Michael E. Salmon

Bender, J. W., Salmon, M. E., & Russell, P. E. (2003). Combined atomic force microscopy and scanning tunneling microscopy imaging of cross-sectioned GaN light-emitting diodes. Scanning, 25(1), 45–51.

Neves, B. R. A., Salmon, M. E., Troughton, E. B., & Russell, P. E. (2001, September). Self-healing on OPA self-assembled monolayers. NANOTECHNOLOGY, Vol. 12, pp. 285–289. https://doi.org/10.1088/0957-4484/12/3/315

Neves, B. R. A., Salmon, M. E., Russell, P. E., & Troughton, E. B. (2001). Spread coating of OPA on mica: From multilayers to self-assembled monolayers. LANGMUIR, 17(26), 8193–8198. https://doi.org/10.1021/la010909a

Neves, B. R. A., Salmon, M. E., Leonard, D. N., Troughton, E. B., & Russell, P. E. (2000). Scratching and healing investigations on self-assembled monolayers using Atomic Force Microscopy. In D. B. Williams & R. Shimizu (Eds.), Microbeam Analysis 2000: proceedings of the Second Conference of the International Union of Microbeam Analysis Societies held in Kailua-Kona, Hawaii, 9-14 July 2000 (Vol. 165, pp. 367–368). Bristol: Institute of Physics Publishing.

Neves, B. R. A., Salmon, M. E., Russell, P. E., & Troughton, E. B. (2000). Thermal stability study of self-assembled monolayers on mica.

Neves, B. R. A., Salmon, M. E., Russell, P. E., & Troughton, E. B. (1999). Comparative study of field emission-scanning electron microscopy and atomic force microscopy to assess self-assembled monolayer coverage on any type of substrate. MICROSCOPY AND MICROANALYSIS, 5(6), 413–419. https://doi.org/10.1017/S1431927699990475

Neves, B. R. A., Leonard, D. N., Salmon, M. E., Russell, P. E., & Troughton, E. B. (1999). Observation of topography inversion in atomic force microscopy of self-assembled monolayers. NANOTECHNOLOGY, 10(4), 399–404. https://doi.org/10.1088/0957-4484/10/4/307