Scott C. Beeler

Dietz, N., Beeler, S. C., Schmidt, J. W., & Tran, H. T. (2001). Surface reaction kinetics of Ga1-xInxP growth during pulsed chemical beam epitaxy. APPLIED SURFACE SCIENCE, 178(1-4), 63–74. https://doi.org/10.1016/S0169-4332(01)00302-6

Beeler, S. C., Tran, H. T., & Banks, H. T. (2000). Feedback control methodologies for nonlinear systems. JOURNAL OF OPTIMIZATION THEORY AND APPLICATIONS, 107(1), 1–33. https://doi.org/10.1023/A:1004607114958

Beeler, S., Tran, H. T., & Dietz, N. (1999). Representation of GaP formation by a reduced order surface kinetics model using p-polarized reflectance measurements. JOURNAL OF APPLIED PHYSICS, 86(1), 674–682. https://doi.org/10.1063/1.370783

Bachmann, K. J., Sukidi, N., Hopfner, C., Harris, C., Dietz, N., Tran, H. T., … Banks, H. T. (1998). Real-time monitoring of steady-state pulsed chemical beam epitaxy by p-polarized reflectance. JOURNAL OF CRYSTAL GROWTH, 183(3), 323–337. https://doi.org/10.1016/s0022-0248(97)00410-7

Bachmann, K. J., Hopfner, C., Sukidi, N., Miller, A. E., Harris, C. J., Aspnes, D. E., … Banks, H. T. (1997). Molecular layer epitaxy by real-time optical process monitoring. Applied Surface Science, 112(1997 Mar.), 38–47. https://doi.org/10.1016/S0169-4332(96)00975-0