@article{alexson_bergman_nemanich_dutta_stroscio_parker_bedair_el-masry_adar_2001, title={Ultraviolet raman study of A(1)(LO) and E-2 phonons in InxGa1-xN alloys}, volume={89}, ISSN={["0021-8979"]}, DOI={10.1063/1.1330760}, abstractNote={We report on ultraviolet Raman spectroscopy of InxGa1−xN thin films grown on sapphire by metal-organic chemical vapor deposition. The A1(LO) and E2 phonon mode behavior was investigated over a large compositional range (0<x<0.50). Compelling evidence is presented for one-mode behavior for the A1(LO) phonon, and data suggestive of two-mode behavior are presented for the E2 phonon.}, number={1}, journal={JOURNAL OF APPLIED PHYSICS}, author={Alexson, D and Bergman, L and Nemanich, RJ and Dutta, M and Stroscio, MA and Parker, CA and Bedair, SM and El-Masry, NA and Adar, F}, year={2001}, month={Jan}, pages={798–800} }
 @article{balkas_sitar_bergman_shmagin_muth_kolbas_nemanich_davis_2000, title={Growth and characterization of GaN single crystals}, volume={208}, ISSN={["0022-0248"]}, DOI={10.1016/S0022-0248(99)00445-5}, abstractNote={Up to 3 mm long GaN single crystals were grown by sublimation of cold pressed GaN pellets or evaporation of gallium (Ga) metal under an ammonia (NH3) flow in a dual heater, high-temperature growth system. A growth rate of 500 μm/h along the [0 0 0 1] direction was achieved using a source temperature of 1200°C, a total pressure of 760 Torr, and an NH3 flow rate of 50 sccm. The resulting crystals were transparent, possessed low aspect ratios and well-defined growth facets. The only impurity present at high concentrations was oxygen (3×1018 atoms/cm3). Photoluminescence studies conducted at 77 K showed a sharp emission peak centered at 359 nm. Time-dependent photoluminescence measurements revealed optical metastability in bulk GaN. Raman spectroscopy yielded narrow peaks representing only the modes allowed for the wurtzite structure. All characterization studies confirmed excellent crystalline and optical quality of the obtained single crystals.}, number={1-4}, journal={JOURNAL OF CRYSTAL GROWTH}, author={Balkas, CM and Sitar, Z and Bergman, L and Shmagin, IK and Muth, JF and Kolbas, R and Nemanich, RJ and Davis, RF}, year={2000}, month={Jan}, pages={100–106} }
 @article{bergman_dutta_stroscio_komirenko_nemanich_eiting_lambert_kwon_dupuis_2000, title={Photoluminescence and recombination mechanisms in GaN/Al0.2Ga0.8N superlattice}, volume={76}, ISSN={["0003-6951"]}, DOI={10.1063/1.126225}, abstractNote={A detailed study of photoluminescence (PL) of GaN(1 nm)/Al0.2Ga0.8N(3.3 nm) twenty periods superlattice grown via metal-organic chemical vapor deposition is presented. The dependence of the PL emission energy, linewidth, and intensity on temperature, in the low temperature regime, is consistent with recombination mechanisms involving bandtail states attributed to a small degree of interfacial disorder. The activation energy of the nonradiative centers in our superlattice agrees well with the value we derive for the width of the tail-state distribution. Moreover, we find that the average phonon energy of the phonons that control the interband PL energy at high temperatures is larger for the superlattice than for a high-quality GaN film. This observation is consistent with model calculations predicting the phonon mode properties of GaN–AlN-based wurtzite heterostructures.}, number={15}, journal={APPLIED PHYSICS LETTERS}, author={Bergman, L and Dutta, M and Stroscio, MA and Komirenko, SM and Nemanich, RJ and Eiting, CJ and Lambert, DJH and Kwon, HK and Dupuis, RD}, year={2000}, month={Apr}, pages={1969–1971} }
 @article{alexson_bergman_dutta_kim_komirenko_nemanich_lee_stroscio_yu_1999, title={Confined phonons and phonon-mode properties of III–V nitrides with wurtzite crystal structure}, volume={263-264}, ISSN={0921-4526}, url={http://dx.doi.org/10.1016/S0921-4526(98)01423-9}, DOI={10.1016/s0921-4526(98)01423-9}, abstractNote={Stimulated by the recent interest in the use of nitride-based III–V wurtzite structures for optoelectronic and electronic devices, this paper reports on the application of the Loudon model for uniaxial crystals to derive the Fröhlich interaction Hamiltonian as well as the electron–optical-phonon scattering rate in wurtzite crystals. This paper also presents experimental analyses of the mode behavior of phonons in wurtzite crystals.}, journal={Physica B: Condensed Matter}, publisher={Elsevier BV}, author={Alexson, D and Bergman, Leah and Dutta, Mitra and Kim, K.W and Komirenko, S and Nemanich, Robert J and Lee, B.C and Stroscio, Michael A and Yu, SeGi}, year={1999}, month={Mar}, pages={510–513} }
 @article{park_sowers_rinne_schlesser_bergman_nemanich_sitar_hren_cuomo_zhirnov_et al._1999, title={Effect of nitrogen incorporation on electron emission from chemical vapor deposited diamond}, volume={17}, ISSN={["2166-2746"]}, DOI={10.1116/1.590630}, abstractNote={Two different types of the nitrogen-doped chemical vapor deposited (CVD) diamond films were synthesized with N2 (nitrogen) and C3H6N6 (melamine) as doping sources. The samples were analyzed by scanning electron microscopy, Raman scattering, photoluminescence spectroscopy, and field-emission measurements. More effective substitutional nitrogen doping was achieved with C3H6N6 than with N2. The diamond film doped with N2 contained a significant amount of nondiamond carbon phases. The sample produced with N2 exhibited a lower field emission turn-on field than the sample produced with C3H6N6. It is believed that the presence of the graphitic phases (or amorphous sp2 carbon) at the grain boundaries of the diamond and/or the nanocrystallinity (or microcrystallinity) of the diamond play a significant role in lowering the turn-on field of the film produced using N2. It is speculated that substitutional nitrogen doping plays only a minor role in changing the field emission characteristics of CVD diamond films.}, number={2}, journal={JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B}, author={Park, M and Sowers, AT and Rinne, CL and Schlesser, R and Bergman, L and Nemanich, RJ and Sitar, Z and Hren, JJ and Cuomo, JJ and Zhirnov, VV and et al.}, year={1999}, pages={734–739} }
 @article{bergman_alexson_nemanich_dutta_stroscio_balkas_davis_1999, title={Phonon dynamics and lifetimes of AlN and GaN crystallites}, volume={4S1}, DOI={10.1557/s1092578300003422}, abstractNote={The quasi-LO and quasi-TO modes of AlN crystallite were investigated. The analysis indicates that the Raman mode behavior concurs with Loudons’ model of mode-mixing in wurtzite (WZ) structure crystals which is due to the long-range electrostatic field. Phononlifetimes of GaN and AlN crystallites were studied via Raman lineshape. It was found that the low energy E2 mode lifetime is about an order of magnitude longer than that of the other modes, and that impurities impact significantly the phonon-lifetimes.}, number={G6.65}, journal={MRS Internet Journal of Nitride Semiconductor Research}, author={Bergman, L. and Alexson, D. and Nemanich, R. J. and Dutta, M. and Stroscio, M. A. and Balkas, C. and Davis, R. F.}, year={1999} }
 @article{park_mcgregor_bergman_nemanich_hren_cuomo_choi_zhirnov_1999, title={Raman analysis and field emission study of ion beam etched diamond films}, volume={17}, ISSN={["2166-2746"]}, DOI={10.1116/1.590622}, abstractNote={Discontinuous diamond films were deposited on silicon using a microwave plasma chemical vapor deposition system. The diamond deposits were sharpened by argon ion beam etching. Raman spectroscopy was carried out to study the structural change of the diamond after ion beam bombardment. It was found that amorphous sp2 carbon is produced as diamond is being sputtered by the Ar ion beam. The field emission turn-on field was also drastically lowered after sharpening, which, it is speculated, is caused by field enhancement due to change in geometry and/or structural changes (such as amorphization of crystalline diamond into graphitic or amorphous sp2 carbon) by Ar ion irradiation.}, number={2}, journal={JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B}, author={Park, M and McGregor, DR and Bergman, L and Nemanich, RJ and Hren, JJ and Cuomo, JJ and Choi, WB and Zhirnov, VV}, year={1999}, pages={700–704} }
 @article{bergman_alexson_murphy_nemanich_dutta_stroscio_balkas_shin_davis_1999, title={Raman analysis of phonon lifetimes in AlN and GaN of wurtzite structure}, volume={59}, ISSN={["1550-235X"]}, DOI={10.1103/physrevb.59.12977}, abstractNote={Raman analyses of the lifetimes of phonons in GaN and AlN crystallites of wurtzite structure are presented. In order to ensure the accuracy of the measurement of the phonon lifetimes, an experimental procedure to eliminate the broadening due to the finite slit width was performed. The lifetime analyses indicate that the phonon lifetimes in AlN as well as in GaN fall into two main time regimes: a relatively long time of the ${E}_{2}^{1}$ mode and much shorter times of the ${E}_{2}^{2},$ $E1(\mathrm{TO}),$ and $A1(\mathrm{TO})$ modes. The lifetimes of the ${E}_{2}^{1},$ ${E}_{2}^{2},$ $E1(\mathrm{TO}),$ $A1(\mathrm{TO}),$ and $A1(\mathrm{LO})$ modes of an high-quality AlN crystallite are 4.4, 0.83, 0.91, 0.76, and 0.45 ps, respectively. Moreover, the lifetime of the $A1(\mathrm{LO})$ mode found in this study is consistent with the current phonon-decay model of that mode in wurtzite structure materials. The lifetimes of ${E}_{2}^{1},$ ${E}_{2}^{2},$ $E1(\mathrm{TO}),$ and $A1(\mathrm{TO})$ of a GaN crystallite were found to be 10.1, 1.4, 0.95, and 0.46 ps, respectively. The $A1(\mathrm{LO})$ mode in the GaN was not observed and its absence is attributed to plasmon damping. The lifetime shortening due to impurities was also studied: the lifetimes of the Raman modes of an AlN crystallite, which contains about two orders of magnitude more Si and C impurities relative to the concentration of the high-quality crystallite were found to be 50% shorter.}, number={20}, journal={PHYSICAL REVIEW B}, author={Bergman, L and Alexson, D and Murphy, PL and Nemanich, RJ and Dutta, M and Stroscio, MA and Balkas, C and Shin, H and Davis, RF}, year={1999}, month={May}, pages={12977–12982} }
 @article{bergman_dutta_balkas_davis_christman_alexson_nemanich_1999, title={Raman analysis of the E1 and A1 quasi-longitudinal optical and quasi-transverse optical modes in wurtzite AlN}, volume={85}, ISSN={["0021-8979"]}, DOI={10.1063/1.369712}, abstractNote={This article presents a study of the quasi-longitudinal optical and quasi-transverse optical modes in wurtzite AlN which originate from the interaction of phonons belonging to the A1 and E1 symmetry groups. In order to analyze the allowed quasi as well as pure Raman modes, the modes were observed in a rotating crystallographic coordinate system, and the Raman tensors of the wurtzite crystal structure were calculated as a function of the crystallographic rotation. The frequencies of the quasimodes of wurtzite AlN were also analyzed in terms of the interaction of the polar phonons with the long range electrostatic field model. The experimental values of the Raman frequencies of the quasiphonons concur with these expected from the model, implying that the long range electrostatic field dominates the short range forces for polar phonons in AlN.}, number={7}, journal={JOURNAL OF APPLIED PHYSICS}, author={Bergman, L and Dutta, M and Balkas, C and Davis, RF and Christman, JA and Alexson, D and Nemanich, RJ}, year={1999}, month={Apr}, pages={3535–3539} }
 @article{park_camphausen_myers_barletta_sakhrani_bergman_nemanich_cuomo_1999, title={Raman scattering of tetrahedrally-bonded amorphous carbon deposited at oblique angles}, volume={41}, ISSN={["1873-4979"]}, DOI={10.1016/S0167-577X(99)00135-4}, abstractNote={Amorphous carbon (txa-C1−x) films were prepared by filtered cathodic arc deposition (FCAD). The films were deposited on p-type Si (111). The angle of beam incidence was varied from 0° to 75° with respect to the substrate normal. Micro-Raman spectroscopy, electron energy loss spectroscopy (EELS), and transmission electron microscopy (TEM) were carried out for sample analysis. It was found that the position of the G peak shifts to a higher wave number region as the angle of incidence increases. This means that the sp2/sp3 ratio increases with increasing angle. This conclusion is supported by EELS. The film deposited at an angle of 75° exhibits a columnar structure with alternating high and low carbon density regions.}, number={5}, journal={MATERIALS LETTERS}, author={Park, M and Camphausen, SM and Myers, AF and Barletta, PT and Sakhrani, V and Bergman, L and Nemanich, RJ and Cuomo, JJ}, year={1999}, month={Dec}, pages={229–233} }
 @article{yu_kim_bergman_dutta_stroscio_zavada_1998, title={Long-wavelength optical phonons in ternary nitride-based crystals}, volume={58}, ISSN={0163-1829 1095-3795}, url={http://dx.doi.org/10.1103/PhysRevB.58.15283}, DOI={10.1103/physrevb.58.15283}, abstractNote={Phonon modes in column-III--nitride ternary semiconductors are investigated theoretically within the modified random-element isodisplacement model. It is found that ${A}_{1}$ and ${E}_{1}$ branches of optical phonons in wurtzite ${\mathrm{Ga}}_{x}{\mathrm{Al}}_{1\ensuremath{-}x}\mathrm{N}$ and ${\mathrm{In}}_{x}{\mathrm{Ga}}_{1\ensuremath{-}x}\mathrm{N}$ exhibit one-mode behavior. This result is explained by the fact that atomic mass of nitrogen is much smaller than those of other atoms.}, number={23}, journal={Physical Review B}, publisher={American Physical Society (APS)}, author={Yu, SeGi and Kim, K. W. and Bergman, Leah and Dutta, Mitra and Stroscio, Michael A. and Zavada, John M.}, year={1998}, month={Dec}, pages={15283–15287} }
 @article{shen_shmagin_koch_kolbas_fahmy_bergman_nemanich_mcclure_sitar_quan_1997, title={Photoluminescence from mechanically milled Si and SiO2 powders}, volume={55}, ISSN={["0163-1829"]}, DOI={10.1103/physrevb.55.7615}, abstractNote={The photoluminescence (PL) in as-received and milled Si and SiO2 powder is reported. The Si and SiO2 powder is characterized by chemical analysis, Raman scattering, x-ray photoelectron spectra, infrared absorption, x-ray diffraction, and differential thermal analysis. The results indicate that the Si powder has amorphous Si oxide and suboxide surface layers. The milling of Si powder results in the formation of nanocrystalline/amorphous Si components. An amorphous SiO2 component is formed by milling crystalline SiO2. The PL spectra for as-received Si, milled Si, and SiO2 powder exhibit similar peak shapes, peak maxima, and full width at half maximum values. For both the as-received and the milled Si powder, experimental results appear to exclude mechanisms for PL related to an amorphous Si component or Si-H or Si-OH bonds, or the quantum confinement effect. Similarly, for milled SiO2 powder mechanisms for PL do not appear related to Si-H or Si-OH bonds. Instead the greatly increased intensity of PL for milled SiO2 can be related to both the increased volume fraction of the amorphous SiO2 component and the increased density of defects introduced in the amorphous SiO2 upon milling. It is suggested that the PL for as-received Si, milling-induced nanocrystalline/amorphous Si, and milled SiO2 results from defects, such as the nonbridging oxygen hole center, in the amorphous Si suboxide and/or SiO2 components existing in these powder samples. The PL measurement for milled SiO2 is dependent on air pressure whereas that for as-received SiO2 is not, suggesting that new emitting centers are formed by milling.}, number={12}, journal={PHYSICAL REVIEW B}, author={Shen, TD and Shmagin, I and Koch, CC and Kolbas, RM and Fahmy, Y and Bergman, L and Nemanich, RJ and McClure, MT and Sitar, Z and Quan, MX}, year={1997}, month={Mar}, pages={7615–7623} }
 @article{bergman_bremser_perry_davis_dutta_nemanich_1997, title={Raman analysis of the configurational disorder in AlxGa1-xN films}, volume={71}, ISSN={["0003-6951"]}, DOI={10.1063/1.119367}, abstractNote={Raman analysis of the E2 mode of AlxGa1−xN in the composition range 0⩽x⩽1 is presented. The line shape was observed to exhibit a significant asymmetry and broadening toward the high energy range. The spatial correlation model is discussed, and is shown to account for the line shape. The model calculations also indicate the lack of a long-range order in the chemical vapor deposition alloys. These results were confirmed by x-ray scattering: the relative intensity of the superlattice line was found to be negligible. The line broadening of the E2 mode was found to exhibit a maximum at a composition x≅0.5 indicative of a random disordered alloy system.}, number={15}, journal={APPLIED PHYSICS LETTERS}, author={Bergman, L and Bremser, MD and Perry, WG and Davis, RF and Dutta, M and Nemanich, RJ}, year={1997}, month={Oct}, pages={2157–2159} }
 @article{balkas_sitar_zheleva_bergman_nemanich_davis_1997, title={Sublimation growth and characterization of bulk aluminum nitride single crystals}, volume={179}, ISSN={["0022-0248"]}, DOI={10.1016/S0022-0248(97)00160-7}, abstractNote={Single crystalline platelets of aluminum nitride (AlN) ⩽ 1 mm thick have been grown within the temperature range of 1950–2250°C on 10 × 10 mm2 α(6H)-silicon carbide (SiC) substrates via sublimation-recondensation in a resistively heated graphite furnace. The source material was sintered AlN. A maximum growth rate of 500 μm/h was achieved at 2150°C and a source-to-seed separation of 4 mm. Growth rates below 2000°C were approximately one order of magnitude lower. Crystals grown at high temperatures ranged in color from blue to green due to the incorporation of Si and C from the SiC substrates; those grown at lower temperatures were colorless and transparent. Secondary-ion mass spectroscopy (SIMS) results showed almost a two order of magnitude decrease in the concentrations of these two impurities in the transparent crystals. Plan view transmission electron microscopy (TEM) of these crystals showed no line or planar defects. Raman spectroscopy and X-ray diffraction (XRD) studies indicated a strain free material.}, number={3-4}, journal={JOURNAL OF CRYSTAL GROWTH}, author={Balkas, CM and Sitar, Z and Zheleva, T and Bergman, L and Nemanich, R and Davis, RF}, year={1997}, month={Aug}, pages={363–370} }
 @inproceedings{balkas_sitar_zheleva_bergman_shmagin_muth_kolbas_nemanich_davis_1996, title={Growth of bulk AIN and GaN single crystals by sublimation}, booktitle={III-V nitrides: symposium held December 2-6, 1996, Boston, Massachusetts, U.S.A.  (Materials Research Society symposia proceedings ; v. 449)}, publisher={Pittsburgh, Pa.: Materials Research Society}, author={Balkas, C. M. and Sitar, Z. and Zheleva, T. and Bergman, L. and Shmagin, I. K. and Muth, J. F. and Kolbas, R. M. and Nemanich, R. and Davis, R. F.}, year={1996}, pages={41–46} }