2001 journal article

A study of the effects of tunneling currents and reliability of sub-2 nm gate oxides on scaled n-MOSFETs

Microelectronics Reliability, 41(1), 37–46.

By: N. Yang & J. Wortman

Source: NC State University Libraries
Added: August 6, 2018

2000 journal article

A comparative study of gate direct tunneling and drain leakage currents in N-MOSFET's with sub-2-nm gate oxides

IEEE Transactions on Electron Devices, 47(8), 1636–1644.

By: N. Yang, W. Henson & J. Wortman

Source: NC State University Libraries
Added: August 6, 2018

2000 journal article

Analysis of leakage currents and impact on off-state power consumption for CMOS technology in the 100-nm regime

IEEE Transactions on Electron Devices, 47(7), 1393–1400.

By: W. Henson, N. Yang, S. Kubicek, E. Vogel, J. Wortman, K. De Meyer, A. Naem

Source: NC State University Libraries
Added: August 6, 2018

2000 journal article

Effect of polysilicon gate type on the flatband voltage shift for ultrathin oxide-nitride gate stacks

IEEE Electron Device Letters, 21(4), 170–172.

By: Z. Wang, C. Parker, D. Hodge, R. Croswell, N. Yang, V. Misra, J. Hauser

Source: NC State University Libraries
Added: August 6, 2018

2000 journal article

Estimation of the effects of remote charge scattering on electron mobility of n-MOSFET's with ultrathin gate oxides

IEEE Transactions on Electron Devices, 47(2), 440–447.

By: N. Yang, W. Henson, J. Hauser & J. Wortman

Source: NC State University Libraries
Added: August 6, 2018

1999 journal article

Modeling study of ultrathin gate oxides using direct tunneling current and capacitance-voltage measurements in MOS devices

IEEE Transactions on Electron Devices, 46(7), 1464–1471.

By: N. Yang, W. Henson, J. Hauser & J. Wortman

Source: NC State University Libraries
Added: August 6, 2018

1999 journal article

Observation of oxide breakdown and its effects on the characteristics of ultra-thin-oxide nMOSFET's

IEEE Electron Device Letters, 20(12), 605–607.

By: W. Henson, N. Yang & J. Wortman

Source: NC State University Libraries
Added: August 6, 2018