2008 journal article
Detailed arsenic concentration profiles at Si/SiO2 interfaces
Journal of Applied Physics, 104(4).
2008 journal article
stee Distribution and segregation of arsenic at the SiO2/Si interface
Journal of Applied Physics, 104(2).
2007 journal article
Transmission electron microscopy studies of regrown GaN Ohmic contacts on patterned substrates for metal oxide semiconductor field effect transistor applications
APPLIED PHYSICS LETTERS, 90(20).
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