Woochul Yang

Coarsening Dynamics of Nanoscale Ti-Silicide Islands on Si Surfaces

Yang, W., Zeman, M., & Nemanich, R. J. (2007, March 15). Journal of the Korean Physical Society.

Applications of Free-Electron Lasers in the Biological and Material Sciences¶

Edwards, G. S., Allen, S. J., Haglund, R. F., Nemanich, R. J., Redlich, B., Simon, J. D., & Yang, W.-C. (2005, January 1). Photochemistry and Photobiology.

Photo electron emission microscopy of polarity-patterned materials

Yang, W.-C., Rodriguez, B. J., Gruverman, A., & Nemanich, R. J. (2005, April 8). Journal of Physics Condensed Matter.

Scanning probe investigation of surface charge and surface potential of GaN-based heterostructures

Rodriguez, B. J., Yang, W.-C., Nemanich, R. J., & Gruverman, A. (2005, March 11). Applied Physics Letters.

Photoionization Threshold of Eumelanosomes Determined Using UV Free Electron Laser−Photoelectron Emission Microscopy

Samokhvalov, A., Garguilo, J., Yang, W.-C., Edwards, G. S., Nemanich, R. J., & Simon, J. D. (2004, September 25). The Journal of Physical Chemistry B.

Polarization-dependent electron affinity of LiNbO3 surfaces

Yang, W.-C., Rodriguez, B. J., Gruverman, A., & Nemanich, R. J. (2004, September 20). Applied Physics Letters.

Shape stability of TiSi2 islands on Si (111)

Yang, W.-C., Ade, H., & Nemanich, R. J. (2004, January 25). Journal of Applied Physics, Vol. 95, pp. 1572–1576.

Attractive Migration and Coalescence: A Significant Process in the Coarsening ofTiSi2Islands on the Si(111) Surface

Yang, W.-C., Zeman, M., Ade, H., & Nemanich, R. J. (2003, April 4). Physical Review Letters, Vol. 90, pp. 136102–136101.

Influence of strain, surface diffusion and Ostwald ripening on the evolution of nanostructures for erbium on Si(001)

Fitting, L., Zeman, M. C., Yang, W.-C., & Nemanich, R. J. (2003, March 27). Journal of Applied Physics.

Photoelectron emission microscopy observation of inversion domain boundaries of GaN-based lateral polarity heterostructures

Yang, W.-C., Rodriguez, B. J., Park, M., Nemanich, R. J., Ambacher, O., & Cimalla, V. (2003, October 24). Journal of Applied Physics.

Photon energy dependence of contrast in photoelectron emission microscopy of Si devices

Ballarotto, V. W., Siegrist, K., Phaneuf, R. J., Williams, E. D., Yang, W.-C., & Nemanich, R. J. (2001, May 28). Applied Physics Letters.

Effects of a Ta interlayer on the phase transition of TiSi2 on Si(111)

Jeon, H., Jung, B., Kim, Y. D., Yang, W., & Nemanich, R. J. (2000, September 1). Journal of Applied Physics.

UV-Specific (320-365 nm) Digital Camera Based On a 128×128 Focal Plane Array of GaN/AlGaN p-i-n Photodiodes

Brown, J. D., Boney, J., Matthews, J., Srinivasan, P., Schetzina, J. F., Nohava, T., … Krishnankutty, S. (2000, January 1). MRS Internet Journal of Nitride Semiconductor Research.

Reduction of the transition temperature of C54TiSi(2) through a Ta interlayer

Journal of the Korean Physical Society, 35(1999 Dec.), S769–773.

A Free Electron Laser–Photoemission Electron Microscope System (FEL–PEEM)

Ade, H., Yang, W., English, S. L., Hartman, J., Davis, R. F., Nemanich, R. J., … Madey, J. M. J. (1998, December 1). Surface Review and Letters, Vol. 5, pp. 1257–1268.

Correlation of morphology and electrical properties of nanoscale TiSi2 epitaxial islands on Si (001)

Yang, W., Jedema, F. J., Ade, H., & Nemanich, R. J. (1997, October 1). Thin Solid Films, Vol. 308, pp. 627–633.