2007 journal article

Transmission electron microscopy studies of regrown GaN Ohmic contacts on patterned substrates for metal oxide semiconductor field effect transistor applications

Applied Physics Letters, 90(20).

Source: NC State University Libraries
Added: August 6, 2018

2005 journal article

Characterization and modeling of AlGaN/GaN MOS capacitor with leakage for large signal transistor modeling

IEEE Microwave and Wireless Components Letters, 15(10), 664–666.

By: K. Dandu, Y. Saripalli, D. Braddock, M. Johnson & D. Barlage

Source: NC State University Libraries
Added: August 6, 2018