2004 journal article
Integrated rotating-compensator polarimeter for real-time measurements and analysis of organometallic chemical vapor deposition
Thin Solid Films, 455-56(2004 May 1), 639–644.
2004 journal article
Real-time characterization of GaSb homo- and heteroepitaxy
Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures, 22(4), 2233–2239.
2004 journal article
The simultaneous determination of n, k, and t from polarimetric data
Thin Solid Films, 455-56(2004 May 1), 349–355.
2002 journal article
Pseudodielectric function of ZnGeP2 from 1.5 to 6 eV
Applied Physics Letters, 81(4), 628–630.
2001 journal article
Investigation and control of MOVPE growth by combined spectroscopic ellipsometry and reflectance-difference spectroscopy
Physica Status Solidi. A, Applications and Materials Science, 184(1), 79–87.
2000 journal article
In situ monitoring of MOVPE growth by combined spectroscopic ellipsometry and reflectance-difference spectroscopy
Thin Solid Films, 364(1-2), 22–27.
2000 journal article
Real-time optical characterization of heteroepitaxy by organometallic chemical vapor deposition
Journal of Vacuum Science & Technology. A, Vacuum, Surfaces, and Films, 18(4), 1184–1189.
2000 journal article
Real-time optical techniques and QMS to characterize growth in a modified commercial OMVPE reactor
Journal of Electronic Materials, 29(1), 106–111.