Zhengmao Zhu

Works (5)

Updated: July 5th, 2023 15:56

2007 article

Carbon-13 Labeling for Quantitative Analysis of Molecular Movement in Heterogeneous Organic Materials Using Secondary Ion Mass Spectrometry

Harton, S. E., Zhu, Z., Stevie, F. A., Aoyama, Y., & Ade, H. (2007, June 8). Analytical Chemistry, Vol. 79, pp. 5358–5363.

By: S. Harton n, Z. Zhu n, F. Stevie n, Y. Aoyama n & H. Ade n 

topics (OpenAlex): Ion-surface interactions and analysis; Mass Spectrometry Techniques and Applications; Analytical chemistry methods development
TL;DR: Extension of this method to more complicated biological systems involving multiple heteroatoms, layers, and heterogeneous interfaces, as well as two- and three-dimensional profiling and imaging using SIMS, can be envisaged. (via Semantic Scholar)
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Sources: Web Of Science, NC State University Libraries
Added: August 6, 2018

2007 article

Mass fractionation of carbon and hydrogen secondary ions upon Cs+ and O2+ bombardment of organic materials

Harton, S. E., Zhu, Z., Stevie, F. A., Griffis, D. P., & Ade, H. (2007, April 2). Journal of Vacuum Science & Technology A Vacuum Surfaces and Films, Vol. 25, pp. 480–484.

By: S. Harton n, Z. Zhu n, F. Stevie n, D. Griffis n & H. Ade n 

topics (OpenAlex): Ion-surface interactions and analysis; Mass Spectrometry Techniques and Applications; Nuclear Physics and Applications
Sources: Web Of Science, NC State University Libraries
Added: August 6, 2018

2007 article

Model study of electron beam charge compensation for positive secondary ion mass spectrometry using a positive primary ion beam

Zhu, Z., Stevie, F. A., & Griffis, D. P. (2007, October 11). Applied Surface Science.

By: Z. Zhu n, F. Stevie n & D. Griffis n

topics (OpenAlex): Ion-surface interactions and analysis; Electron and X-Ray Spectroscopy Techniques; Analytical chemistry methods development
Source: NC State University Libraries
Added: August 6, 2018

2006 article

Carbon-13 Labeled Polymers:  An Alternative Tracer for Depth Profiling of Polymer Films and Multilayers Using Secondary Ion Mass Spectrometry

Harton, S. E., Stevie, F. A., Zhu, Z., & Ade, H. (2006, April 8). Analytical Chemistry, Vol. 78, pp. 3452–3460.

By: S. Harton n, F. Stevie n, Z. Zhu n & H. Ade n 

topics (OpenAlex): Ion-surface interactions and analysis; Mass Spectrometry Techniques and Applications; Diamond and Carbon-based Materials Research
TL;DR: Through normalization of the 13C secondary ion yield to the total C (12C + 13C) ion yield, the observed effects through the PS/PMMA interface can be greatly minimized, thereby significantly improving analysis of polymer films and multilayers using SIMS. (via Semantic Scholar)
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Sources: Web Of Science, NC State University Libraries
Added: August 6, 2018

2006 article

Thermal stability of lanthanum scandate dielectrics on Si(100)

Sivasubramani, P., Lee, T. H., Kim, M. J., Kim, J., Gnade, B. E., Wallace, R. M., … Griffis, D. P. (2006, December 11). Applied Physics Letters, Vol. 89.

By: P. Sivasubramani *, T. Lee*, M. Kim*, J. Kim *, B. Gnade *, R. Wallace *, L. Edge*, D. Schlom * ...

topics (OpenAlex): Semiconductor materials and devices; Integrated Circuits and Semiconductor Failure Analysis; Electronic and Structural Properties of Oxides
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7. Affordable and Clean Energy (OpenAlex)
Sources: Web Of Science, NC State University Libraries
Added: August 6, 2018

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