Works (4)
2005 article
A new understanding of near-threshold damage for 200 keV irradiation in silicon
Stoddard, N., Duscher, G., Windl, W., & Rozgonyi, G. (2005, July 1). Journal of Materials Science.
2005 journal article
Ab initio identification of the nitrogen diffusion mechanism in silicon
Physical Review Letters, 95(2).
2005 article
Segregation and enhanced diffusion of nitrogen in silicon induced by low energy ion bombardment
Stoddard, N., Duscher, G., Karoui, A., Stevie, F., & Rozgonyi, G. (2005, April 6). Journal of Applied Physics.
2003 article
In Situ Point Defect Generation and Agglomeration during Electron-Beam Irradiation of Nitrogen-Doped Czochralski Silicon
Stoddard, N., Karoui, A., Duscher, G., Kvit, A., & Rozgonyi, G. (2003, January 1). Electrochemical and Solid-State Letters.