Prashant K. Kulshreshtha

2012 journal article

Effect of nickel contamination on high carrier lifetime n-type crystalline silicon

Journal of Applied Physics, 111(3).

By: Y. Yoon, B. Paudyal, J. Kim, Y. Ok, P. Kulshreshtha, S. Johnston, G. Rozgonyi

Source: NC State University Libraries

Added: August 6, 2018

2012 journal article

Nano-indentation: A tool to investigate crack propagation related phase transitions in PV silicon

Solar Energy Materials and Solar Cells, 96(1), 166–172.

By: P. Kulshreshtha, K. Youssef & G. Rozgonyi

Source: NC State University Libraries

Added: August 6, 2018

2012 journal article

Oxygen precipitation related stress-modified crack propagation in high growth rate Czochralski silicon wafers

Journal of the Electrochemical Society, 159(2), H125–129.

By: P. Kulshreshtha, Y. Yoon, K. Youssef, E. Good & G. Rozgonyi

Source: NC State University Libraries

Added: August 6, 2018

Works (3)