Lirong Pei

Pei, L., Duscher, G., Steen, C., Pichler, P., Ssel, H. R., Napolitani, E., … Windl, W. (2008). Detailed arsenic concentration profiles at Si/SiO2 interfaces. Journal of Applied Physics, 104(4).

Steen, C., Martinez-Limia, A., Pichler, P., Ryssel, H., Paul, S., Lerch, W., … Windl, W. (2008). stee Distribution and segregation of arsenic at the SiO2/Si interface. Journal of Applied Physics, 104(2).

Saripalli, Y. N., Pei, L., Biggerstaff, T., Ramachandran, S., Duscher, G. J., Johnson, M. A. L., … Barlage, D. W. (2007). Transmission electron microscopy studies of regrown GaN Ohmic contacts on patterned substrates for metal oxide semiconductor field effect transistor applications. APPLIED PHYSICS LETTERS, 90(20). https://doi.org/10.1063/1.2741123