2008 journal article

Detailed arsenic concentration profiles at Si/SiO2 interfaces

Journal of Applied Physics, 104(4).

By: L. Pei, G. Duscher, C. Steen, P. Pichler, H. Ssel, E. Napolitani, D. De Salvador, A. Piro ...

Source: NC State University Libraries
Added: August 6, 2018

2008 journal article

stee Distribution and segregation of arsenic at the SiO2/Si interface

Journal of Applied Physics, 104(2).

By: C. Steen, A. Martinez-Limia, P. Pichler, H. Ryssel, S. Paul, W. Lerch, L. Pei, G. Duscher ...

Source: NC State University Libraries
Added: August 6, 2018

2007 journal article

Transmission electron microscopy studies of regrown GaN Ohmic contacts on patterned substrates for metal oxide semiconductor field effect transistor applications

Applied Physics Letters, 90(20).

Source: NC State University Libraries
Added: August 6, 2018