2002 journal article
Comparison of secondary ion mass spectroscopy analysis of ultrashallow phosphorus using Cs+, O-2(+), and CsC6- primary ion beams
Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures, 20(2), 507–511.
2000 journal article
Secondary ion mass spectrometry depth profiling of ultrashallow phosphorous in silicon
Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures, 18(1), 509–513.