Works (8)
2004 article
Integrated rotating-compensator polarimeter for real-time measurements and analysis of organometallic chemical vapor deposition
Flock, K., Kim, S.-J., Asar, M., Kim, I. K., & Aspnes, D. E. (2004, March 29). Thin Solid Films, Vol. 455-56, pp. 639–644.
2004 article
Real-time characterization of GaSb homo- and heteroepitaxy
Kim, S., Flock, K. L., Asar, M., Kim, I. K., & Aspnes, D. E. (2004, July 1). Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena, Vol. 22, pp. 2233–2239.
2004 article
The simultaneous determination of n, k, and t from polarimetric data
Flock, K. (2004, April 28). Thin Solid Films.
2002 article
Pseudodielectric function of ZnGeP2 from 1.5 to 6 eV
Blickle, V., Flock, K., Dietz, N., & Aspnes, D. E. (2002, July 22). Applied Physics Letters, Vol. 81, pp. 628–630.
2001 article
Investigation and Control of MOVPE Growth by Combined Spectroscopic Ellipsometry and Reflectance-Difference Spectroscopy
Ebert, M., Bell, K. A., Flock, K., & Aspnes, D. E. (2001, March 1). Physica Status Solidi (a), Vol. 184, pp. 79–87.
2000 article
In situ monitoring of MOVPE growth by combined spectroscopic ellipsometry and reflectance-difference spectroscopy
Ebert, M., Bell, K. A., Yoo, S. D., Flock, K., & Aspnes, D. E. (2000, March 1). Thin Solid Films, Vol. 364, pp. 22–27.
2000 article
Real-time optical characterization of heteroepitaxy by organometallic chemical vapor deposition
Bell, K. A., Ebert, M., Yoo, S. D., Flock, K., & Aspnes, D. E. (2000, July 1). Journal of Vacuum Science & Technology A Vacuum Surfaces and Films, Vol. 18, pp. 1184–1189.
2000 article
Real-time optical techniques and QMS to characterize growth in a modified commercial OMVPE reactor
Bell, K. A., Ebert, M., Yoo, S. D., Flock, K., & Aspnes, D. E. (2000, January 1). Journal of Electronic Materials, Vol. 29, pp. 106–111.