Works (10)

Updated: July 5th, 2023 16:04

1999 journal article

Germanium segregation in the Co/SiGe/Si(001) thin film system

JOURNAL OF MATERIALS RESEARCH, 14(11), 4372–4384.

By: P. Goeller n, B. Boyanov n, D. Sayers n, R. Nemanich n, A. Myers* & E. Steel*

co-author countries: United States of America 🇺🇸
Source: Web Of Science
Added: August 6, 2018

1999 journal article

Growth of epitaxial CoSi2 on SiGe(001)

JOURNAL OF APPLIED PHYSICS, 86(3), 1355–1362.

By: B. Boyanov n, P. Goeller n, D. Sayers n & R. Nemanich n

co-author countries: United States of America 🇺🇸
Source: Web Of Science
Added: August 6, 2018

1999 article

The effect of germanium on the Co-SiGe thin-film reaction

Boyanov, B. I., Goeller, P. T., Sayers, D. E., & Nemanich, R. J. (1999, May 1). JOURNAL OF SYNCHROTRON RADIATION, Vol. 6, pp. 521–523.

By: B. Boyanov*, P. Goeller*, D. Sayers* & R. Nemanich*

author keywords: cobalt silicide; silicon-germanium; thickness effects; interfacial bonding; molecular beam epitaxy
Source: Web Of Science
Added: August 6, 2018

1998 journal article

Co-deposition of cobalt disilicide on silicon-germanium thin films

THIN SOLID FILMS, 320(2), 206–210.

By: P. Goeller n, B. Boyanov n, D. Sayers n & R. Nemanich n

co-author countries: United States of America 🇺🇸
author keywords: cobalt disilicide; silicon-germanium alloys; EXAFS
Source: Web Of Science
Added: August 6, 2018

1998 journal article

Film thickness effects in the Co-Si1-xGex solid phase reaction

JOURNAL OF APPLIED PHYSICS, 84(8), 4285–4291.

By: B. Boyanov n, P. Goeller n, D. Sayers n & R. Nemanich n

co-author countries: United States of America 🇺🇸
Source: Web Of Science
Added: August 6, 2018

1998 article

In situ studies of metal-semiconductor interactions with synchrotron radiation

Sayers, D. E., Goeller, P. T., Boyanov, B. I., & Nemanich, R. J. (1998, May 1). JOURNAL OF SYNCHROTRON RADIATION, Vol. 5, pp. 1050–1051.

By: D. Sayers n, P. Goeller n, B. Boyanov n & R. Nemanich n

co-author countries: United States of America 🇺🇸
author keywords: EXAFS; metal-semiconductor contacts; silicon-germanium alloys; molecular-beam epitaxy
Source: Web Of Science
Added: August 6, 2018

1997 article

An integrated growth and analysis system for in-situ XAS studies of metal-semiconductor interactions

Wang, Z., Goeller, P. T., Boyanov, B. I., Sayers, D. E., & Nemanich, R. J. (1997, April). JOURNAL DE PHYSIQUE IV, Vol. 7, pp. 561–564.

By: Z. Wang n, P. Goeller n, B. Boyanov n, D. Sayers n & R. Nemanich n

co-author countries: United States of America 🇺🇸
Source: Web Of Science
Added: August 6, 2018

1997 journal article

Preferential Co-SI bonding at the Co/SiGe(100) interface

Applied Physics Letters, 71(21), 3060–3062.

By: B. Boyanov*, P. Goeller*, D. Sayers* & R. Nemanich

Source: NC State University Libraries
Added: August 6, 2018

1997 article

Structure and stability of cobalt-silicon-germanium thin films

Goeller, P. T., Boyanov, B. I., Sayers, D. E., & Nemanich, R. J. (1997, December). NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, Vol. 133, pp. 84–89.

By: P. Goeller n, B. Boyanov n, D. Sayers n & R. Nemanich n

co-author countries: United States of America 🇺🇸
author keywords: cobalt silicide; silicon-germanium alloys; metal-semiconductor contacts; molecular beam epitaxy
Source: Web Of Science
Added: August 6, 2018

1996 patent

Oriented diamond film structures on non-diamond substrates

Washington, DC: U.S. Patent and Trademark Office.

By: J. Glass, D. Simendinger & P. Goeller

Source: NC State University Libraries
Added: August 6, 2018

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