Cem Basceri

Sarigiannis, D., Derderian, G. J., Basceri, C., Sandhu, G. S., Gealy, F. D., & Carlson, C. M. (2008). Atomic layer deposition methods. Washington, DC: U.S. Patent and Trademark Office.

Basceri, C., Gealy, F. D., & Sandhu, G. S. (2008). Constructions comprising hafnium oxide. Washington, DC: U.S. Patent and Trademark Office.

Basceri, C., Gealy, F. D., & S., S. G. (2008). DRAM constructions and electronic systems. Washington, DC: U.S. Patent and Trademark Office.

Harris, C., Gehrke, T., Weeks, T. W., & Basceri, C. (2008). Gallium nitride based high-electron mobility devices. Washington, DC: U.S. Patent and Trademark Office.

Basceri, C., & Derderian, G. J. (2008). MIS capacitor and method of formation. Washington, DC: U.S. Patent and Trademark Office.

Basceri, C. (2008). Method of forming conductive metal silicides by reaction of metal with silicon. Washington, DC: U.S. Patent and Trademark Office.

Harris, C., Gehrke, T., Weeks, T. W., & Basceri, C. (2008). Method of manufacturing gallium nitride based high-electron mobility devices. Washington, DC: U.S. Patent and Trademark Office.

Beaman, K. L., Weimer, R. A., Breiner, L. D., Ping, E. X., Doan, T. T., Basceri, C., … Zheng, L. A. (2008). Methods and apparatus for processing microfeature workpieces; methods for conditioning ALD reaction chambers. Washington, DC: U.S. Patent and Trademark Office.

Miller, M. W., & Basceri, C. (2008). Methods of forming capacitor. Washington, DC: U.S. Patent and Trademark Office.

Sarigiannis, D., Derderian, G. J., & Basceri, C. (2008). Methods of forming materials. Washington, DC: U.S. Patent and Trademark Office.

Basceri, C., & Sandhu, G. S. (2008). Methods of forming pluralities of capacitors. Washington, DC: U.S. Patent and Trademark Office.

Basceri, C. (2008). Semiconductor manufacturing apparatus for modifying-in-film stress of thin films, and product formed thereby. Washington, DC: U.S. Patent and Trademark Office.

Basceri, C., & Sandhu, G. S. (2008). Supercritical fluid technology for cleaning processing chambers and systems. Washington, DC: U.S. Patent and Trademark Office.

Harris, C., Konstantinov, A., & Basceri, C. (2008). Vertical junction field effect transistor having an epitaxial gate. Washington, DC: U.S. Patent and Trademark Office.

Sarigiannis, D., Derderian, G. J., Basceri, C., Sandhu, G. S., Gealy, F. D., & Carlson, C. M. (2007). Atomic layer deposition methods. Washington, DC: U.S. Patent and Trademark Office.

Pontoh, M., Basceri, C., & Graettinger, T. M. (2007). Capacitor constructions. Washington, DC: U.S. Patent and Trademark Office.

Basceri, C., Sandhu, G. S., & Yang, S. (2007). Capacitor with high dielectric constant materials and method of making. Washington, DC: U.S. Patent and Trademark Office.

Basceri, C., & Alzola, N. (2007). Chemical vapor deposition methods of forming barium strontium titanate comprising dielectric layers, including such layers having a varied concentration of barium and strontium within the layer. Washington, DC: U.S. Patent and Trademark Office.

Basceri, C., & Derderian, G. J. (2007). Circuit constructions. Washington, DC: U.S. Patent and Trademark Office.

Basceri, C. (2007). Constructions comprising perovskite-type dielectric. Washington, DC: U.S. Patent and Trademark Office.

Blomiley, E. R., Sandhu, G. S., Basceri, C., & Ramaswamy, N. (2007). Deposition methods. Washington, DC: U.S. Patent and Trademark Office.

Marsh, E., Vaartstra, B., Castrovillo, P. J., Basceri, C., Derderian, G. J., & Sandhu, G. S. (2007). Deposition methods with time spaced and time abutting precursor pulses. Washington, DC: U.S. Patent and Trademark Office.

Basceri, C., Manning, H. M., Sandhu, G. S., & Parekh, K. R. (2007). Gated field effect device comprising gate dielectric having different K regions. Washington, DC: U.S. Patent and Trademark Office.

Basceri, C., & Derderian, G. J. (2007). MIS capacitor. Washington, DC: U.S. Patent and Trademark Office.

Derderian, G. J., Basceri, C., & Westermoreland, D. L. (2007). Method for binding halide-based contaminants during formation of a titanium-based film. Washington, DC: U.S. Patent and Trademark Office.

Ramaswamy, N., Sandhu, G. S., Basceri, C., & Blomiley, E. R. (2007). Method of forming a vertical transistor. Washington, DC: U.S. Patent and Trademark Office.

Basceri, C., Yushin, N., & Balkas, C. M. (2007). Method of forming semi-insulating silicon carbide single crystal. Washington, DC: U.S. Patent and Trademark Office.

Harris, C., Konstantinov, A., & Basceri, C. (2007). Method of manufacturing a vertical junction field effect transistor having an epitaxial gate. Washington, DC: U.S. Patent and Trademark Office.

Sarigiannis, D., Basceri, C., Hill, C. W., & Derderian, G. J. (2007). Method of removing residual contaminants from an environment. Washington, DC: U.S. Patent and Trademark Office.

Beaman, K. L., Doan, T. T., Breiner, L. D., Weimer, R. A., Ping, E. X., Kubista, D. J., … Zheng, L. A. (2007). Methods and systems for controlling temperature during microfeature workpiece processing, e.g., CVD deposition. Washington, DC: U.S. Patent and Trademark Office.

Basceri, C., & Sandhu, G. (2007). Methods for forming a conductive structure using oxygen diffusion through one metal layer to oxidize a second metal layer. Washington, DC: U.S. Patent and Trademark Office.

Basceri, C., Visokay, M., Graettinger, T. M., & Cummings, S. D. (2007). Methods for forming and integrated circuit structures containing enhanced-surface-area conductive layers. Washington, DC: U.S. Patent and Trademark Office.

Agarwal, V. K., Derderian, G., Sandhu, G. S., Li, W. M., Visokay, M., Basceri, C., & Yang, S. (2007). Methods for forming and integrated circuit structures containing ruthenium and tungsten containing layers. Washington, DC: U.S. Patent and Trademark Office.

Basceri, C. (2007). Methods of forming a capacitor. Washington, DC: U.S. Patent and Trademark Office.

Basceri, C., Sandhu, G. S., & Manning, H. M. (2007). Methods of forming conductive contacts to source/drain regions and methods of forming local interconnects. Washington, DC: U.S. Patent and Trademark Office.

Sandhu, G. S., Manning, H. M., & Basceri, C. (2007). Methods of forming field effect transistors. Washington, DC: U.S. Patent and Trademark Office.

Basceri, C., Gealy, F. D., & Sandhu, G. S. (2007). Methods of forming hafnium oxide. Washington, DC: U.S. Patent and Trademark Office.

Basceri, C., & Sandhu, G. S. (2007). Methods of forming pluralities of capacitors, and integrated circuitry. Washington, DC: U.S. Patent and Trademark Office.

Zhaeng, L. A., Doan, T. T., Breiner, L. D., Ping, E. X., Weimer, R. A., Kubista, D. J., … Basceri, C. (2007). Microfeature workpiece processing apparatus and methods for batch deposition of materials on microfeature workpieces. Washington, DC: U.S. Patent and Trademark Office.

Basceri, C., Doan, T. T., Weimer, R. A., Beaman, K. L., Breiner, L. D., Zheng, L. A., … Kubista, D. J. (2007). Microfeature workpiece processing apparatus and methods for controlling deposition of materials on microfeature workpieces. Washington, DC: U.S. Patent and Trademark Office.

Basceri, C., & Sandhu, G. S. (2007). Mixed composition interface layer and method of forming. Washington, DC: U.S. Patent and Trademark Office.

Basceri, C., & Sandhu, G. S. (2007). One-transistor composite-gate memory. Washington, DC: U.S. Patent and Trademark Office.

Basceri, C., Agarwal, V. K., & Gealy, D. (2007). Structures and methods for enhancing capacitors in integrated circuits. Washington, DC: U.S. Patent and Trademark Office.

Castovillo, P. J., Basceri, C., Derderian, G. J., & Sandhu, G. S. (2006). Atomic layer deposition method. Washington, DC: U.S. Patent and Trademark Office.

Castovillo, P. J., Basceri, C., Derderian, G. J., & Sandhu, G. S. (2006). Atomic layer deposition methods. Washington, DC: U.S. Patent and Trademark Office.

Basceri, C., Gealy, F. D., & Sandhu, G. S. (2006). Capacitor constructions. Washington, DC: U.S. Patent and Trademark Office.

Basceri, C., & Derderian, G. J. (2006). Capacitor constructions, semiconductor constructions, and methods of forming electrical contacts and semiconductor constructions. Washington, DC: U.S. Patent and Trademark Office.

Basceri, C., Sandhu, G. S., & Visokay, M. (2006). Capacitor with high dielectric constant materials and method of making. Washington, DC: U.S. Patent and Trademark Office.

Basceri, C., & Alzola, N. (2006). Chemical vapor deposition methods of forming barium strontium titanate comprising dielectric layers, including such layers having a varied concentration of barium and strontium within the layer. Washington, DC: U.S. Patent and Trademark Office.

Basceri, C., & Graettinger, T. M. (2006). DRAM cells and electronic systems. Washington, DC: U.S. Patent and Trademark Office.

Basceri, C., & Derderian, G. J. (2006). Method of forming MIS capacitor. Washington, DC: U.S. Patent and Trademark Office.

Basceri, C. (2006). Method of forming a capacitor. Washington, DC: U.S. Patent and Trademark Office.

Basceri, C., & Derderian, G. J. (2006). Method of forming a capacitor. Washington, DC: U.S. Patent and Trademark Office.

Ramaswamy, N., Sandhu, G. S., Basceri, C., & Blomiley, E. R. (2006). Method of forming a layer comprising epitaxial silicon and a field effect transistor. Washington, DC: U.S. Patent and Trademark Office.

Ramaswamy, N., Sandhu, G. S., Basceri, C., & Blomiley, E. R. (2006). Method of forming epitaxial silicon-comprising material. Washington, DC: U.S. Patent and Trademark Office.

Chopra, D., Donahoe, K. G., & Basceri, C. (2006). Method of providing a structure using self-aligned features. Washington, DC: U.S. Patent and Trademark Office.

Sarigiannis, D., Derderian, G. J., & Basceri, C. (2006). Methods of depositing materials over substrates, and methods of forming layers over substrates. Washington, DC: U.S. Patent and Trademark Office.

Basceri, C., & Graettinger, T. M. (2006). Methods of forming capacitor constructions. Washington, DC: U.S. Patent and Trademark Office.

Basceri, C. (2006). Methods of forming capacitor constructions comprising perovskite-type dielectric materials with different amount of crystallinity regions. Washington, DC: U.S. Patent and Trademark Office.

Basceri, C., & Sandhu, G. S. (2006). Methods of forming capacitors. Washington, DC: U.S. Patent and Trademark Office.

Basceri, C. (2006). Methods of forming conductive material silicides by reaction of metal with silicon. Washington, DC: U.S. Patent and Trademark Office.

Sarigiannis, D., Derderian, G. J., & Basceri, C. (2006). Methods of forming layers over substrates. Washington, DC: U.S. Patent and Trademark Office.

Ramaswamy, N., & Basceri, C. (2006). Methods of growing epitaxial silicon. Washington, DC: U.S. Patent and Trademark Office.

Basceri, C., Doan, T. T., Weimer, R. A., Beaman, K. L., Breiner, L. D., Zheng, L. A., … Kubista, D. J. (2006). Microfeature workpiece processing apparatus and methods for controlling deposition of materials on microfeature workpieces. Washington, DC: U.S. Patent and Trademark Office.

Basceri, C., Vasilyeva, I., Derraa, A., Campbell, P. H., & Sandhu, G. S. (2006). Plasma enhanced chemical vapor deposition method of forming a titanium silicide comprising layer. Washington, DC: U.S. Patent and Trademark Office.

Basceri, C., Agarwal, V. K., & Gealy, D. (2006). Structures and methods for enhancing capacitors in integrated circuits. Washington, DC: U.S. Patent and Trademark Office.

Basceri, C., Rhodes, H. E., Sandhu, G., Gealy, F. D., & Graettinger, T. M. (2006). Top electrode in a strongly oxidizing environment. Washington, DC: U.S. Patent and Trademark Office.

Derderian, G. J., Basceri, C., Sandhu, G. S., & Sarigiannis, D. (2005). Atomic layer deposition apparatus and methods. Washington, DC: U.S. Patent and Trademark Office.

Basceri, C. (2005). Capacitor constructions comprising perovskite-type dielectric materials and having different degrees of crystallinity within the perovskite-type dielectric materials. Washington, DC: U.S. Patent and Trademark Office.

Basceri, C. (2005). Chemical vapor deposition method for depositing a high k dielectric film. Washington, DC: U.S. Patent and Trademark Office.

Basceri, C., & Azola, N. (2005). Chemical vapor deposition methods of forming barium strontium titanate comprising dielectric layers. Washington, DC: U.S. Patent and Trademark Office.

Basceri, C., & Sandhu, G. (2005). Conductive semiconductor structures containing metal oxide regions. Washington, DC: U.S. Patent and Trademark Office.

Sarigiannis, D., Derderian, G. J., Basceri, C., Sandhu, G. S., Gealy, F. D., & Carlson, C. M. (2005). Deposition methods. Washington, DC: U.S. Patent and Trademark Office.

Basceri, C., & Sandhu, G. S. (2005). Dielectric cure for reducing oxygen vacancies. Washington, DC: U.S. Patent and Trademark Office.

Basceri, C. (2005). Gas delivery system for pulsed-type deposition processes used in the manufacturing of micro-devices. Washington, DC: U.S. Patent and Trademark Office.

Basceri, C., & Sandhu, G. (2005). Haze-free BST films. Washington, DC: U.S. Patent and Trademark Office.

Rhodes, H. E., Visokay, M., Graettinger, T., Gealy, D., Sandhu, G., Basceri, C., & Cummings, S. (2005). Integrated capacitors fabricated with conductive metal oxides. Washington, DC: U.S. Patent and Trademark Office.

Basceri, C., Gealy, D., & Sandhu, G. S. (2005). Method for controlling deposition of dielectric films. Washington, DC: U.S. Patent and Trademark Office.

Basceri, C., & Braettinger, T. M. (2005). Method of forming a MIM capacitor with metal nitride electrode. Washington, DC: U.S. Patent and Trademark Office.

Basceri, C., & Sandhu, G. (2005). Method of forming haze-free BST films. Washington, DC: U.S. Patent and Trademark Office.

Basceri, C., & Derderian, G. J. (2005). Methods of forming capacitor constructions. Washington, DC: U.S. Patent and Trademark Office.

Basceri, C., & Derderian, G. J. (2005). Methods of forming conductive connections, and methods of forming nanofeatures. Washington, DC: U.S. Patent and Trademark Office.

Derderian, G. J., & Basceri, C. (2005). Methods of forming conductive metal silicides by reaction of metal with silicon. Washington, DC: U.S. Patent and Trademark Office.

Basceri, C. (2005). Methods of forming perovskite-type dielectric materials with chemical vapor deposition. Washington, DC: U.S. Patent and Trademark Office.

Pontoh, M., Basceri, C., & Greattinger, T. M. (2005). Methods of forming rugged electrically conductive surfaces and layers. Washington, DC: U.S. Patent and Trademark Office.

Basceri, C., & Sandhu, G. (2005). Mixed composition interface layer and method of forming. Washington, DC: U.S. Patent and Trademark Office.

Basceri, C., & Sandhu, G. S. (2005). Reactors having gas distributors and methods for depositing materials onto micro-device workpieces. Washington, DC: U.S. Patent and Trademark Office.

Basceri, C. (2005). Semiconductor manufacturing process and apparatus for modifying in-film stress of thin films, and product formed thereby. Washington, DC: U.S. Patent and Trademark Office.

Basceri, C., & Sandhu, G. S. (2005). Structures and methods for enhancing capacitors in integrated circuits. Washington, DC: U.S. Patent and Trademark Office.

Basceri, C. (2005). Thin film capacitor with substantially homogenous stoichiometry. Washington, DC: U.S. Patent and Trademark Office.

Marsh, E., Vaartstra, B., Castrovillo, P. J., Basceri, C., Derderian, G. J., & Sandhu, G. S. (2004). Atomic layer deposition methods. Washington, DC: U.S. Patent and Trademark Office.

Sarigiannis, D., Derderian, G. J., Basceri, C., Sandhu, G. S., Gealy, F. D., & Carlson, C. M. (2004). Atomic layer deposition methods. Washington, DC: U.S. Patent and Trademark Office.

Basceri, C., Sandhu, G. S., & Yang, S. (2004). Capacitor with high dielectric constant materials and method of making. Washington, DC: U.S. Patent and Trademark Office.

Derraa, A., Basceri, C., Vasilyeva, I., Campbell, P. H., & Sandhu, G. S. (2004). Chemical vapor deposition method of forming a material over at least two substrates. Washington, DC: U.S. Patent and Trademark Office.

Basceri, C., & Graettinger, T. M. (2004). MIM capacitor with metal nitride electrode materials and method of formation. Washington, DC: U.S. Patent and Trademark Office.

Basceri, C., & Al-Shareef, H. N. (2004). Method for improving the resistance degradation of thin film capacitors. Washington, DC: U.S. Patent and Trademark Office.

Gealy, F. D., & Basceri, C. (2004). Method for reducing physisorption during atomic layer deposition. Washington, DC: U.S. Patent and Trademark Office.

Basceri, C., Derderian, G. J., Visokay, M. R., Drynan, J. M., & Sandhu, G. S. (2004). Method of forming a patterned substantially crystalline TA2O5 comprising material, and method of forming a capacitor having a capacitor dilelectric region comprising substantially crystalline TA2O5 comprising material. Washington, DC: U.S. Patent and Trademark Office.

Chopra, D., Donohoe, K. G., & Basceri, C. (2004). Method of providing a structure using self-aligned features. Washington, DC: U.S. Patent and Trademark Office.

Basceri, C., & Sandhu, G. S. (2004). Method of reducing oxygen vacancies and DRAM processing method. Washington, DC: U.S. Patent and Trademark Office.

Basceri, C., Visokay, M., Graettinger, T. M., & Cummings, S. D. (2004). Methods for forming and integrated circuit structures containing enhanced-surface-area conductive layers. Washington, DC: U.S. Patent and Trademark Office.

Basceri, C., Visokay, M., Greattinger, T. M., & Cummings, S. D. (2004). Methods for forming and integrated circuit structures containing enhanced-surface-area conductive layers. Washington, DC: U.S. Patent and Trademark Office.

Agarwal, V. K., Derderian, G., Sandhu, G. S., Li, W., M., V., M., B., … Yang, S. (2004). Methods for forming and integrated circuit structures containing ruthenium and tungsten containing layers. Washington, DC: U.S. Patent and Trademark Office.

Basceri, C., Gealy, F. D., & Sandhu, G. S. (2004). Methods of forming capacitor constructions, and methods of forming constructions comprising dielectric materials. Washington, DC: U.S. Patent and Trademark Office.

Basceri, C., Gealy, F. D., & Sandhu, G. S. (2004). Methods of forming hafnium-containing materials, methods of forming hafnium oxide, and capacitor constructions comprising hafnium oxide. Washington, DC: U.S. Patent and Trademark Office.

Basceri, C., & Derderian, G. J. (2004). Methods of forming regions of differing composition over a substrate. Washington, DC: U.S. Patent and Trademark Office.

Sarigiannis, D., Derderian, G. J., & Basceri, C. (2004). Methods of forming trenched isolation regions. Washington, DC: U.S. Patent and Trademark Office.

Basceri, C., Vasilyeva, I., Derraa, A., Campbell, P. H., & Sandhu, G. S. (2004). Plasma enhanced chemical vapor deposition method of forming titanium silicide comprising layers. Washington, DC: U.S. Patent and Trademark Office.

Basceri, C., Vasilyeva, I., Derraa, A., Campell, P. H., & Sandhu, G. S. (2004). Plasma enhanced chemical vapor deposition methods of forming titanium silicide comprising layers over a plurality of semiconductor substrates. Washington, DC: U.S. Patent and Trademark Office.

Basceri, C., & Sanhu, G. S. (2004). Structures and methods for enhancing capacitors in integrated ciruits. Washington, DC: U.S. Patent and Trademark Office.

Basceri, C., & Gealy, F. D. (2004). System and method for inhibiting imprinting of capacitor structures of a memory. Washington, DC: U.S. Patent and Trademark Office.

Basceri, C., Rhodes, H. E., Sandhu, G., Gealy, F. D., & Greaetinger, T. M. (2004). Top electrode in a strongly oxidizing environment. Washington, DC: U.S. Patent and Trademark Office.

Basceri, C., Sandhu, G. S., & Yang, S. (2003). Capacitor with high dielectric constant materials. Washington, DC: U.S. Patent and Trademark Office.

Basceri, C., & Sandhu, G. S. (2003). DRAM processing methods. Washington, DC: U.S. Patent and Trademark Office.

Basceri, C., & Sandhu, G. S. (2003). Dielectric cure for reducing oxygen vacancies. Washington, DC: U.S. Patent and Trademark Office.

Basceri, C., & Gealy, D. (2003). Dielectric films and capacitor structures including same. Washington, DC: U.S. Patent and Trademark Office.

Basceri, C., Gealy, D., & Sandhu, G. S. (2003). Method for controlling deposition of dielectric films. Washington, DC: U.S. Patent and Trademark Office.

Basceri, C., Derderian, G. J., Visokay, M. R., Drynan, J. M., & Sandhu, G. S. (2003). Method of etching a substantially amorphous TA2O5 comprising layer. Washington, DC: U.S. Patent and Trademark Office.

Basceri, C., Derderian, G. J., Visokay, M. R., Drynan, J. M., & Sandhu, G. S. (2003). Method of forming DRAM circuitry. Washington, DC: U.S. Patent and Trademark Office.

Chopra, D., Donohoe, K. G., & Basceri, C. (2003). Method of forming a non-conformal layer over and exposing a trench. Washington, DC: U.S. Patent and Trademark Office.

Basceri, C., & Sandhu, G. S. (2003). Method of forming haze- free BST films. Washington, DC: U.S. Patent and Trademark Office.

Agarwal, V. K., Derderian, G., Sandhu, G. S., Li, W. M., Visokay, M., Basceri, C., & Yang, S. (2003). Methods for forming and integrated circuit structures containing ruthenium and tungsten containing layers. Washington, DC: U.S. Patent and Trademark Office.

Basceri, C., & Sandhu, G. (2003). Methods for forming conductive structures and structures regarding same. Washington, DC: U.S. Patent and Trademark Office.

Basceri, C., Derderian, G. J., Visokay, M. R., Drynan, J. M., & Sandhu, G. S. (2003). Methods of depositing a layer comprising tungsten and methods of forming a transistor gate line. Washington, DC: U.S. Patent and Trademark Office.

Basceri, C. (2003). Physical vapor deposition methods. Washington, DC: U.S. Patent and Trademark Office.

Basceri, C., Vasilyeva, I., Derraa, A., Campbell, P. H., & Sandhu, G. S. (2003). Plasma enhanced chemical vapor deposition method of forming titanium silicide comprising layers. Washington, DC: U.S. Patent and Trademark Office.

Basceri, C., & Gealy, D. F. (2003). System and method for inhibiting imprinting of capacitor structures of a memory. Washington, DC: U.S. Patent and Trademark Office.

Basceri, C., & Sandhu, G. S. (2002). Capacitor processing method and DRAM processing method. Washington, DC: U.S. Patent and Trademark Office.

Basceri, C. (2002). Chemical vapor deposition methods of forming a high K dielectric layer and methods of forming a capacitor. Washington, DC: U.S. Patent and Trademark Office.

Basceri, C., & Gealy, D. (2002). Dielectric films and methods of forming same. Washington, DC: U.S. Patent and Trademark Office.

Rhodes, H. E., Visokay, M., Graettinger, T., Gealy, D., Sandhu, G., Basceri, C., & Cummings, S. (2002). Integrated capacitors fabricated with conductive metal oxides. Washington, DC: U.S. Patent and Trademark Office.

Basceri, C. (2002). Method for improving the sidewall stoichiometry of thin film capacitors. Washington, DC: U.S. Patent and Trademark Office.

Basceri, C., Visokay, M., Graettinger, T. M., & Cummings, S. D. (2002). Methods for forming and integrated circuit structures containing enhanced-surface-area conductive layers. Washington, DC: U.S. Patent and Trademark Office.

Basceri, C., & Sandhu, G. S. (2002). Structures and methods for enhancing capacitors in integrated circuits. Washington, DC: U.S. Patent and Trademark Office.

Basceri, C., & Sandhu, G. S. (2001). Dielectric cure for reducing oxygen vacancies. Washington, DC: U.S. Patent and Trademark Office.

Basceri, C., & Al-Shareef, H. N. (2001). Method for improving the resistance degradation of thin film capacitors. Washington, DC: U.S. Patent and Trademark Office.

Basceri, C. (2001). Method for improving the sidewall stoichiometry of thin film capacitors. Washington, DC: U.S. Patent and Trademark Office.

Basceri, C., & Sandhu, G. (2001). Method of forming haze-free BST films. Washington, DC: U.S. Patent and Trademark Office.

Stemmer, S., Streiffer, S. K., Browning, N. D., Basceri, C., & Kingon, A. I. (2000). Grain boundaries in barium strontium titanate thin films: Structure, chemistry and influence on electronic properties. INTERFACE SCIENCE, 8(2-3), 209–221. https://doi.org/10.1023/A:1008794520909

Streiffer, S. K., Basceri, C., Parker, C. B., Lash, S. E., & Kingon, A. I. (1999). Ferroelectricity in thin films: The dielectric response of fiber-textured (BaxSr1-x)Ti1+yO3+z thin films grown by chemical vapor deposition. JOURNAL OF APPLIED PHYSICS, 86(8), 4565–4575. https://doi.org/10.1063/1.371404

Lee, W. J., Basceri, C., Streiffer, S. K., Kingon, A. I., Yang, D. Y., Park, Y., & Kim, H. G. (1998). Ir and Ru bottom electrodes for (Ba, Sr) TiO3 thin films deposited by liquid delivery source chemical vapor deposition. THIN SOLID FILMS, 323(1-2), 285–290. https://doi.org/10.1016/S0040-6090(97)01043-2

Grossmann, M., Hoffmann, S., Gusowski, S., Waser, R., Streiffer, S. K., Basceri, C., … Kingon, A. I. (1998). Resistance degradation behavior of Ba0.7Sr0.3TiO3 thin films compared to mechanisms found in titanate ceramics and single crystals. Integrated Ferroelectrics, 22(1-4), 603–614.

Basceri, C., Streiffer, S. K., Kingon, A. I., & Waser, R. (1997). The dielectric response as a function of temperature and film thickness of fiber-textured (Ba,Sr)TiO3 thin films grown by chemical vapor deposition. JOURNAL OF APPLIED PHYSICS, 82(5), 2497–2504. https://doi.org/10.1063/1.366062