Dong-Joo Kim

Thickness dependence of submicron thick Pb(Zr0.3Ti0.7)O3 films on piezoelectric properties

Kim, D.-J., Park, J.-H., Shen, D., Lee, J. W., Kingon, A. I., Yoon, Y. S., & Kim, S.-H. (2007, August 14). Ceramics International.

Evaluation of intrinsic and extrinsic contributions to the piezoelectric properties of Pb(Zr1−XTX)O3 thin films as a function of composition

Kim, D.-J., Maria, J.-P., Kingon, A. I., & Streiffer, S. K. (2003, April 17). Journal of Applied Physics.

Effect of hydrogen on true leakage current characteristics of (Pb,La)(Zr,Ti)O₃ thin-film capacitors with Pt- or Ir-based top electrodes

Yoon, S.-G., Wicaksana, D., Kim, D.-J., Kim, S.-H., & Kingon, A. I. (2001, April 1). Journal of Materials Research/Pratt's Guide to Venture Capital Sources.

Epitaxial Pb(Mg1/3Nb2/3)O-3-PbTiO3 thin films grown by MOCVD

Integrated Ferroelectrics, 35(1-4), 1881–1888.

Metalorganic chemical vapor deposition Pb(Zr,Ti)O3 and selected lower electrode structures as a pathway to integrated piezoelectric microelectromechanical systems

Chen, I.-S., Roeder, J. F., Kim, D.-J., Maria, J.-P., & Kingon, A. I. (2001, September 1). Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena.

Influence of Pt heterostructure bottom electrodes on SrBi2Ta2O9 thin film properties

Kim, S.-H., Kim, D. J., Maria, J.-P., Kingon, A. I., Streiffer, S. K., Im, J., … Krauss, A. R. (2000, January 24). Applied Physics Letters.

Narrow resonance profiling study of the oxidation of reactively sputtered Ti1−Al N thin films

Hugon, M. C., Desvignes, J. M., Agius, B., Vickridge, I. C., Kim, D. J., & Kingon, A. I. (2000, March 1). Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms.

Oxidation resistance of TaSiN diffusion barriers

Integrated Ferroelectrics, 31(1-4), 315–322.

Thermally induced voltage offsets in Pb(Zr,Ti)O3 thin films

Kim, S.-H., Lee, D.-S., Hwang, C. S., Kim, D.-J., & Kingon, A. I. (2000, November 6). Applied Physics Letters.

An optimized process for fabrication of SrBi₂Ta₂O₉ thin films using a novel chemical solution deposition technique

Kim, S.-H., Kim, D. J., Lee, K. M., Park, M., Kingon, A. I., Nemanich, R. J., … Streiffer, S. K. (1999, November 1). Journal of Materials Research/Pratt's Guide to Venture Capital Sources.

Ferroelectric Properties of New Chemical Solution Derived SBT Thin Films for Non-Volatile Memory Devices

Kim, S.-H., Kim, D. J., Im, J., Kim, C. E., & Kingon, A. I. (1999, October 1). Journal of Sol-Gel Science and Technology.

Impact of changes in the Pt heterostructure bottom electrodes on the ferroelectric properties of SBT thin films

Kim, S.-H., Kim, D. J., Im, J., Streiffer, S. K., Auciello, O., Maria, J. P., & Kingon, A. I. (1999, October 1). Integrated Ferroelectrics.

Influences on imprint failure of SrBi2Ta2O9 thin film capacitors

Integrated Ferroelectrics, 25(1-4), 691–701.