Alexei Gruverman

Vortex ferroelectric domains

Journal of Physics. Condensed Matter, 20(34).

A new test facility for efficient evaluation of MEMS contact materials

Yang, Z., Lichtenwalner, D., Morris, A., Menzel, S., Nauenheim, C., Gruverman, A., … Kingon, A. I. (2007, August 3). Journal of Micromechanics and Microengineering, Vol. 17, pp. 1788–1795.

Peritubular Dentin Lacks Piezoelectricity

Habelitz, S., Rodriguez, B. J., Marshall, S. J., Marshall, G. W., Kalinin, S. V., & Gruverman, A. (2007, September 1). Journal of Dental Research.

Probing intrinsic polarization properties in bismuth-layered ferroelectric films

Applied Physics Letters, 90(11).

Semiconductor device and its manufacture method, and measurement fixture for the semiconductor device

Washington, DC: U.S. Patent and Trademark Office.

Semiconductor device having die attachment and die pad for applying tensile or compressive stress to the IC chip

Washington, DC: U.S. Patent and Trademark Office.

Ultrahigh density ferroelectric storage and lithography by high order ferroic switching

Washington, DC: U.S. Patent and Trademark Office.

Fabrication of metallic nanowires on a ferroelectric template via photochemical reaction

Hanson, J. N., Rodriguez, B. J., Nemanich, R. J., & Gruverman, A. (2006, September 15). Nanotechnology.

Ferroelectric behavior in nominally relaxor lead lanthanum zirconate titanate thin films prepared by chemical solution deposition on copper foil

Applied Physics Letters, 88(26).

High-resolution imaging of proteins in human teeth by scanning probe microscopy

Gruverman, A., Wu, D., Rodriguez, B. J., Kalinin, S. V., & Habelitz, S. (2006, November 14). Biochemical and Biophysical Research Communications.

Introduction to the special issue on nanoscale ferroelectrics

IEEE Transactions on Ultrasonics Ferroelectrics and Frequency Control, 53(12), 2206–2207.

Nanoscale ferroelectrics: processing, characterization and future trends

[Review of ]. Reports on Progress in Physics, 69(8), 2443–2474.

Piezoresponse force microscopy and recent advances in nanoscale studies of ferroelectrics

Gruverman, A., & Kalinin, S. V. (2006, January 1). Journal of Materials Science.

Semiconductor device having a stress layer for applying tensile of compressive stress to the ferroelectric film

Washington, DC: U.S. Patent and Trademark Office.

Skyrmion model of nano-domain nucleation in ferroelectrics and ferromagnets

Dawber, M., Gruverman, A., & Scott, J. F. (2006, January 20). Journal of Physics Condensed Matter.

Thickness profiles through fatigued bulk ceramic lead zirconate titanate

Journal of Applied Physics, 100(11).

Vector Piezoresponse Force Microscopy

Kalinin, S. V., Rodriguez, B. J., Jesse, S., Shin, J., Baddorf, A. P., Gupta, P., … Gruverman, A. (2006, May 16). Microscopy and Microanalysis.

Atomic force microscopy-based experimental setup for studying domain switching dynamics in ferroelectric capacitors

Dehoff, C., Rodriguez, B. J., Kingon, A. I., Nemanich, R. J., Gruverman, A., & Cross, J. S. (2005, January 24). Review of Scientific Instruments.

Bioelectromechanical imaging by scanning probe microscopy: Galvani's experiment at the nanoscale

Kalinin, S. V., Rodriguez, B. J., Shin, J., Jesse, S., Grichko, V., Thundat, T., … Gruverman, A. (2005, December 16). Ultramicroscopy.

Direct studies of domain switching dynamics in thin film ferroelectric capacitors

Gruverman, A., Rodriguez, B. J., Dehoff, C., Waldrep, J. D., Kingon, A. I., Nemanich, R. J., & Cross, J. S. (2005, August 12). Applied Physics Letters.

Electromechanical imaging of biological systems with sub-10 nm resolution

Applied Physics Letters, 87(5).

Electromechanical imaging of biomaterials by scanning probe microscopy

Rodriguez, B. J., Kalinin, S. V., Shin, J., Jesse, S., Grichko, V., Thundat, T., … Gruverman, A. (2005, December 10). Journal of Structural Biology.

Nanoelectromechanics of polarization switching in piezoresponse force microscopy

Journal of Applied Physics, 97(7).

Nanoscale polarization relaxation in a polycrystalline ferroelectric thin film: Role of local environments

Applied Physics Letters, 86(26).

Photo electron emission microscopy of polarity-patterned materials

Yang, W.-C., Rodriguez, B. J., Gruverman, A., & Nemanich, R. J. (2005, April 8). Journal of Physics Condensed Matter.

Scanning probe investigation of surface charge and surface potential of GaN-based heterostructures

Rodriguez, B. J., Yang, W.-C., Nemanich, R. J., & Gruverman, A. (2005, March 11). Applied Physics Letters.

Simultaneous elastic and electromechanical imaging by scanning probe microscopy: Theory and applications to ferroelectric and biological materials

Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures, 23(5), 2102–2108.

Domain growth kinetics in lithium niobate single crystals studied by piezoresponse force microscopy

Rodriguez, B. J., Nemanich, R. J., Kingon, A., Gruverman, A., Kalinin, S. V., Terabe, K., … Kitamura, K. (2004, December 23). Applied Physics Letters.

Investigation of Pb(Zr,Ti)O3∕GaN heterostructures by scanning probe microscopy

Gruverman, A., Cao, W., Bhaskar, S., & Dey, S. K. (2004, June 18). Applied Physics Letters.

Investigation of the mechanism of polarization switching in ferroelectric capacitors by three- dimensional piezoresponse force microscopy

Rodriguez, B. J., Gruverman, A., Kingon, A. I., Nemanich, R. J., & Cross, J. S. (2004, July 7). Applied Physics A.

Polarization-dependent electron affinity of LiNbO3 surfaces

Yang, W.-C., Rodriguez, B. J., Gruverman, A., & Nemanich, R. J. (2004, September 20). Applied Physics Letters.

Quantitative analysis of nanoscale switching in SrBi2Ta2O9 thin filmsby piezoresponse force microscopy

Kalinin, S. V., Gruverman, A., & Bonnell, D. A. (2004, July 27). Applied Physics Letters.

Three-dimensional high-resolution reconstruction of polarization in ferroelectric capacitors by piezoresponse force microscopy

Rodriguez, B. J., Gruverman, A., Kingon, A. I., Nemanich, R. J., & Cross, J. S. (2004, January 27). Journal of Applied Physics.

Mechanical stress effect on imprint behavior of integrated ferroelectric capacitors

Gruverman, A., Rodriguez, B. J., Kingon, A. I., Nemanich, R. J., Tagantsev, A. K., Cross, J. S., & Tsukada, M. (2003, July 24). Applied Physics Letters.

Origin and implications of the observed rhombohedral phase in nominally tetragonal Pb(Zr0.35Ti0.65)O3 thin films

Kelman, M. B., McIntyre, P. C., Gruverman, A., Hendrix, B. C., Bilodeau, S. M., & Roeder, J. F. (2003, October 3). Journal of Applied Physics.

Spatial inhomogeneity of imprint and switching behavior in ferroelectric capacitors

Gruverman, A., Rodriguez, B. J., Kingon, A. I., Nemanich, R. J., Cross, J. S., & Tsukada, M. (2003, May 1). Applied Physics Letters.

Coercive fields in ferroelectrics: A case study in lithium niobate and lithium tantalate

Kim, S., Gopalan, V., & Gruverman, A. (2002, April 15). Applied Physics Letters.

Ferroelectric film property measuring device, measuring method therefor and measuring method for semiconductor memory units

Washington, DC: U.S. Patent and Trademark Office.

Imaging and engineering the nanoscale-domain structure of a Sr0.61Ba0.39Nb2O6 crystal using a scanning force microscope

Terabe, K., Takekawa, S., Nakamura, M., Kitamura, K., Higuchi, S., Gotoh, Y., & Gruverman, A. (2002, September 9). Applied Physics Letters.

Nanoscale observation of photoinduced domain pinning and investigation of imprint behavior in ferroelectric thin films

Gruverman, A., Rodriguez, B. J., Nemanich, R. J., & Kingon, A. I. (2002, September 1). Journal of Applied Physics.

Piezoresponse force microscopy for piezoelectric measurements of III-nitride materials

Rodriguez, B. J., Gruverman, A., Kingon, A. I., & Nemanich, R. J. (2002, November 11). Journal of Crystal Growth.

Piezoresponse force microscopy for polarity imaging of GaN

Rodriguez, B. J., Gruverman, A., Kingon, A. I., Nemanich, R. J., & Ambacher, O. (2002, June 3). Applied Physics Letters.

Asymmetric nanoscale switching in ferroelectric thin films by scanning force microscopy

Gruverman, A., Kholkin, A., Kingon, A., & Tokumoto, H. (2001, April 30). Applied Physics Letters.

On the Imaging Mechanism of Ferroelectric Domains in Scanning Force Microscopy

Gruverman, A., & Tokumoto, H. (2001, January 24). Nano Letters.

Polarization retention in SrBi2Ta2O9 thin films investigated at nanoscale

Journal of Applied Physics, 89(3), 1836–1843.

Seeding effect on micro- and domain structure of sol–gel-derived PZT thin films

Kholkin, A. L., Gruverman, A., Wu, A., Avdeev, M., Vilarinho, P. M., Salvado, I. M. M., & Baptista, J. L. (2001, September 1). Materials Letters.

Nanoscale scanning force imaging of polarization phenomena in ferroelectric thin films

MRS Bulletin, 23(1), 33–42.