Zhengmao Zhu

Model study of electron beam charge compensation for positive secondary ion mass spectrometry using a positive primary ion beam

Applied Surface Science, 254(9), 2708–2711.

Carbon-13 labeling for quantitative analysis of molecular movement in heterogeneous organic materials using secondary ion mass spectrometry

ANALYTICAL CHEMISTRY, 79(14), 5358–5363.

Mass fractionation of carbon and hydrogen secondary ions upon Cs+ and O-2(+) bombardment of organic materials

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 25(3), 480–484.

Carbon-13 labeled polymers: An alternative tracer for depth profiling of polymer films and multilayers using secondary ion mass spectrometry

ANALYTICAL CHEMISTRY, 78(10), 3452–3460.

Thermal stability of lanthanum scandate dielectrics on Si(100)

APPLIED PHYSICS LETTERS, 89(24).