Works (13)

Updated: July 5th, 2023 16:02

2008 journal article

Thickness dependence of submicron thick Pb(Zr0.3Ti0.7)O-3 films on piezoelectric properties

CERAMICS INTERNATIONAL, 34(8), 1909–1915.

By: D. Kim*, J. Park*, D. Shen*, J. Lee*, A. Kingon n, Y. Yoon*, S. Kim*

co-author countries: Korea (Republic of) 🇰🇷 United States of America 🇺🇸
author keywords: A. Sol-gel processes; C. Piezoelectric properties; D. PZT
Source: Web Of Science
Added: August 6, 2018

2003 journal article

Evaluation of intrinsic and extrinsic contributions to the piezoelectric properties of Pb(Zr1-xTX)O-3 thin films as a function of composition

JOURNAL OF APPLIED PHYSICS, 93(9), 5568–5575.

By: D. Kim n, J. Maria n, A. Kingon n & S. Streiffer*

co-author countries: United States of America 🇺🇸
Source: Web Of Science
Added: August 6, 2018

2001 journal article

Effect of hydrogen on true leakage current characteristics of (Pb,La)(Zr,Ti)O-3 thin-film capacitors with Pt- or Ir-based top electrodes

JOURNAL OF MATERIALS RESEARCH, 16(4), 1185–1189.

By: S. Yoon n, D. Wicaksana n, D. Kim n, S. Kim* & A. Kingon n

co-author countries: Korea (Republic of) 🇰🇷 United States of America 🇺🇸
Source: Web Of Science
Added: August 6, 2018

2001 journal article

Epitaxial Pb(Mg1/3Nb2/3)O-3-PbTiO3 thin films grown by MOCVD

Integrated Ferroelectrics, 35(1-4), 1881–1888.

By: P. Baumann, S. Streiffer, G. Bai, K. Ghosh, O. Auciello, C. Thompson, S. Stemmer, R. Rao ...

Source: NC State University Libraries
Added: August 6, 2018

2001 article

Metalorganic chemical vapor deposition Pb(Zr,Ti)O-3 and selected lower electrode structures as a pathway to integrated piezoelectric microelectromechanical systems

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, Vol. 19, pp. 1833–1840.

By: I. Chen*, J. Roeder*, D. Kim n, J. Maria n & A. Kingon n

co-author countries: United States of America 🇺🇸
Source: Web Of Science
Added: August 6, 2018

2000 journal article

Influence of Pt heterostructure bottom electrodes on SrBi2Ta2O9 thin film properties

APPLIED PHYSICS LETTERS, 76(4), 496–498.

By: S. Kim n, D. Kim n, J. Maria n, A. Kingon n, S. Streiffer*, J. Im*, O. Auciello*, A. Krauss*

co-author countries: United States of America 🇺🇸
Source: Web Of Science
Added: August 6, 2018

2000 article

Narrow resonance profiling study of the oxidation of reactively sputtered Ti1-xAlxN thin films

Hugon, M. C., Desvignes, J. M., Agius, B., Vickridge, I. C., Kim, D. J., & Kingon, A. I. (2000, March). NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, Vol. 161, pp. 578–583.

By: M. Hugon*, J. Desvignes*, B. Agius*, I. Vickridge*, D. Kim n & A. Kingon n

co-author countries: France 🇫🇷 United States of America 🇺🇸
author keywords: diffusion barriers; oxidation resistance; ferroelectric thin films; high dielectric constant materials
Source: Web Of Science
Added: August 6, 2018

2000 journal article

Oxidation resistance of TaSiN diffusion barriers

Integrated Ferroelectrics, 31(1-4), 315–322.

By: F. Letendu, M. Hugon, J. Desvignes, B. Agius, I. Vickridge, D. Kim, A. Kingon

Source: NC State University Libraries
Added: August 6, 2018

2000 journal article

Thermally induced voltage offsets in Pb(Zr,Ti)O-3 thin films

APPLIED PHYSICS LETTERS, 77(19), 3036–3038.

By: S. Kim*, D. Lee, C. Hwang*, D. Kim n & A. Kingon n

co-author countries: Korea (Republic of) 🇰🇷 United States of America 🇺🇸
Source: Web Of Science
Added: August 6, 2018

1999 journal article

An optimized process for fabrication of SrBi2Ta2O9 thin films using a novel chemical solution deposition technique

JOURNAL OF MATERIALS RESEARCH, 14(11), 4395–4401.

By: S. Kim n, D. Kim n, K. Lee n, M. Park n, A. Kingon n, R. Nemanich n, J. Im*, S. Streiffer*

co-author countries: United States of America 🇺🇸
Source: Web Of Science
Added: August 6, 2018

1999 journal article

Ferroelectric properties of new chemical solution derived SBT thin films for non-volatile memory devices

JOURNAL OF SOL-GEL SCIENCE AND TECHNOLOGY, 16(1-2), 57–63.

By: S. Kim n, D. Kim n, J. Im*, C. Kim* & A. Kingon n

co-author countries: Korea (Republic of) 🇰🇷 United States of America 🇺🇸
author keywords: ferroelectricity; chemical solution; alkanolamine; SBT; imprint; fatigue
Source: Web Of Science
Added: August 6, 2018

1999 journal article

Impact of changes in the Pt heterostructure bottom electrodes on the ferroelectric properties of SBT thin films

Integrated Ferroelectrics, 26(1-4), 955–970.

co-author countries: United States of America 🇺🇸
Source: NC State University Libraries
Added: August 6, 2018

1999 journal article

Influences on imprint failure of SrBi2Ta2O9 thin film capacitors

Integrated Ferroelectrics, 25(1-4), 691–701.

By: D. Kim, S. Kim, J. Maria & A. Kingon

Source: NC State University Libraries
Added: August 6, 2018

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