Works (14)

Updated: April 11th, 2023 10:13

2003 journal article

Domain structures in 6H-SiC wafers and their effect on the microstructures of GaN films grown on AlN and Al0.2Ga0.8N buffer layers

JOURNAL OF CRYSTAL GROWTH, 258(1-2), 75–83.

By: E. Preble, P. Miraglia, A. Roskowski, W. Vetter*, M. Dudley* & R. Davis

author keywords: characterization; defects; X-ray diffraction; metalorganic vapor phase epitaxy; nitrides; semiconducting silicon compounds
Source: Web Of Science
Added: August 6, 2018

2003 journal article

Electron energy distribution during high-field transport in AlN

JOURNAL OF APPLIED PHYSICS, 93(5), 2765–2771.

Sources: Web Of Science, ORCID
Added: August 6, 2018

2003 journal article

Evolution and growth of ZnO thin films on GaN(0001) epilayers via metalorganic vapor phase epitaxy

JOURNAL OF CRYSTAL GROWTH, 257(3-4), 255–262.

author keywords: crystal morphology; dislocations; stacking faults; x-ray diffraction; organometallic vapor phase deposition; ZnO
Source: Web Of Science
Added: August 6, 2018

2003 journal article

Helical-type surface defects in GaN thin films epitaxially grown on GaN templates at reduced temperatures

JOURNAL OF CRYSTAL GROWTH, 253(1-4), 16–25.

author keywords: atomic force microscopy; growth models; line defects; surface defects; metalorganic vapor phase epitaxy; gallium nitride
Source: Web Of Science
Added: August 6, 2018

2003 journal article

Helical-type surface defects in InGaN thin films epitaxially grown on GaN templates at reduced temperatures

THIN SOLID FILMS, 437(1-2), 140–149.

By: P. Miraglia, E. Preble, A. Roskowski, S. Einfeldt, S. Lim, Z. Liliental-Weber, R. Davis

author keywords: surface defects; atomic force microscopy; metalorganic vapor phase epitaxy; indium gallium nitride
Source: Web Of Science
Added: August 6, 2018

2002 journal article

Application of Nomarski interference contrast microscopy as a thickness monitor in the preparation of transparent, SiG-based, cross-sectional TEM samples

ULTRAMICROSCOPY, 92(3-4), 265–271.

By: E. Preble, H. McLean, S. Kiesel n, P. Miraglia, M. Albrecht* & R. Davis

author keywords: Nomarski; transmission electron microscopy; silicon carbide; transparent samples
Source: Web Of Science
Added: August 6, 2018

2002 journal article

Electrical, structural and microstructural characteristics of as-deposited and annealed Pt and Au contacts on chemical-vapor-cleaned GaN thin films

JOURNAL OF APPLIED PHYSICS, 91(4), 2133–2137.

By: E. Preble, K. Tracy, S. Kiesel n, H. McLean n, P. Miraglia, R. Nemanich, R. Davis, M. Albrecht*, D. Smith*

Source: Web Of Science
Added: August 6, 2018

2002 journal article

Growth and decomposition of bulk GaN: role of the ammonia/nitrogen ratio

JOURNAL OF CRYSTAL GROWTH, 236(4), 529–537.

author keywords: decomposition; growth from vapor; single crystal growth; gallium compounds; nitrides semi-conducting III-V materials
Source: Web Of Science
Added: August 6, 2018

2002 journal article

Investigations regarding the maskless pendeo-epitaxial growth of GaN films prior to coalescence

IEEE JOURNAL OF QUANTUM ELECTRONICS, 38(8), 1006–1016.

author keywords: chemical vapor deposition; semiconductor growth; thin films; topography
Source: Web Of Science
Added: August 6, 2018

2002 journal article

Reduction in dislocation density and strain in GaN thin films grown via maskless pendeo-epitaxy

Opto-Electronics Review, 10(4), 261–270.

By: A. Roskowski, E. Preble, S. Einfeldt, P. Miraglia, J. Schuck, R. Grober, R. Davis

Source: NC State University Libraries
Added: August 6, 2018

2002 journal article

Surface instability and associated roughness during conventional and pendeo-epitaxial growth of GaN(0001) films via MOVPE

JOURNAL OF CRYSTAL GROWTH, 241(1-2), 141–150.

author keywords: characterization; defects; surface structure; metalorganic vapor phase epitaxy; pendeoepitaxy; semiconducting gallium compounds
Source: Web Of Science
Added: August 6, 2018

2001 journal article

Polarization charges and polarization-induced barriers in AlxGa1-xN/GaN and InyGa1-yN/GaN heterostructures

APPLIED PHYSICS LETTERS, 79(18), 2916–2918.

By: L. Jia*, E. Yu, D. Keogh*, P. Asbeck*, P. Miraglia, A. Roskowski n, R. Davis

Source: Web Of Science
Added: August 6, 2018

2001 journal article

Strain and dislocation reduction in maskless pendeo-epitaxy GaN thin films

Physica Status Solidi. A, Applications and Materials Science, 188(2), 729–732.

By: A. Roskowski, P. Miraglia, E. Preble, S. Einfeldt n, T. Stiles n, R. Davis, J. Schuck*, R. Grober*, U. Schwarz*

Source: NC State University Libraries
Added: August 6, 2018

1999 journal article

Characterization of gradients in mechanical properties of SA-533B steel welds using ball indentation

INTERNATIONAL JOURNAL OF PRESSURE VESSELS AND PIPING, 76(6), 361–369.

By: K. Murty, P. Miraglia, M. Mathew, V. Shah* & F. Haggag

author keywords: steel welds; automated ball indentation; stress-strain behavior; energy to fracture
Source: Web Of Science
Added: August 6, 2018