Benjamin Watts

Calibrated NEXAFS spectra of common conjugated polymers

Journal of Chemical Physics, 134(2).

Nanomorphology of Bulk Heterojunction Photovoltaic Thin Films Probed with Resonant Soft X-ray Scattering

Nano Letters, 10(8), 2863–2869.

A Quantitative Study of PCBM Diffusion during Annealing of P3HT: PCBM Blend Films

MACROMOLECULES, 42(21), 8392–8397.

Evolution of Laterally Phase-Separated Polyfluorene Blend Morphology Studied by X-ray Spectromicroscopy

MACROMOLECULES, 42(9), 3347–3352.

NEXAFS microscopy of polymeric materials: Successes and challenges encountered when characterizing organic devices

9TH INTERNATIONAL CONFERENCE ON X-RAY MICROSCOPY, Vol. 186.

Predeposition plasma nitridation process applied to Ge substrates to passivate interfaces between crystalline-Ge substrates and Hf-based high-K dielectrics

Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures, 27(1), 294–299.

Role of Solvent Trapping Effects in Determining the Structure and Morphology of Ternary Blend Organic Devices

MACROMOLECULES, 42(8), 3098–3103.

Soft X-Ray Beam Induced Current Technique

9TH INTERNATIONAL CONFERENCE ON X-RAY MICROSCOPY, Vol. 186.

A simple method for determining linear polarization and energy calibration of focused soft X-ray beams

JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 162(2), 49–55.

Evolution of the nanomorphology of photovoltaic polyfluorene blends: sub-100 nm resolution with x-ray spectromicroscopy

NANOTECHNOLOGY, 19(42).

Resonant soft x-ray reflectivity of organic thin films

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 25(3), 575–586.

X-ray microscopy of photovoltaic polyfluorene blends: Relating nanomorphology to device performance

MACROMOLECULES, 40(9), 3263–3270.

X-ray spectromicroscopy of polymer/fullerene composites: Quantitative chemical mapping

Small (Weinheim An Der Bergstrasse, Germany), 2(12), 1432–1435.