1999 journal article
Cobalt suicide formation on 6H silicon carbide
Journal of Synchrotron Radiation, 6(1999 May 1), 188–189.
By: A. Porto, B. Boyanov, D. Sayers & R. Nemanich
Estimation of uncertainties in XAFS data
Journal of Synchrotron Radiation, 6(1999 May 1), 264–265.
By: M. Newville, B. Boyanov & D. Sayers
Germanium segregation in the Co/SiGe/Si(001) thin film system
Journal of Materials Research, 14(11), 4372–4384.
By: P. Goeller, B. Boyanov, D. Sayers, R. Nemanich, A. Myers & E. Steel
Growth of epitaxial CoSi2 on SiGe(001)
Journal of Applied Physics, 86(3), 1355–1362.
By: B. Boyanov, P. Goeller, D. Sayers & R. Nemanich
Role of the substrate strain in the sheet resistance stability of NiSi deposited on Si (100)
Journal of Applied Physics, 85(7), 3614–3618.
By: E. Maillard-Schaller, B. Boyanov, S. English & R. Nemanich
The effect of germanium on the Co-SiGe thin-film reaction
Journal of Synchrotron Radiation, 6(1999 May 1), 521–523.
1998 journal article
Co-deposition of cobalt disilicide on silicon-germanium thin films
Thin Solid Films, 320(2), 206–210.
By: P. Goeller, B. Boyanov, D. Sayers & R. Nemanich
Film thickness effects in the Co-Si1-xGex solid phase reaction
Journal of Applied Physics, 84(8), 4285–4291.
In situ studies of metal-semiconductor interactions with synchrotron radiation
Journal of Synchrotron Radiation, 5(3), 1050–1051.
By: D. Sayers, P. Goeller, B. Boyanov & R. Nemanich
1997 journal article
A coupling-of-modes approach to the analysis of STW devices
IEEE Transactions on Ultrasonics Ferroelectrics and Frequency Control, 44(3), 652–657.
By: V. Strashilov, K. Djordjev, B. Boyanov & I. Avramov
Preferential Co-SI bonding at the Co/SiGe(100) interface
Applied Physics Letters, 71(21), 3060–3062.
Structure and stability of cobalt-silicon-germanium thin films
Nuclear Instruments & Methods in Physics Research. Section B, Beam Interactions With Materials and Atoms, 133(1-4), 84–89.
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