Prashant K. Kulshreshtha

Yoon, Y., Paudyal, B., Kim, J., Ok, Y. W., Kulshreshtha, P., Johnston, S., & Rozgonyi, G. (2012). Effect of nickel contamination on high carrier lifetime n-type crystalline silicon. Journal of Applied Physics, 111(3).

Kulshreshtha, P. K., Youssef, K. M., & Rozgonyi, G. (2012). Nano-indentation: A tool to investigate crack propagation related phase transitions in PV silicon. Solar Energy Materials and Solar Cells, 96(1), 166–172.

Kulshreshtha, P. K., Yoon, Y., Youssef, K. M., Good, E. A., & Rozgonyi, G. (2012). Oxygen precipitation related stress-modified crack propagation in high growth rate Czochralski silicon wafers. Journal of the Electrochemical Society, 159(2), H125–129.