Methods of raising reflow temperature of glass alloys by thermal treatment in steam, and microelectronic structures formed thereby
Washington, DC: U.S. Patent and Trademark Office.
1998 journal article
Low-field bulk defect generation during uniform carrier injection into the gate insulator of insulated gate field effect transistors at various temperatures
Journal of Electronic Materials, 27(7), 908–914.
1997 journal article
Low-field trap generation dependence on the injection current density in gate insulators: How valid are accelerated hot electron measurements?
Journal of the Electrochemical Society, 144(7), 2517–2521.