Qi-Kun Xue

Mantese, L., Xue, Q. K., Sakurai, T., & Aspnes, D. E. (1999). Analysis of high-index Si(001) surfaces by reflectance difference spectroscopy. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, Vol. 17, pp. 1652–1656. https://doi.org/10.1116/1.581867

Xue, Q. K., Hasegawa, Y., Ogino, T., Kiyama, H., & Sakurai, T. (1997). In-rich 4X2 reconstruction in novel planar growth of InAs on GaAs(001). Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures, 15(4), 1270–1273.