Conference of the International Union of Microbeam Analysis Societies held in Kailua-Kona, Hawaii, 9-14 July 2000 (Vol. 165, pp. 367–368). Bristol: Institute of Physics Publishing. Neves, B. R. A., Salmon, M. E., Russell, P. E., & Troughton, E. B. (2000). Thermal stability study of self-assembled monolayers on mica. Neves, B. R. A., Salmon, M. E., Russell, P. E., & Troughton, E. B. (1999). Comparative study of field emission-scanning electron microscopy and atomic force microscopy to assess self-assembled monolayer coverage on any type of substrate. MICROSCOPY AND MICROANALYSIS, 5(6), 413–419. https://doi.org/10.1017/S1431927699990475 Neves, B. R. A., Vilela, J. M. C., Russell, P. E., Reis, A. C. C., & Andrade, M. S. (1999). Imaging micro-cracks in gold films: a comparative study of scanning tunneling and atomic force microscopies. ULTRAMICROSCOPY, 76(1-2), 61–67. https://doi.org/10.1016/S0304-3991(98)00071-0 Kiely, J. D., Jarausch, K. F., Houston, J. E., & Russell, P. E. (1999). Initial stages of yield in nanoindentation. JOURNAL OF MATERIALS RESEARCH, 14(6), 2219–2227. https://doi.org/10.1557/JMR.1999.0298 Russell, P. E., Griffis, D. P., Shedd, G. M., Stark, T. J., & Vitarelli, J. (1999). Method for water vapor enhanced charged-particle-beam machining. Washington, DC: U.S. Patent and Trademark Office. Neves, B. R. A., Leonard, D. N., Salmon, M. E., Russell, P. E., & Troughton, E. B. (1999). Observation of topography inversion in atomic force microscopy of self-assembled monolayers. NANOTECHNOLOGY, 10(4), 399–404. https://doi.org/10.1088/0957-4484/10/4/307 Russell, P. E., Stark, T. J., Griffis, D. P., Phillips, JR, & Jarausch, K. F. (1998). Chemically and geometrically enhanced focused ion beam micromachining. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, Vol. 16, pp. 2494–2498. https://doi.org/10.1116/1.590197 Musselman, I. H., & Russell, P. E. (1992). Method of fabricating scanning tunneling microscope tips. Washington, DC: U.S. Patent and Trademark Office. Musselman, I. H., & Russell, P. E. (1992). Scanning tunneling microscope tips. Washington, DC: U.S. Patent and Trademark Office.