2003 journal article
Characterization of hydrogen etched 6H-SiC(0001) substrates and subsequently grown AlN films
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 21(2), 394–400.
2003 journal article
Electrical and chemical characterization of the Schottky barrier formed between clean n-GaN(0001) surfaces and Pt, Au, and Ag
JOURNAL OF APPLIED PHYSICS, 94(6), 3939–3948.
2003 journal article
Measurement of the band offsets of SiO2 on clean n- and p-type GaN(0001)
JOURNAL OF APPLIED PHYSICS, 93(7), 3995–4004.
2003 patent
Methods of fabricating gallium nitride microelectronic layers on silicon layers
Washington, DC: U.S. Patent and Trademark Office.
2003 journal article
Preparation and characterization of atomically clean, stoichiometric surfaces of n- and p-type GaN(0001)
JOURNAL OF APPLIED PHYSICS, 94(5), 3163–3172.
2002 journal article
Electrical, structural and microstructural characteristics of as-deposited and annealed Pt and Au contacts on chemical-vapor-cleaned GaN thin films
JOURNAL OF APPLIED PHYSICS, 91(4), 2133–2137.
2001 journal article
Formation of cobalt disilicide films on (root 3 x root 3)6H-SiC(0001)
PHYSICAL REVIEW B, 63(11).
2001 patent
Methods of fabricating gallium nitride microelectronic layers on silicon layers and gallium nitride microelectronic structures formed thereby
Washington, DC: U.S. Patent and Trademark Office.
2000 article
Schottky barrier height and electron affinity of titanium on AIN
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, Vol. 18, pp. 2082–2087.
1999 journal article
Process routes for low defect-density GaN on various substrates employing pendeo-epitaxial growth techniques
MRS Internet Journal of Nitride Semiconductor Research, 4S1(G4.9).
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