Works (8)

Updated: July 5th, 2023 16:02

2004 article

Integrated rotating-compensator polarimeter for real-time measurements and analysis of organometallic chemical vapor deposition

Flock, K., Kim, S. J., Asar, M., Kim, I. K., & Aspnes, D. E. (2004, May 1). THIN SOLID FILMS, Vol. 455, pp. 639–644.

By: K. Flock n, S. Kim n, M. Asar n, I. Kim n & D. Aspnes n

co-author countries: United States of America 🇺🇸
author keywords: rotating-compensator rotating-sample spectroscopic polarimeter; organometallic chemical vapor deposition; heteroepitaxial growth; ellipsometry; GaSb
Sources: Web Of Science, ORCID
Added: August 6, 2018

2004 article

Real-time characterization of GaSb homo- and heteroepitaxy

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, Vol. 22, pp. 2233–2239.

By: S. Kim n, K. Flock n, M. Asar n, I. Kim n & D. Aspnes n

co-author countries: United States of America 🇺🇸
Sources: Web Of Science, ORCID
Added: August 6, 2018

2004 article

The simultaneous determination of n, k, and t from polarimetric data

Flock, K. (2004, May 1). THIN SOLID FILMS, Vol. 455, pp. 349–355.

By: K. Flock n

co-author countries: United States of America 🇺🇸
author keywords: three-phase model; thin film; real-time diagnostics; ellipsometry
Source: Web Of Science
Added: August 6, 2018

2002 journal article

Pseudodielectric function of ZnGeP2 from 1.5 to 6 eV

APPLIED PHYSICS LETTERS, 81(4), 628–630.

By: V. Blickle*, K. Flock n, N. Dietz n & D. Aspnes n

co-author countries: Germany 🇩🇪 United States of America 🇺🇸
Sources: Web Of Science, ORCID
Added: August 6, 2018

2001 journal article

Investigation and control of MOVPE growth by combined spectroscopic ellipsometry and reflectance-difference spectroscopy

PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 184(1), 79–87.

By: M. Ebert n, K. Bell n, K. Flock n & D. Aspnes n

co-author countries: United States of America 🇺🇸
Sources: Web Of Science, ORCID
Added: August 6, 2018

2000 article

In situ monitoring of MOVPE growth by combined spectroscopic ellipsometry and reflectance-difference spectroscopy

Ebert, M., Bell, K. A., Yoo, S. D., Flock, K., & Aspnes, D. E. (2000, March 27). THIN SOLID FILMS, Vol. 364, pp. 22–27.

By: M. Ebert n, K. Bell n, S. Yoo n, K. Flock n & D. Aspnes n

co-author countries: United States of America 🇺🇸
author keywords: real-time monitoring; metalorganic vapor phase epitaxy; growth control; spectroscopic ellipsometry; reflectance-difference spectroscopy; silicon (Si); gallium phosphide (GaP)
Sources: Web Of Science, ORCID
Added: August 6, 2018

2000 article

Real-time optical characterization of heteroepitaxy by organometallic chemical vapor deposition

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, Vol. 18, pp. 1184–1189.

By: K. Bell n, M. Ebert n, S. Yoo n, K. Flock n & D. Aspnes n

co-author countries: United States of America 🇺🇸
Sources: Web Of Science, ORCID
Added: August 6, 2018

2000 article

Real-time optical techniques and QMS to characterize growth in a modified commercial OMVPE reactor

Bell, K. A., Ebert, M., Yoo, S. D., Flock, K., & Aspnes, D. E. (2000, January). JOURNAL OF ELECTRONIC MATERIALS, Vol. 29, pp. 106–111.

By: K. Bell n, M. Ebert n, S. Yoo n, K. Flock n & D. Aspnes n

co-author countries: United States of America 🇺🇸
author keywords: real-time monitoring; organometallic vapor phase epitaxy; quadrupole mass spectrometry; spectroscopic ellipsometry; reflectance-difference spectroscopy; silicon (Si); gallium phosphide (GaP)
Sources: Web Of Science, ORCID
Added: August 6, 2018