Gilbert B. Rayner

Lucovsky, G., Rayner, G. B., Kang, D., Hinkle, C. L., & Hong, J. G. (2004). A  spectroscopic phase separation study distinguishing between chemical with different degrees of crystallinity in Zr(Hf) silicate alloys. Surface Science, 566(Sep 20 2004), 772–776. https://doi.org/10.1016/j.susc.2004.06.010

Lucovsky, G., Rayner, G. B., Kang, D., Hinkle, C. L., & Hong, J. G. (2004). A spectroscopic study distinguishing between chemical phase separation with different degrees of crystallinity in Hf(Zr) silicate alloys. Applied Surface Science, 234(37990), 429–433. https://doi.org/10.1016/j.apsusc.2004.05.075

Rayner, G. B., Kang, D., Hinkle, C. L., Hong, J. G., & Lucovsky, G. (2004). Chemical phase separation in Zr silicate alloys: a spectroscopic study distinguishing between chemical phase separation with different degree of micro- and nano-crystallinity. Microelectronic Engineering, 72(04-Jan), 304–309. https://doi.org/10.1016/j.mee.2004.01.008

Rayner, G. B., Kang, D., & Lucovsky, G. (2004). Chemical phase separation in Zr silicate alloys: a spectroscopic study distinguishing between chemical phase separation with different degrees of micro- and nano-crystallinity. Journal of Non-Crystalline Solids, 338-40(Jun 15 2004), 151–154. https://doi.org/10.1016/j.jnoncrysol.2004.02.042

Lucovsky, G., Rayner, B., Zhang, Y., Appel, G., & Whitten, J. (2003). Band offset energies in zirconium silicate Si alloys. Applied Surface Science, 216(04-Jan), 215–222. https://doi.org/10.1016/S0169-4332(03)00429-X

Bae, C., Rayner, G. B., & Lucovsky, G. (2003). Device-quality GaN-dielectric interfaces by 300 degrees C remote plasma processing. Applied Surface Science, 216(04-Jan), 119–123. https://doi.org/10.1016/S0169-4332(03)00497-5

Lucovsky, G., Zhang, Y., Rayner, G. B., Appel, G., Ade, H., & Whitten, J. L. (2002). Electronic structure of high-k transition metal oxides and their silicate and aluminate alloys. Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures, 20(4), 1739–1747.

Rayner, G. B., Kang, D., Zhang, Y., & Lucovsky, G. (2002). Nonlinear composition dependence of x-ray photoelectron spectroscopy and Auger electron spectroscopy features in plasma-deposited zirconium silicate alloy thin films. Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures, 20(4), 1748–1758. https://doi.org/10.1116/1.1493788

Lucovsky, G., Rayner, G. B., & Johnson, R. S. (2001). Chemical and physical limits on the performance of metal silicate high-k gate dielectrics. Microelectronics Reliability, 41(7), 937–945. https://doi.org/10.1016/S0026-2714(01)00046-4

Lucovsky, G., Rayner, G. B., Kang, D., Appel, G., Johnson, R. S., Zhang, Y., … Whitten, J. L. (2001). Electronic structure of noncrystalline transition metal silicate and aluminate alloys. Applied Physics Letters, 79(12), 1775–1777. https://doi.org/10.1063/1.1404997

Lucovsky, G., & Rayner, G. B. (2000). Microscopic model for enhanced dielectric constants in low concentration SiO2-rich noncrystalline Zr and Hf silicate alloys. Applied Physics Letters, 77(18), 2912–2914. https://doi.org/10.1063/1.1320860