Jaehoon Lee

Chen, B., Jha, R., Lazar, H., Biswas, N., Lee, J., Lee, B., … Misra, V. (2006). Influence of oxygen diffusion through capping layers of low work function metal gate electrodes. IEEE ELECTRON DEVICE LETTERS, 27(4), 228–230. https://doi.org/10.1109/LED.2006.871184

Suh, Y. S., Lazar, H., Chen, B., Lee, J. H., & Misra, V. (2005). Electrical characteristics of HfO2 dielectrics with Ru metal gate electrodes. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 152(9), F138–F141. https://doi.org/10.1149/1.1992467

Chen, B., Suh, Y., Lee, J., Gurganus, J., Misra, V., & Cabral, C. (2005). Physical and electrical analysis of RuxYy alloys for gate electrode applications. APPLIED PHYSICS LETTERS, 86(5). https://doi.org/10.1063/1.1857093