Peter T. Goeller

Goeller, P. T., Boyanov, B. I., Sayers, D. E., Nemanich, R. J., Myers, A. F., & Steel, E. B. (1999). Germanium segregation in the Co/SiGe/Si(001) thin film system. Journal of Materials Research, 14(11), 4372–4384. https://doi.org/10.1557/JMR.1999.0592

Boyanov, B. I., Goeller, P. T., Sayers, D. E., & Nemanich, R. J. (1999). Growth of epitaxial CoSi2 on SiGe(001). Journal of Applied Physics, 86(3), 1355–1362. https://doi.org/10.1063/1.370894

Boyanov, B. I., Goeller, P. T., Sayers, D. E., & Nemanich, R. J. (1999). The effect of germanium on the Co-SiGe thin-film reaction. Journal of Synchrotron Radiation, 6(1999 May 1), 521–523. https://doi.org/10.1107/S0909049599000060

Goeller, P. T., Boyanov, B. I., Sayers, D. E., & Nemanich, R. J. (1998). Co-deposition of cobalt disilicide on silicon-germanium thin films. Thin Solid Films, 320(2), 206–210. https://doi.org/10.1016/S0040-6090(97)00941-3

Boyanov, B. I., Goeller, P. T., Sayers, D. E., & Nemanich, R. J. (1998). Film thickness effects in the Co-Si1-xGex solid phase reaction. Journal of Applied Physics, 84(8), 4285–4291. https://doi.org/10.1063/1.368872

Sayers, D. E., Goeller, P. T., Boyanov, B. I., & Nemanich, R. J. (1998). In situ studies of metal-semiconductor interactions with synchrotron radiation. Journal of Synchrotron Radiation, 5(3), 1050–1051. https://doi.org/10.1107/S0909049597015240

Wang, Z., Goeller, P. T., Boyanov, B. I., Sayers, D. E., & Nemanich, R. J. (1997). An integrated growth and analysis system for in-situ XAS studies of metal-semiconductor interactions. Journal De Physique. IV, 7(C2 pt.1), 561–564. https://doi.org/10.1051/jp4/1997096

Boyanov, B. I., Goeller, P. T., Sayers, D. E., & Nemanich, R. J. (1997). Preferential Co-SI bonding at the Co/SiGe(100) interface. Applied Physics Letters, 71(21), 3060–3062. https://doi.org/10.1063/1.119436

Goeller, P. T., Boyanov, B. I., Sayers, D. E., & Nemanich, R. J. (1997). Structure and stability of cobalt-silicon-germanium thin films. Nuclear Instruments & Methods in Physics Research. Section B, Beam Interactions With Materials and Atoms, 133(1-4), 84–89. https://doi.org/10.1016/S0168-583X(97)00458-8

Glass, J. T., Simendinger, D. T., & Goeller, P. T. (1996). Oriented diamond film structures on non-diamond substrates. Washington, DC: U.S. Patent and Trademark Office.