Kam Fu Yee

Lee, W., Nimbalkar, R. A., Yee, K. K., Patil, S. B., Desai, P. H., Tran, T. T., & Stolfo, S. J. (2000). A data mining and CIDF based approach for detecting novel and distributed intrusions. In Recent advances in intrusion detection: Third international workshop, RAID 2000, Toulouse, France, October 2-4, 2000: Proceedings (Vol. 1907, pp. 49–65). Berlin; New York: Springer.

Osburn, C. M., De, I., Yee, K. F., & Srivastava, A. (2000). Design and integration considerations for end-of-the roadmap ultrashallow junctions. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, Vol. 18, pp. 338–345. https://doi.org/10.1116/1.591195

Evaluation and comparison of 3.0 nm gate-stack dielectrics for tenth-micron technology NMOSFETs. (1998). Rapid thermal and integrated processing VII: Symposium held April 13-15, 1998, San Francisco, California, U.S.A.  (Materials Research Society symposium proceedings ; v.525), 157–162. Warrendale, Pennsylvania: Materials Research Society.