2007 journal article
Coarsening dynamics of nanoscale Ti-silicide islands on Si surfaces
Journal of the Korean Physical Society, 50(3), 575–580.
2005 review
Applications of free-electron lasers in the biological and material sciences
[Review of ]. PHOTOCHEMISTRY AND PHOTOBIOLOGY, 81(4), 711–735.
2005 article
Photo electron emission microscopy of polarity-patterned materials
Yang, W. C., Rodriguez, B. J., Gruverman, A., & Nemanich, R. J. (2005, April 27). JOURNAL OF PHYSICS-CONDENSED MATTER, Vol. 17, pp. S1415–S1426.
2005 journal article
Scanning probe investigation of surface charge and surface potential of GaN-based heterostructures
APPLIED PHYSICS LETTERS, 86(11).
2004 personal communication
Photoionization threshold of eumelanosomes determined using UV free electron laser - Photoelectron emission microscopy
Samokhvalov, A., Garguilo, J., Yang, W. C., Edwards, G. S., Nemanich, R. J., & Simon, J. D. (2004, October 21).
2004 journal article
Polarization-dependent electron affinity of LiNbO3 surfaces
APPLIED PHYSICS LETTERS, 85(12), 2316–2318.
2004 journal article
Shape stability of TiSi2 islands on Si (111)
JOURNAL OF APPLIED PHYSICS, 95(3), 1572–1576.
2003 journal article
Attractive migration and coalescence: A significant process in the coarsening of TiSi2 islands on the Si(111) surface
PHYSICAL REVIEW LETTERS, 90(13).
2003 journal article
Influence of strain, surface diffusion and Ostwald ripening on the evolution of nanostructures for erbium on Si(001)
JOURNAL OF APPLIED PHYSICS, 93(7), 4180–4184.
2003 journal article
Photoelectron emission microscopy observation of inversion domain boundaries of GaN-based lateral polarity heterostructures
Journal of Applied Physics, 94(9), 5720–5725.
2001 journal article
Photon energy dependence of contrast in photoelectron emission microscopy of Si devices
APPLIED PHYSICS LETTERS, 78(22), 3547–3549.
2000 journal article
Effects of a Ta interlayer on the phase transition of TiSi2 on Si(111)
Journal of Applied Physics, 88(5), 2467–2471.
2000 journal article
UV-specific (320-365 nm) digital camera based on a 128x128 focal plane array of GaN/AlGaN p-i-n photodiodes
MRS Internet Journal of Nitride Semiconductor Research, 5(6), 1–12.
1999 journal article
Reduction of the transition temperature of C54TiSi(2) through a Ta interlayer
Journal of the Korean Physical Society, 35(1999 Dec.), S769–773.
1998 journal article
A free electron laser-photoemission electron microscope system (FEL-PEEM)
SURFACE REVIEW AND LETTERS, 5(6), 1257–1268.
1997 article
Correlation of morphology and electrical properties of nanoscale TiSi2 epitaxial islands on Si (001)
Yang, W., Jedema, F. J., Ade, H., & Nemanich, R. J. (1997, October 31). THIN SOLID FILMS, Vol. 308, pp. 627–633.
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