Yawei Jin

Works (1)

Updated: July 5th, 2023 15:55

2007 article

Analytical threshold voltage model with TCAD simulation verification for design and evaluation of tri-gate MOSFETs

Jin, Y., Zeng, C., Ma, L., & Barlage, D. (2007, March 1). Solid-State Electronics.

By: Y. Jin n, C. Zeng n, L. Ma n & D. Barlage n

author keywords: MOSFET; device modeling; analytical models; threshold voltage; double gate; FinFET; tri-gate; triple gate; undoped; inversion; TCAD simulation
topics (OpenAlex): Advancements in Semiconductor Devices and Circuit Design; Semiconductor materials and devices; Silicon Carbide Semiconductor Technologies
Source: Web Of Science
Added: August 6, 2018

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