Saurabh Chopra

Alptekin, E., Ozturk, M. C., Misra, V., Cho, Y., Kim, Y., & Chopra, S. (2009). Erbium Silicide Formation on Si1-xCx Epitaxial Layers. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 156(5), H378–H383. https://doi.org/10.1149/1.3097189

Ozturk, M., Misra, V., & Chopra, S. (2007). Methods of fabricating strained semiconductor-on-insulator field-effect transistors and related devices. Washington, DC: U.S. Patent and Trademark Office.

Zhao, W., Duscher, G., Rozgonyi, G., Zikry, M. A., Chopra, S., & Ozturk, M. C. (2007). Quantitative nanoscale local strain profiling in embedded SiGe metal-oxide-semiconductor structures. APPLIED PHYSICS LETTERS, 90(19). https://doi.org/10.1063/1.2738188

Chopra, S., Ozturk, M. C., Misra, V., Ren, Z., & McNeil, L. E. (2007). The effects of nickel germanosilicide contacts on the biaxial compressive stress in thin epitaxial silicon-germanium alloys on silicon. APPLIED PHYSICS LETTERS, 91(14). https://doi.org/10.1063/1.2795346

Chopra, S., Ozturk, M. C., Misra, V., McGuire, K., & McNeil, L. E. (2006). Analysis of boron strain compensation in silicon-germanium alloys by Raman spectroscopy. APPLIED PHYSICS LETTERS, 88(20). https://doi.org/10.1063/1.2205752

Rao, A. M., & Chopra, S. (2006). Carbon nanotube based resonant-circuit sensor. Washington, DC: U.S. Patent and Trademark Office.

Chopra, S., Ozturk, M. C., Misra, V., McGuire, K., & McNeil, L. E. (2006). Critical thickness of heavily boron-doped silicon-germanium alloys. APPLIED PHYSICS LETTERS, 89(20). https://doi.org/10.1063/1.2374870