Charles Kenneth Williams
Works (10)
2010 article
H-ras Consensus Sequence and Mutations in Primary Hepatocellular Carcinomas of Lemurs and Lorises
Cullen, J. M., Williams, C., Zadrozny, L., Otstot, J. T., Solomon, G. G., Sills, R. C., & Hong, H.-H. L. (2010, December 1). Veterinary Pathology.
2001 patent
Methods of raising reflow temperature of glass alloys by thermal treatment in steam, and microelectronic structures formed thereby
Washington, DC: U.S. Patent and Trademark Office.
2000 article
Deposition and Characterization of Undoped and Boron and Phosphorus Doped (Si[sub x]Ge[sub 1−x]O[sub 2]) Glass Films
Simpson, D. L., Croswell, R. T., Reisman, A., Williams, C. K., & Temple, D. (2000, January 1). Journal of The Electrochemical Society.
2000 article
Planarization Processes and Applications III. As-Deposited and Annealed Film Properties
Croswell, R. T., Reisman, A., Simpson, D. L., Temple, D., & Williams, C. K. (2000, January 1). Journal of The Electrochemical Society.
1999 article
Differential Thermal Analysis of Glass Mixtures Containing SiO2, GeO2, B 2 O 3, and P 2 O 5
Croswell, R. T., Reisman, A., Simpson, D. L., Temple, D., & Williams, C. K. (1999, December 1). Journal of The Electrochemical Society.
1999 article
Planarization Processes and Applications: I. Undoped GeO2 ‐ SiO2 Glasses
Simpson, D. L., Croswell, R. T., Reisman, A., Temple, D., & Williams, C. K. (1999, October 1). Journal of The Electrochemical Society.
1999 article
Planarization Processes and Applications: II. B 2 O 3 / P 2 O 5 Doped GeO2 ‐ SiO2 Glasses
Simpson, D. L., Croswell, R. T., Reisman, A., Temple, D., & Williams, C. K. (1999, October 1). Journal of The Electrochemical Society.
1998 article
Low-field bulk defect generation during uniform carrier injection into the gate insulator of insulated gate field effect transistors at various temperatures
Kim, H. S., Williams, C. K., & Reisman, A. (1998, July 1). Journal of Electronic Materials.
1997 article
Charge centroid and origin of generated and intrinsic bulk defects at 293 and 100 K in insulated gate field effect transistors
Kim, H. S., Williams, C. K., & Reisman, A. (1997, February 1). Journal of Applied Physics.
1997 article
Low‐Field Trap Generation Dependence on the Injection Current Density in Gate Insulators: How Valid Are Accelerated Hot Electron Measurements?
Kim, H. S., Reisman, A., & Williams, C. K. (1997, July 1). Journal of The Electrochemical Society.