Brian J. Rodriguez

Peritubular dentin lacks piezoelectricity

JOURNAL OF DENTAL RESEARCH, 86(9), 908–911.

Probing intrinsic polarization properties in bismuth-layered ferroelectric films

Applied Physics Letters, 90(11).

Bioelectromechanical imaging by scanning probe microscopy: Galvani's experiment at the nanoscale

ULTRAMICROSCOPY, 106(4-5), 334–340.

Electromechanical imaging of biomaterials by scanning probe microscopy

JOURNAL OF STRUCTURAL BIOLOGY, 153(2), 151–159.

Fabrication of metallic nanowires on a ferroelectric template via photochemical reaction

NANOTECHNOLOGY, 17(19), 4946–4949.

Vector piezoresponse force microscopy

MICROSCOPY AND MICROANALYSIS, 12(3), 206–220.

AlN bulk crystals grown on SiC seeds

Dalmau, R., Schlesser, R., Rodriguez, B. J., Nemanich, R. J., & Sitar, Z. (2005, July 15). JOURNAL OF CRYSTAL GROWTH, Vol. 281, pp. 68–74.

Atomic force microscopy-based experimental setup for studying domain switching dynamics in ferroelectric capacitors

REVIEW OF SCIENTIFIC INSTRUMENTS, 76(2).

Direct studies of domain switching dynamics in thin film ferroelectric capacitors

APPLIED PHYSICS LETTERS, 87(8).

Domain growth kinetics in lithium niobate single crystals studied by piezoresponse force microscopy

APPLIED PHYSICS LETTERS, 86(1).

Electromechanical imaging of biological systems with sub-10 nm resolution

Applied Physics Letters, 87(5).

Investigation of the mechanism of polarization switching in ferroelectric capacitors by three- dimensional piezoresponse force microscopy

APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 80(1), 99–103.

Nanoelectromechanics of polarization switching in piezoresponse force microscopy

Journal of Applied Physics, 97(7).

Photo electron emission microscopy of polarity-patterned materials

Yang, W. C., Rodriguez, B. J., Gruverman, A., & Nemanich, R. J. (2005, April 27). JOURNAL OF PHYSICS-CONDENSED MATTER, Vol. 17, pp. S1415–S1426.

Preparation and characterization of atomically clean, stoichlometric surfaces of AIN(0001)

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 23(1), 72–77.

Scanning probe investigation of surface charge and surface potential of GaN-based heterostructures

APPLIED PHYSICS LETTERS, 86(11).

Simultaneous elastic and electromechanical imaging by scanning probe microscopy: Theory and applications to ferroelectric and biological materials

Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures, 23(5), 2102–2108.

In situ cleaning and characterization of oxygen- and zinc-terminated, n-type, ZnO{0001} surfaces

JOURNAL OF APPLIED PHYSICS, 95(10), 5856–5864.

Polarization-dependent electron affinity of LiNbO3 surfaces

APPLIED PHYSICS LETTERS, 85(12), 2316–2318.

Three-dimensional high-resolution reconstruction of polarization in ferroelectric capacitors by piezoresponse force microscopy

JOURNAL OF APPLIED PHYSICS, 95(4), 1958–1962.

Mechanical stress effect on imprint behavior of integrated ferroelectric capacitors

APPLIED PHYSICS LETTERS, 83(4), 728–730.

Micro-Raman study of electronic properties of inversion domains in GaN-based lateral polarity heterostructures

JOURNAL OF APPLIED PHYSICS, 93(12), 9542–9547.

Photoelectron emission microscopy observation of inversion domain boundaries of GaN-based lateral polarity heterostructures

Journal of Applied Physics, 94(9), 5720–5725.

Spatial inhomogeneity of imprint and switching behavior in ferroelectric capacitors

APPLIED PHYSICS LETTERS, 82(18), 3071–3073.

Wavelength-dependent Raman scattering of hydrogenated amorphous silicon carbon with red, green, and blue light excitation

JOURNAL OF MATERIALS RESEARCH, 18(4), 768–771.

Nanoscale observation of photoinduced domain pinning and investigation of imprint behavior in ferroelectric thin films

JOURNAL OF APPLIED PHYSICS, 92(5), 2734–2739.

Piezoresponse force microscopy for piezoelectric measurements of III-nitride materials

Rodriguez, B. J., Gruverman, A., Kingon, A. I., & Nemanich, R. J. (2002, December). JOURNAL OF CRYSTAL GROWTH, Vol. 246, pp. 252–258.

Piezoresponse force microscopy for polarity imaging of GaN

APPLIED PHYSICS LETTERS, 80(22), 4166–4168.

Spatial variation of ferroelectric properties in Pb(Zr-0.3, Ti-0.7)O-3 thin films studied by atomic force microscopy

JOURNAL OF APPLIED PHYSICS, 87(11), 8031–8034.