Works (10)
2003 article
Characterization of hydrogen etched 6H–SiC(0001) substrates and subsequently grown AlN films
Hartman, J. D., Roskowski, A. M., Reitmeier, Z. J., Tracy, K. M., Davis, R. F., & Nemanich, R. J. (2003, February 5). Journal of Vacuum Science & Technology A Vacuum Surfaces and Films.
2003 article
Electrical and chemical characterization of the Schottky barrier formed between clean n-GaN(0001) surfaces and Pt, Au, and Ag
Tracy, K. M., Hartlieb, P. J., Einfeldt, S., Davis, R. F., Hurt, E. H., & Nemanich, R. J. (2003, September 15). Journal of Applied Physics.
2003 article
Measurement of the band offsets of SiO2 on clean n- and p-type GaN(0001)
Cook, T. E., Fulton, C. C., Mecouch, W. J., Tracy, K. M., Davis, R. F., Hurt, E. H., … Nemanich, R. J. (2003, March 27). Journal of Applied Physics.
2003 patent
Methods of fabricating gallium nitride microelectronic layers on silicon layers
Washington, DC: U.S. Patent and Trademark Office.
2003 article
Preparation and characterization of atomically clean, stoichiometric surfaces of n- and p-type GaN(0001)
Tracy, K. M., Mecouch, W. J., Davis, R. F., & Nemanich, R. J. (2003, August 21). Journal of Applied Physics.
2002 article
Electrical, structural and microstructural characteristics of as-deposited and annealed Pt and Au contacts on chemical-vapor-cleaned GaN thin films
Preble, E. A., Tracy, K. M., Kiesel, S., McLean, H., Miraglia, P. Q., Nemanich, R. J., … Smith, D. J. (2002, February 15). Journal of Applied Physics.
2001 article
Formation of cobalt disilicide films on(3×3)6H−SiC(0001)
Platow, W., Wood, D. K., Tracy, K. M., Burnette, J. E., Nemanich, R. J., & Sayers, D. E. (2001, March 1). Physical Review. B, Condensed Matter.
2001 patent
Methods of fabricating gallium nitride microelectronic layers on silicon layers and gallium nitride microelectronic structures formed thereby
Washington, DC: U.S. Patent and Trademark Office.
2000 article
Schottky barrier height and electron affinity of titanium on AlN
Ward, B. L., Hartman, J. D., Hurt, E. H., Tracy, K. M., Davis, R. F., & Nemanich, R. J. (2000, July 1). Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena.
1999 journal article
Process routes for low defect-density GaN on various substrates employing pendeo-epitaxial growth techniques
MRS Internet Journal of Nitride Semiconductor Research, 4S1(G4.9).