2007 journal article
Impact of metal gates on remote phonon scattering in titanium nitride/hafnium dioxide n-channel metal-oxide-semiconductor field effect transistors-low temperature electron mobility study
Journal of Applied Physics, 102(11).
2006 journal article
Process optimization for high electron mobility in nMOSFETs with aggressively scaled HfO2/metal stacks
IEEE Electron Device Letters, 27(7), 591–594.
2004 journal article
Impact of gate-to-source/drain overlap length on 80-nm CMOS circuit performance
IEEE Transactions on Electron Devices, 51(3), 409–414.
2003 journal article
A simulation study to evaluate the feasibility of midgap workfunction metal gates in 25 nm bulk CMOS
IEEE Electron Device Letters, 24(11), 707–709.
