A data mining and CIDF based approach for detecting novel and distributed intrusions
In Recent advances in intrusion detection: Third international workshop, RAID 2000, Toulouse, France, October 2-4, 2000: Proceedings (Vol. 1907, pp. 49–65). Berlin; New York: Springer.
1998 conference paper
Evaluation and comparison of 3.0 nm gate-stack dielectrics for tenth-micron technology NMOSFETs
Rapid thermal and integrated processing VII: Symposium held April 13-15, 1998, San Francisco, California, U.S.A. (Materials Research Society symposium proceedings ; v.525), 157–162. Warrendale, Pennsylvania: Materials Research Society.