Works (3)
2009 article
Carbon Clusters as Possible Defects in the SiC–SiO<SUB>2</SUB> Interface
Dang, H., Gudipati, R., Liu, Y., Li, Y., Liu, Y., Peterson, H. L., … Wang, S. (2009, April 13). Journal of Computational and Theoretical Nanoscience.
2009 article
Relationship between 4H-SiC∕SiO2 transition layer thickness and mobility
Biggerstaff, T. L., Reynolds, C. L., Zheleva, T., Lelis, A., Habersat, D., Haney, S., … Duscher, G. (2009, July 20). Applied Physics Letters.
2007 article
Transmission electron microscopy studies of regrown GaN Ohmic contacts on patterned substrates for metal oxide semiconductor field effect transistor applications
Saripalli, Y. N., Pei, L., Biggerstaff, T., Ramachandran, S., Duscher, G. J., Johnson, M. A. L., … Barlage, D. W. (2007, May 14). Applied Physics Letters.