Jeffrey D. Hartman

Hartman, J. D., Naniwae, K., Petrich, C., Nemanich, R., & Davis, R. F. (2005). Photo-electron emission and atomic force microscopies of the hydrogen etched 6H-SiC(0001) surface and the initial growth of GaN and AlN. APPLIED SURFACE SCIENCE, 242(3-4), 428–436. https://doi.org/10.1016/j.apsusc.2004.09.021

Hartman, J. D., Roskowski, A. M., Reitmeier, Z. J., Tracy, K. M., Davis, R. F., & Nemanich, R. J. (2003). Characterization of hydrogen etched 6H-SiC(0001) substrates and subsequently grown AlN films. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 21(2), 394–400. https://doi.org/10.1116/1.1539080

Platow, W., Oh, J., Nemanich, R. J., Sayers, D. E., Hartman, J. D., & Davis, R. F. (2002). TiC nanoisland formation on 6H-SiC(0001)(Si). JOURNAL OF APPLIED PHYSICS, 91(9), 6081–6084. https://doi.org/10.1063/1.1465121

Platow, W., Nemanich, R. J., Sayers, D. E., Hartman, J. D., & Davis, R. F. (2001). Growth of epitaxial CoSi2 on 6H-SiC(0001)(Si). JOURNAL OF APPLIED PHYSICS, 90(12), 5924–5927. https://doi.org/10.1063/1.1412842

Hartman, J. D., Naniwae, K., Petrich, C., Ramachandran, V., Feenstra, R. M., Nemanich, R. J., & Davis, R. F. (2000). Photo-emission electron microscopy (PEEM) of cleaned and etched 6H-SiC(0001). SILICON CARBIDE AND RELATED MATERIALS - 1999 PTS, 1 & 2, Vol. 338-3, pp. 353–356. https://doi.org/10.4028/www.scientific.net/msf.338-342.353

Ward, B. L., Hartman, J. D., Hurt, E. H., Tracy, K. M., Davis, R. F., & Nemanich, R. J. (2000). Schottky barrier height and electron affinity of titanium on AIN. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, Vol. 18, pp. 2082–2087. https://doi.org/10.1116/1.1303733

Nemanich, R. J., English, S. L., Hartman, J. D., Sowers, A. T., Ward, B. L., Ade, H., & Davis, R. F. (1999, May). Imaging electron emission from diamond and III-V nitride surfaces with photo-electron emission microscopy. APPLIED SURFACE SCIENCE, Vol. 146, pp. 287–294. https://doi.org/10.1016/S0169-4332(99)00021-5

Ade, H., Yang, W., English, S. L., Hartman, J., Davis, R. F., Nemanich, R. J., … Madey, J. M. J. (1998). A free electron laser-photoemission electron microscope system (FEL-PEEM). SURFACE REVIEW AND LETTERS, 5(6), 1257–1268. https://doi.org/10.1142/S0218625X98001596

Nemanich, R. J., Baumann, P. K., Benjamin, M. C., English, S. L., Hartman, J. D., Sowers, A. T., & Ward, B. L. (1998). Characterization of electron emitting surfaces of diamond and III-V nitrides. Diamond Films and Technology, 8(4), 211–223.

Ward, B. L., Nam, O. H., Hartman, J. D., English, S. L., McCarson, B. L., Schlesser, R., … Nemanich, R. J. (1998). Electron emission characteristics of GaN pyramid arrays grown via organometallic vapor phase epitaxy. JOURNAL OF APPLIED PHYSICS, 84(9), 5238–5242. https://doi.org/10.1063/1.368775