2007 journal article

Impact of metal gates on remote phonon scattering in titanium nitride/hafnium dioxide n-channel metal-oxide-semiconductor field effect transistors-low temperature electron mobility study

Journal of Applied Physics, 102(11).

By: K. Maitra, M. Frank, V. Narayanan, V. Misra & E. Cartier

Source: NC State University Libraries
Added: August 6, 2018

2006 journal article

Process optimization for high electron mobility in nMOSFETs with aggressively scaled HfO2/metal stacks

IEEE Electron Device Letters, 27(7), 591–594.

By: V. Narayanan, K. Maitra, B. Linder, V. Paruchuri, E. Gusev, P. Jamison, M. Frank, A. Steen ...

Source: NC State University Libraries
Added: August 6, 2018

2004 journal article

Impact of gate-to-source/drain overlap length on 80-nm CMOS circuit performance

IEEE Transactions on Electron Devices, 51(3), 409–414.

By: K. Maitra & N. Bhat

Source: NC State University Libraries
Added: August 6, 2018

2003 journal article

A simulation study to evaluate the feasibility of midgap workfunction metal gates in 25 nm bulk CMOS

IEEE Electron Device Letters, 24(11), 707–709.

By: K. Maitra & V. Misra

Source: NC State University Libraries
Added: August 6, 2018