2004 journal article

Integrated rotating-compensator polarimeter for real-time measurements and analysis of organometallic chemical vapor deposition

Thin Solid Films, 455-56(2004 May 1), 639–644.

By: K. Flock, S. Kim, M. Asar, I. Kim & D. Aspnes

Source: NC State University Libraries
Added: August 6, 2018

2004 journal article

Real-time characterization of GaSb homo- and heteroepitaxy

Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures, 22(4), 2233–2239.

By: S. Kim, K. Flock, M. Asar, I. Kim & D. Aspnes

Source: NC State University Libraries
Added: August 6, 2018

2004 journal article

The simultaneous determination of n, k, and t from polarimetric data

Thin Solid Films, 455-56(2004 May 1), 349–355.

By: K. Flock

Source: NC State University Libraries
Added: August 6, 2018

2002 journal article

Pseudodielectric function of ZnGeP2 from 1.5 to 6 eV

Applied Physics Letters, 81(4), 628–630.

By: V. Blickle, K. Flock, N. Dietz & D. Aspnes

Source: NC State University Libraries
Added: August 6, 2018

2001 journal article

Investigation and control of MOVPE growth by combined spectroscopic ellipsometry and reflectance-difference spectroscopy

Physica Status Solidi. A, Applications and Materials Science, 184(1), 79–87.

By: M. Ebert, K. Bell, K. Flock & D. Aspnes

Source: NC State University Libraries
Added: August 6, 2018

2000 journal article

In situ monitoring of MOVPE growth by combined spectroscopic ellipsometry and reflectance-difference spectroscopy

Thin Solid Films, 364(1-2), 22–27.

By: M. Ebert, K. Bell, S. Yoo, K. Flock & D. Aspnes

Source: NC State University Libraries
Added: August 6, 2018

2000 journal article

Real-time optical characterization of heteroepitaxy by organometallic chemical vapor deposition

Journal of Vacuum Science & Technology. A, Vacuum, Surfaces, and Films, 18(4), 1184–1189.

By: K. Bell, M. Ebert, S. Yoo, K. Flock & D. Aspnes

Source: NC State University Libraries
Added: August 6, 2018

2000 journal article

Real-time optical techniques and QMS to characterize growth in a modified commercial OMVPE reactor

Journal of Electronic Materials, 29(1), 106–111.

By: K. Bell, M. Ebert, S. Yoo, K. Flock & D. Aspnes

Source: NC State University Libraries
Added: August 6, 2018