Woochul Yang

Coarsening dynamics of nanoscale Ti-silicide islands on Si surfaces

Journal of the Korean Physical Society, 50(3), 575–580.

Applications of free-electron lasers in the biological and material sciences

[Review of ]. PHOTOCHEMISTRY AND PHOTOBIOLOGY, 81(4), 711–735.

Photo electron emission microscopy of polarity-patterned materials

Yang, W. C., Rodriguez, B. J., Gruverman, A., & Nemanich, R. J. (2005, April 27). JOURNAL OF PHYSICS-CONDENSED MATTER, Vol. 17, pp. S1415–S1426.

Scanning probe investigation of surface charge and surface potential of GaN-based heterostructures

APPLIED PHYSICS LETTERS, 86(11).

Photoionization threshold of eumelanosomes determined using UV free electron laser - Photoelectron emission microscopy

Samokhvalov, A., Garguilo, J., Yang, W. C., Edwards, G. S., Nemanich, R. J., & Simon, J. D. (2004, October 21).

Polarization-dependent electron affinity of LiNbO3 surfaces

APPLIED PHYSICS LETTERS, 85(12), 2316–2318.

Shape stability of TiSi2 islands on Si (111)

JOURNAL OF APPLIED PHYSICS, 95(3), 1572–1576.

Attractive migration and coalescence: A significant process in the coarsening of TiSi2 islands on the Si(111) surface

PHYSICAL REVIEW LETTERS, 90(13).

Influence of strain, surface diffusion and Ostwald ripening on the evolution of nanostructures for erbium on Si(001)

JOURNAL OF APPLIED PHYSICS, 93(7), 4180–4184.

Photoelectron emission microscopy observation of inversion domain boundaries of GaN-based lateral polarity heterostructures

Journal of Applied Physics, 94(9), 5720–5725.

Photon energy dependence of contrast in photoelectron emission microscopy of Si devices

APPLIED PHYSICS LETTERS, 78(22), 3547–3549.

Effects of a Ta interlayer on the phase transition of TiSi2 on Si(111)

Journal of Applied Physics, 88(5), 2467–2471.

UV-specific (320-365 nm) digital camera based on a 128x128 focal plane array of GaN/AlGaN p-i-n photodiodes

MRS Internet Journal of Nitride Semiconductor Research, 5(6), 1–12.

Reduction of the transition temperature of C54TiSi(2) through a Ta interlayer

Journal of the Korean Physical Society, 35(1999 Dec.), S769–773.

A free electron laser-photoemission electron microscope system (FEL-PEEM)

SURFACE REVIEW AND LETTERS, 5(6), 1257–1268.

Correlation of morphology and electrical properties of nanoscale TiSi2 epitaxial islands on Si (001)

Yang, W., Jedema, F. J., Ade, H., & Nemanich, R. J. (1997, October 31). THIN SOLID FILMS, Vol. 308, pp. 627–633.