Klaus Flock

Integrated rotating-compensator polarimeter for real-time measurements and analysis of organometallic chemical vapor deposition

Thin Solid Films, 455-56(2004 May 1), 639–644.

Real-time characterization of GaSb homo- and heteroepitaxy

Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures, 22(4), 2233–2239.

The simultaneous determination of n, k, and t from polarimetric data

Thin Solid Films, 455-56(2004 May 1), 349–355.

Pseudodielectric function of ZnGeP2 from 1.5 to 6 eV

Applied Physics Letters, 81(4), 628–630.

Investigation and control of MOVPE growth by combined spectroscopic ellipsometry and reflectance-difference spectroscopy

Physica Status Solidi. A, Applications and Materials Science, 184(1), 79–87.

In situ monitoring of MOVPE growth by combined spectroscopic ellipsometry and reflectance-difference spectroscopy

Thin Solid Films, 364(1-2), 22–27.

Real-time optical characterization of heteroepitaxy by organometallic chemical vapor deposition

Journal of Vacuum Science & Technology. A, Vacuum, Surfaces, and Films, 18(4), 1184–1189.

Real-time optical techniques and QMS to characterize growth in a modified commercial OMVPE reactor

Journal of Electronic Materials, 29(1), 106–111.