Alexei Gruverman

Vortex ferroelectric domains

Journal of Physics. Condensed Matter, 20(34).

A new test facility for efficient evaluation of MEMS contact materials

JOURNAL OF MICROMECHANICS AND MICROENGINEERING, 17(9), 1788–1795.

High-resolution imaging of proteins in human teeth by scanning probe microscopy

BIOCHEMICAL AND BIOPHYSICAL RESEARCH COMMUNICATIONS, 352(1), 142–146.

Peritubular dentin lacks piezoelectricity

JOURNAL OF DENTAL RESEARCH, 86(9), 908–911.

Probing intrinsic polarization properties in bismuth-layered ferroelectric films

Applied Physics Letters, 90(11).

Semiconductor device and its manufacture method, and measurement fixture for the semiconductor device

Washington, DC: U.S. Patent and Trademark Office.

Semiconductor device having die attachment and die pad for applying tensile or compressive stress to the IC chip

Washington, DC: U.S. Patent and Trademark Office.

Ultrahigh density ferroelectric storage and lithography by high order ferroic switching

Washington, DC: U.S. Patent and Trademark Office.

Bioelectromechanical imaging by scanning probe microscopy: Galvani's experiment at the nanoscale

ULTRAMICROSCOPY, 106(4-5), 334–340.

Electromechanical imaging of biomaterials by scanning probe microscopy

JOURNAL OF STRUCTURAL BIOLOGY, 153(2), 151–159.

Fabrication of metallic nanowires on a ferroelectric template via photochemical reaction

NANOTECHNOLOGY, 17(19), 4946–4949.

Ferroelectric behavior in nominally relaxor lead lanthanum zirconate titanate thin films prepared by chemical solution deposition on copper foil

Applied Physics Letters, 88(26).

Introduction to the special issue on nanoscale ferroelectrics

IEEE Transactions on Ultrasonics Ferroelectrics and Frequency Control, 53(12), 2206–2207.

Nanoscale ferroelectrics: processing, characterization and future trends

[Review of ]. Reports on Progress in Physics, 69(8), 2443–2474.

Piezoresponse force microscopy and recent advances in nanoscale studies of ferroelectrics

JOURNAL OF MATERIALS SCIENCE, 41(1), 107–116.

Semiconductor device having a stress layer for applying tensile of compressive stress to the ferroelectric film

Washington, DC: U.S. Patent and Trademark Office.

Skyrmion model of nano-domain nucleation in ferroelectrics and ferromagnets

JOURNAL OF PHYSICS-CONDENSED MATTER, 18(5), L71–L79.

Thickness profiles through fatigued bulk ceramic lead zirconate titanate

Journal of Applied Physics, 100(11).

Vector piezoresponse force microscopy

MICROSCOPY AND MICROANALYSIS, 12(3), 206–220.

Atomic force microscopy-based experimental setup for studying domain switching dynamics in ferroelectric capacitors

REVIEW OF SCIENTIFIC INSTRUMENTS, 76(2).

Direct studies of domain switching dynamics in thin film ferroelectric capacitors

APPLIED PHYSICS LETTERS, 87(8).

Domain growth kinetics in lithium niobate single crystals studied by piezoresponse force microscopy

APPLIED PHYSICS LETTERS, 86(1).

Electromechanical imaging of biological systems with sub-10 nm resolution

Applied Physics Letters, 87(5).

Investigation of the mechanism of polarization switching in ferroelectric capacitors by three- dimensional piezoresponse force microscopy

APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 80(1), 99–103.

Nanoelectromechanics of polarization switching in piezoresponse force microscopy

Journal of Applied Physics, 97(7).

Nanoscale polarization relaxation in a polycrystalline ferroelectric thin film: Role of local environments

Applied Physics Letters, 86(26).

Photo electron emission microscopy of polarity-patterned materials

Yang, W. C., Rodriguez, B. J., Gruverman, A., & Nemanich, R. J. (2005, April 27). JOURNAL OF PHYSICS-CONDENSED MATTER, Vol. 17, pp. S1415–S1426.

Scanning probe investigation of surface charge and surface potential of GaN-based heterostructures

APPLIED PHYSICS LETTERS, 86(11).

Simultaneous elastic and electromechanical imaging by scanning probe microscopy: Theory and applications to ferroelectric and biological materials

Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures, 23(5), 2102–2108.

Investigation of Pb(Zr,Ti)O-3/GaN heterostructures by scanning probe microscopy

APPLIED PHYSICS LETTERS, 84(25), 5153–5155.

Polarization-dependent electron affinity of LiNbO3 surfaces

APPLIED PHYSICS LETTERS, 85(12), 2316–2318.

Quantitative analysis of nanoscale switching in SrBi2Ta2O9 thin films by piezoresponse force microscopy

APPLIED PHYSICS LETTERS, 85(5), 795–797.

Three-dimensional high-resolution reconstruction of polarization in ferroelectric capacitors by piezoresponse force microscopy

JOURNAL OF APPLIED PHYSICS, 95(4), 1958–1962.

Mechanical stress effect on imprint behavior of integrated ferroelectric capacitors

APPLIED PHYSICS LETTERS, 83(4), 728–730.

Origin and implications of the observed rhombohedral phase in nominally tetragonal Pb(Zr0.35Ti0.65)O-3 thin films

JOURNAL OF APPLIED PHYSICS, 94(8), 5210–5219.

Spatial inhomogeneity of imprint and switching behavior in ferroelectric capacitors

APPLIED PHYSICS LETTERS, 82(18), 3071–3073.

Coercive fields in ferroelectrics: A case study in lithium niobate and lithium tantalate

APPLIED PHYSICS LETTERS, 80(15), 2740–2742.

Ferroelectric film property measuring device, measuring method therefor and measuring method for semiconductor memory units

Washington, DC: U.S. Patent and Trademark Office.

Imaging and engineering the nanoscale-domain structure of a Sr0.61Ba0.39Nb2O6 crystal using a scanning force microscope

APPLIED PHYSICS LETTERS, 81(11), 2044–2046.

Nanoscale observation of photoinduced domain pinning and investigation of imprint behavior in ferroelectric thin films

JOURNAL OF APPLIED PHYSICS, 92(5), 2734–2739.

Piezoresponse force microscopy for piezoelectric measurements of III-nitride materials

Rodriguez, B. J., Gruverman, A., Kingon, A. I., & Nemanich, R. J. (2002, December). JOURNAL OF CRYSTAL GROWTH, Vol. 246, pp. 252–258.

Piezoresponse force microscopy for polarity imaging of GaN

APPLIED PHYSICS LETTERS, 80(22), 4166–4168.

Asymmetric nanoscale switching in ferroelectric thin films by scanning force microscopy

APPLIED PHYSICS LETTERS, 78(18), 2751–2753.

On the imaging mechanism of ferroelectric domains in scanning force microscopy

NANO LETTERS, 1(2), 93–95.

Polarization retention in SrBi2Ta2O9 thin films investigated at nanoscale

Journal of Applied Physics, 89(3), 1836–1843.

Seeding effect on micro- and domain structure of sol-gel-derived PZT thin films

MATERIALS LETTERS, 50(4), 219–224.

Nanoscale scanning force imaging of polarization phenomena in ferroelectric thin films

MRS Bulletin, 23(1), 33–42.