Jack E. Rowe

Manuel Cardona Castro

Rowe, J., Aspnes, D., Pinczuk, A., & Yu, P. Y. (2015, January 31). Physics Today, Vol. 68, pp. 58–58.

Coverage-dependent surface magnetism of iron phthalocyanine on an O-Fe(110) surface

Dougherty, D. B., Sandin, A., Vescovo, E., & Rowe, J. E. (2014, July 14). Physical Review B.

Optical second-harmonic generation induced by electric current in graphene on Si and SiC substrates

An, Y. Q., Rowe, J. E., Dougherty, D. B., Lee, J. U., & Diebold, A. C. (2014, March 12). Physical Review B.

Toward Single-Crystal Hybrid-Carbon Electronics: Impact of Graphene Substrate Defect Density on Copper Phthalocyanine Film Growth

McAfee, T., Gann, E., Guan, T., Stuart, S. C., Rowe, J., Dougherty, D. B., & Ade, H. (2014, August 5). Crystal Growth & Design, Vol. 14, pp. 4394–4401.

Improved graphene growth in UHV: Pit-free surfaces by selective Si etching of SiC(0001)–Si with atomic hydrogen

Sandin, A., Rowe, J. E., & Dougherty, D. B. (2013, January 28). Surface Science.

Shallow acceptor complexes in p-type ZnO

Reynolds, J. G., Reynolds, C. L., Mohanta, A., Muth, J. F., Rowe, J. E., Everitt, H. O., & Aspnes, D. E. (2013, April 15). Applied Physics Letters, Vol. 102.

Smooth MgO films grown on graphite and graphene by pulsed laser deposition

Stuart, S. C., Satchet, E., Sandin, A., Maria, J.-P., Rowe, J. E., Dougherty, D. B., & Ulrich, M. (2013, August 27). Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena, Vol. 31.

Multiple coexisting intercalation structures of sodium in epitaxial graphene-SiC interfaces

Physical Review B, 85(12).

Optical and structural characterization of epitaxial graphene on vicinal 6H-SiC(0001)–Si by spectroscopic ellipsometry, Auger spectroscopy, and STM

Nelson, F., Sandin, A., Dougherty, D. B., Aspnes, D. E., Rowe, J. E., & Diebold, A. C. (2012, June 8). Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena, Vol. 30.

Incomplete screening by epitaxial graphene on the Si face of 6H–SiC(0001)

Sandin, A., Pronschinske, A., Rowe, J. E., & Dougherty, D. B. (2010, September 13). Applied Physics Letters.

Surface reconstruction of hexagonal Y-doped HoMnO3 and LuMnO3 studied using low-energy electron diffraction

Physical Review. B, Condensed Matter and Materials Physics, 81(16).

Titanium silicide islands on atomically clean Si(100): Identifying single electron tunneling effects

Tedesco, J. L., Rowe, J. E., & Nemanich, R. J. (2010, June 15). Journal of Applied Physics.

Conducting atomic force microscopy studies of nanoscale cobalt silicide Schottky barriers on Si(111) and Si(100)

Tedesco, J. L., Rowe, J. E., & Nemanich, R. J. (2009, April 15). Journal of Applied Physics.

Single molecule measurements with photoelectron emission microscopy

Kong, X., Rowe, J. E., & Nemanich, R. J. (2008, July 1). Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena.

Local bonding analysis of the valence and conduction band features of TiO2

Fleming, L., Fulton, C. C., Lucovsky, G., Rowe, J. E., Ulrich, M. D., & Lüning, J. (2007, August 1). Journal of Applied Physics.

Aromatase cytochrome P450: cloning, intron variation, and ontogeny of gene expression in southern flounder (Paralichthys lethostigma)

Luckenbach, J. A., Early, L. W., Rowe, A. H., Borski, R. J., Daniels, H. V., & Godwin, J. (2005, January 1). Journal of Experimental Zoology Part A Comparative Experimental Biology, Vol. 303A, pp. 643–656.

A high resolution photoemission study of surface core-level shifts in clean and oxygen-covered Ir(2 1 0) surfaces

Gladys, M. J., Ermanoski, I., Jackson, G., Quinton, J. S., Rowe, J. E., & Madey, T. E. (2004, March 20). Journal of Electron Spectroscopy and Related Phenomena.

Influence of substrate temperature on epitaxial copper phthalocyanines studied by photoemission spectroscopy

Ellis, T. S., Park, K. T., Hulbert, S. L., Ulrich, M. D., & Rowe, J. E. (2004, January 25). Journal of Applied Physics.

Near-edge absorption fine structure and UV photoemission spectroscopy studies of aligned single-walled carbon nanotubes on Si(100) substrates

Fleming, L., Ulrich, M. D., Efimenko, K., Genzer, J., Chan, A. S. Y., Madey, T. E., … Rowe, J. E. (2004, July 1). Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena, Vol. 22, pp. 2000–2004.

Bonding and structure of ultrathin yttrium oxide films for Si field effect transistor gate dielectric applications

Ulrich, M. D., Rowe, J. E., Niu, D., & Parsons, G. N. (2003, July 1). Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena, Vol. 21, pp. 1792–1797.

Heteroepitaxial copper phthalocyanine on Au(0 0 1) studied by high-resolution X-ray photoelectron spectroscopy

Park, K. T., Miller, A., Klier, K., Opila, R. L., & Rowe, J. E. (2003, April 1). Surface Science.

High resolution photoemission study of growth, alloying, and intermixing of ultrathin ruthenium films on W(111) and W(211)

Gladys, M. J., Jackson, G., Rowe, J. E., & Madey, T. E. (2003, September 12). Surface Science.

Soft x-ray photoelectron spectroscopy of (HfO2)(x)(SiO2)(1-x) high-k gate-dielectric structures

Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures, 21(4), 1777–1782.

Ultrathin PD and PT films on W(211)

Interface electronic structure of Ta2O5-Al2O3 alloys for Si- field-effect transistor gate dielectric applications

Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures, 20(4), 1732–1738.

Photoelectron spectroscopy studies of growth, thermal stability, and alloying for transition metal-tungsten (111) bimetallic systems

Physical Review. B, Condensed Matter and Materials Physics, 65(7), 075413–075411.

Barrier layer model determined by XPS data for tunneling current reductions at monolayer nitrided Si–SiO2 interfaces

Niimi, H., Yang, H., Lucovsky, G., Keister, J. W., & Rowe, J. E. (2000, October 1). Applied Surface Science.

Intrinsic limitations on device performance and reliability from bond-constraint induced transition regions at interfaces of stacked dielectrics

Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures, 18(3), 1742–1748.

Photoelectron spectroscopy studies of growth, alloying, and segregation for transition-metal films on tungsten (211)

Physical Review. B, Condensed Matter and Materials Physics, 62(8), 5150–5162.

Photoemission spectroscopy of platinum overlayers on silicon dioxide films

Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures, 18(4), 2174–2178.

Separate and independent reductions in direct tunneling in oxide/nitride stacks with monolayer interface nitridation associated with the (i) interface nitridation and (ii) increased physical thickness

Lucovsky, G., Wu, Y., Niimi, H., Yang, H., Keister, J., & Rowe, J. E. (2000, July 1). Journal of Vacuum Science & Technology A Vacuum Surfaces and Films.

Band offsets for ultrathin SiO2 and Si3N4 films on Si(111) and Si(100) from photoemission spectroscopy

Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures, 17(4), 1831–1835.

Structure of ultrathin SiO2/Si(111) interfaces studied by photoelectron spectroscopy

Keister, J. W., Rowe, J. E., Kolodziej, J. J., Niimi, H., Tao, H.-S., Madey, T. E., & Lucovsky, G. (1999, July 1). Journal of Vacuum Science & Technology A Vacuum Surfaces and Films.

The effects of interfacial suboxide transition regions on direct tunneling in oxide and stacked oxide-nitride gate dielectrics

Yang, H., Niimi, H., Wu, Y., Lucovsky, G., Keister, J. W., & Rowe, J. E. (1999, September 1). Microelectronic Engineering.

Ultrathin metals films on W(221): Structure, electronic properties and reactivity

Kołodziej, J. J., Pelhos, K., Abdelrehim, I. M., Keister, J. W., Rowe, J. E., & Madey, T. E. (1998, September 1). Progress in Surface Science.

W(111)-based bimetallic systems: Core-level photoelectron spectroscopy studies