2009 journal article
Carbon Clusters as Possible Defects in the SiC-SiO2 Interface
JOURNAL OF COMPUTATIONAL AND THEORETICAL NANOSCIENCE, 6(6), 1305–1310.
2009 journal article
Relationship between 4H-SiC/SiO2 transition layer thickness and mobility
APPLIED PHYSICS LETTERS, 95(3).
2007 journal article
Transmission electron microscopy studies of regrown GaN Ohmic contacts on patterned substrates for metal oxide semiconductor field effect transistor applications
APPLIED PHYSICS LETTERS, 90(20).
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