Works (1)
Updated: July 5th, 2023 16:01
2000 article
Channeling effects during focused-ion-beam micromachining of copper
Phillips, J. R., Griffis, D. P., & Russell, P. E. (2000, July 1). Journal of Vacuum Science & Technology A Vacuum Surfaces and Films.
topics (OpenAlex): Advanced Surface Polishing Techniques; Integrated Circuits and Semiconductor Failure Analysis; Ion-surface interactions and analysis
Source: Web Of Science
Added: August 6, 2018