Christopher J. Harris

Works (7)

Updated: March 10th, 2025 12:14

2008 patent

Gallium nitride based high-electron mobility devices

Washington, DC: U.S. Patent and Trademark Office.

By: C. Harris, T. Gehrke, T. Weeks & C. Basceri

Source: NC State University Libraries
Added: August 6, 2018

2008 patent

Method of manufacturing gallium nitride based high-electron mobility devices

Washington, DC: U.S. Patent and Trademark Office.

By: C. Harris, T. Gehrke, T. Weeks & C. Basceri

Source: NC State University Libraries
Added: August 6, 2018

2008 patent

Vertical junction field effect transistor having an epitaxial gate

Washington, DC: U.S. Patent and Trademark Office.

By: C. Harris, A. Konstantinov & C. Basceri

Source: NC State University Libraries
Added: August 6, 2018

2007 patent

Method of manufacturing a vertical junction field effect transistor having an epitaxial gate

Washington, DC: U.S. Patent and Trademark Office.

By: C. Harris, A. Konstantinov & C. Basceri

Source: NC State University Libraries
Added: August 6, 2018

1998 article

Real-time monitoring of steady-state pulsed chemical beam epitaxy by p-polarized reflectance

Bachmann, K. J., Sukidi, N., Höpfner, C., Harris, C., Dietz, N., Tran, H. T., … Banks, H. T. (1998, January 1). Journal of Crystal Growth, Vol. 183, pp. 323–337.

By: K. Bachmann n, N. Sukidi n, C. Höpfner n, C. Harris n, N. Dietz n, H. Tran n , S. Beeler n, K. Ito n, H. Banks n

author keywords: p-polarized reflectance; surface kinetics; chemical beam epitaxy; real-time process monitoring
topics (OpenAlex): Advanced Chemical Physics Studies; Spectroscopy and Quantum Chemical Studies; Photochemistry and Electron Transfer Studies
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Sources: Web Of Science, NC State University Libraries
Added: August 6, 2018

1997 article

Molecular layer epitaxy by real-time optical process monitoring

Bachmann, K. J., Höpfner, C., Sukidi, N., Miller, A. E., Harris, C., Aspnes, D. E., … Rossow, U. (1997, March 1). Applied Surface Science, Vol. 112, pp. 38–47.

By: K. Bachmann n, C. Höpfner n, N. Sukidi n, A. Miller n, C. Harris n, D. Aspnes n , N. Dietz n, H. Tran n  ...

topics (OpenAlex): Semiconductor Quantum Structures and Devices; Semiconductor materials and devices; Force Microscopy Techniques and Applications
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Sources: NC State University Libraries, NC State University Libraries
Added: August 6, 2018

1997 article

Real-time monitoring of surface processes by p-polarized reflectance

Dietz, N., Sukidi, N., Harris, C., & Bachmann, K. J. (1997, May 1). Journal of Vacuum Science & Technology A Vacuum Surfaces and Films.

By: N. Dietz n, N. Sukidi n, C. Harris n & K. Bachmann n

topics (OpenAlex): Semiconductor Quantum Structures and Devices; Semiconductor Lasers and Optical Devices; GaN-based semiconductor devices and materials
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Source: Web Of Science
Added: August 6, 2018

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