@inproceedings{lucovsky_phillips_2009, title={Strain-eliminating chemical bonding self-organizations within intermediate phase (IP) windows in chalcogenide, oxide and nitride non-crystalline bulk glasses and deposited thin film binary, ternary and quaternary alloys}, volume={355}, DOI={10.1016/j.jnoncrysol.2009.04.044}, number={37-42}, booktitle={Journal of Non-crystalline Solids}, author={Lucovsky, G. and Phillips, J. C.}, year={2009}, pages={1786–1791} } @article{lucovsky_phillips_2007, title={Chemical self-organization length scales in non- and nano-crystalline thin films}, volume={51}, DOI={10.1016/j.sse.2007.06.001}, number={10}, journal={Solid-state Electronics}, author={Lucovsky, G. and Phillips, J. C.}, year={2007}, pages={1308–1318} } @article{lucovsky_phillips_2007, title={Defect reduction in non-crystalline and nano-crystalline thin films: chemical bonding self-organizations and minimization of macroscopic strain}, volume={9}, number={10}, journal={Journal of Optoelectronics and Advanced Materials}, author={Lucovsky, G. and Phillips, J. C.}, year={2007}, pages={2989–2995} } @article{lucovsky_baker_paesler_phillips_thorpe_2007, title={Intermediate phases in binary and ternary alloys. How far can we go with a semi-empirical bond-constraint theory?}, volume={9}, number={10}, journal={Journal of Optoelectronics and Advanced Materials}, author={Lucovsky, G. and Baker, D. A. and Paesler, M. A. and Phillips, J. C. and Thorpe, M. F.}, year={2007}, pages={2979–2988} } @article{lucovsky_baker_paesler_phillips_2007, title={Spectroscopic and electrical detection of intermediate phases and chemical bonding self-organizations in (i) dielectric films for semiconductor devices, and (ii) chalcogenide alloys for optical memory devices}, volume={353}, DOI={10.1016/j.jnoncrysol.2007.01.041}, number={18-21}, journal={Journal of Non-crystalline Solids}, author={Lucovsky, G. and Baker, D. A. and Paesler, M. A. and Phillips, J. C.}, year={2007}, pages={1713–1722} } @article{lucovsky_phillips_2004, title={Bond strain and defects at Si-SiO2 and internal dielectric interfaces in high-k gate stacks}, volume={16}, DOI={10.1088/0953-8984/16/44/011}, number={44}, journal={Journal of Physics. Condensed Matter}, author={Lucovsky, G. and Phillips, J. C.}, year={2004}, pages={S5139–5151} } @article{olby_blot_thibaud_phillips_o'brien_burr_berg_brown_breen_2004, title={Cerebellar cortical degeneration in adult American Staffordshire Terriers}, volume={18}, DOI={10.1892/0891-6640(2004)18<201:CCDIAA>2.0.CO;2}, number={2}, journal={Journal of Veterinary Internal Medicine}, author={Olby, Natasha and Blot, S. and Thibaud, J. L. and Phillips, J. and O'brien, D. P. and Burr, J. and Berg, J. and Brown, T. and Breen, M.}, year={2004}, pages={201–208} } @article{phillips_2002, title={Four novel mutations in the PITX2 gene in patients with Axenfeld-Rieger syndrome}, volume={34}, DOI={10.1159/000065602}, number={5}, journal={Ophthalmic Research}, author={Phillips, J. C.}, year={2002}, pages={324–326} }