@article{bender_salmon_russell_2003, title={Combined atomic force microscopy and scanning tunneling microscopy imaging of cross-sectioned GaN light-emitting diodes}, volume={25}, number={1}, journal={Scanning}, author={Bender, J. W. and Salmon, M. E. and Russell, P. E.}, year={2003}, pages={45–51} }
 @article{neves_salmon_troughton_russell_2001, title={Self-healing on OPA self-assembled monolayers}, volume={12}, ISSN={["0957-4484"]}, DOI={10.1088/0957-4484/12/3/315}, abstractNote={Controlled scratches on octadecylphosphonic acid self-assembled monolayers were made using atomic force microscopy tips as indenters. Scratch morphological evolution was followed as a function of time, at room temperature, for samples prepared by drip coating and crystal melting methods. Self-healing, ranging from partial to complete, was observed on drip coated samples. However, no substantial healing was observed on crystal melted samples. Such different behaviour is discussed in terms of the scratching mechanism on both sample types.}, number={3}, journal={NANOTECHNOLOGY}, author={Neves, BRA and Salmon, ME and Troughton, EB and Russell, PE}, year={2001}, month={Sep}, pages={285–289} }
 @article{neves_salmon_russell_troughton_2001, title={Spread coating of OPA on mica: From multilayers to self-assembled monolayers}, volume={17}, ISSN={["0743-7463"]}, DOI={10.1021/la010909a}, abstractNote={The process of self-assembled monolayer (SAM) formation by the spread coating of an octadecylphosphonic acid (OPA) solution onto a mica surface is investigated by atomic force microscopy. When concentrated solutions are employed, a novel mechanism of SAM formation is found:  OPA multilayers, mostly bilayers, are initially deposited on the mica surface. As time passes, these large multilayers break apart and evolve into disorganized monolayers. Following a rapid evolution, such monolayers are found to transform into well-ordered OPA self-assembled monolayers.}, number={26}, journal={LANGMUIR}, author={Neves, BRA and Salmon, ME and Russell, PE and Troughton, EB}, year={2001}, month={Dec}, pages={8193–8198} }
 @inbook{neves_salmon_leonard_troughton_russell_2000, title={Scratching and healing investigations on self-assembled monolayers using Atomic Force Microscopy}, volume={165}, ISBN={0750306858}, number={2000}, booktitle={Microbeam Analysis 2000: proceedings of the Second Conference of the International Union of Microbeam Analysis Societies held in Kailua-Kona, Hawaii, 9-14 July 2000}, publisher={Bristol: Institute of Physics Publishing}, author={Neves, B. R. A. and Salmon, M. E. and Leonard, D. N. and Troughton, E. B. and Russell, P. E.}, editor={Williams, D. B. and Shimizu, R.Editors}, year={2000}, pages={367–368} }
 @misc{neves_salmon_russell_troughton_2000, title={Thermal stability study of self-assembled monolayers on mica}, volume={16}, number={6}, journal={Langmuir}, author={Neves, B. R. A. and Salmon, M. E. and Russell, P. E. and Troughton, E. B.}, year={2000}, pages={2409–2412} }
 @article{neves_salmon_russell_troughton_1999, title={Comparative study of field emission-scanning electron microscopy and atomic force microscopy to assess self-assembled monolayer coverage on any type of substrate}, volume={5}, ISSN={["1431-9276"]}, DOI={10.1017/S1431927699990475}, abstractNote={Abstract: In this work, we show how field emission–scanning electron microscopy (FE-SEM) can be a useful tool for the study of self-assembled monolayer systems. We have carried out a comparative study using FE-SEM and atomic force microscopy (AFM) to assess the morphology and coverage of self-assembled monolayers (SAM) on different substrates. The results show that FE-SEM images present the same qualitative information obtained by AFM images when the SAM is deposited on a smooth substrate (e.g., mica). Further experiments with rough substrates (e.g., Al grains on glass) show that FE-SEM is capable of unambiguously identifying SAMs on any type of substrate, whereas AFM has significant difficulties in identifying SAMs on rough surfaces.}, number={6}, journal={MICROSCOPY AND MICROANALYSIS}, author={Neves, BRA and Salmon, ME and Russell, PE and Troughton, EB}, year={1999}, pages={413–419} }
 @article{neves_leonard_salmon_russell_troughton_1999, title={Observation of topography inversion in atomic force microscopy of self-assembled monolayers}, volume={10}, ISSN={["0957-4484"]}, DOI={10.1088/0957-4484/10/4/307}, abstractNote={In this paper, we report on atomic force microscopy (AFM) investigation of a self-assembled monolayer (SAM) system - octadecylphosphonic acid (OPA) deposited on mica. With the deposition methods employed in this work, the SAM presents a partial coverage, i.e., the OPA covers only a fraction of the mica surface and, therefore, some bare mica regions are observed. Using standard intermittent contact AFM (IC-AFM) techniques (with medium to high oscillation damping), the topographic profile of this system clearly shows the flat SAM on top of the mica surface. However, when a small oscillation damping mode is employed, the topographic profile is inverted, i.e., the mica regions appear higher than the surrounding OPA layer. AFM experiments, carried out to assess the origin of this effect, yield strong evidences that it is related to the presence of a water contamination layer on the bare mica regions only. A semi-quantitative model is utilized to understand the experimental results.}, number={4}, journal={NANOTECHNOLOGY}, author={Neves, BRA and Leonard, DN and Salmon, ME and Russell, PE and Troughton, EB}, year={1999}, month={Dec}, pages={399–404} }