Works (10)

Updated: April 11th, 2023 10:13

2011 journal article

H-ras Consensus Sequence and Mutations in Primary Hepatocellular Carcinomas of Lemurs and Lorises

VETERINARY PATHOLOGY, 48(4), 868–874.

By: J. Cullen, C. Williams, L. Zadrozny, J. Otstot*, G. Solomon*, R. Sills, H. Hong*

author keywords: liver; molecular biology; oncology; primate; zoo; hepatocellular carcinoma
Source: Web Of Science
Added: August 6, 2018

2001 patent

Methods of raising reflow temperature of glass alloys by thermal treatment in steam, and microelectronic structures formed thereby

Washington, DC: U.S. Patent and Trademark Office.

Source: NC State University Libraries
Added: August 6, 2018

2000 journal article

Deposition and characterization of undoped and boron and phosphorus doped (SixGe1-xO2) glass films

JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 147(4), 1560–1567.

Source: Web Of Science
Added: August 6, 2018

2000 journal article

Planarization processes and applications III. As-deposited and annealed film properties

JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 147(4), 1513–1524.

By: R. Croswell, A. Reisman, D. Simpson n, D. Temple & C. Williams

Source: Web Of Science
Added: August 6, 2018

1999 journal article

Differential thermal analysis of glass mixtures containing SiO2, GeO2, B2O3, and P2O5

JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 146(12), 4569–4579.

By: R. Croswell, A. Reisman, D. Simpson, D. Temple & C. Williams

Source: Web Of Science
Added: August 6, 2018

1999 journal article

Planarization processes and applications - I. Undoped GeO2-SiO2 glasses

JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 146(10), 3860–3871.

By: D. Simpson n, R. Croswell, A. Reisman, D. Temple & C. Williams

Source: Web Of Science
Added: August 6, 2018

1999 journal article

Planarization processes and applications - II. B2O3/P2O5 doped GeO2-SiO2 classes

JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 146(10), 3872–3885.

By: D. Simpson n, R. Croswell, A. Reisman, D. Temple & C. Williams

Source: Web Of Science
Added: August 6, 2018

1998 journal article

Low-field bulk defect generation during uniform carrier injection into the gate insulator of insulated gate field effect transistors at various temperatures

JOURNAL OF ELECTRONIC MATERIALS, 27(7), 908–914.

By: H. Kim n, C. Williams & A. Reisman

author keywords: electron trapping; oxide defects; trap generation
Source: Web Of Science
Added: August 6, 2018

1997 journal article

Charge centroid and origin of generated and intrinsic bulk defects at 293 and 100 K in insulated gate field effect transistors

JOURNAL OF APPLIED PHYSICS, 81(3), 1566–1574.

By: H. Kim, C. Williams & A. Reisman

Source: Web Of Science
Added: August 6, 2018

1997 journal article

Low-field trap generation dependence on the injection current density in gate insulators - How valid are accelerated hot electron measurements?

JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 144(7), 2517–2521.

By: H. Kim, A. Reisman & C. Williams

Source: Web Of Science
Added: August 6, 2018