Irina Bondarenko

Kononchuk, O., Bondarenko, I., & Rozgonyi, G. (1998). Combined MOS/EBIC and TEM study of electrically active defects in SOI wafers. Diffusion and Defect Data. [Pt. B], Solid State Phenomena, 63-4(1998), 61–67.

Beaman, K. L., Agarwal, A., Kononchuk, O., Koveshnikov, S., Bondarenko, I., & Rozgonyi, G. A. (1997). Gettering of iron in silicon-on-insulator wafers. APPLIED PHYSICS LETTERS, 71(8), 1107–1109. https://doi.org/10.1063/1.119741

Brown, R. A., Kononchuk, O., Bondarenko, I., Romanowski, A., Radzimski, Z., Rozgonyi, G. A., & Gonzalez, F. (1997). Metallic impurity gettering and secondary defect formation in megaelectron volt self-implanted Czochralski and float-zone silicon. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 144(8), 2872–2881. https://doi.org/10.1149/1.1837910