@misc{harris_gehrke_weeks_basceri_2008, title={Gallium nitride based high-electron mobility devices}, volume={7,326,971}, number={2008 Feb. 5}, publisher={Washington, DC: U.S. Patent and Trademark Office}, author={Harris, C. and Gehrke, T. and Weeks, T. W. and Basceri, C.}, year={2008} } @misc{harris_gehrke_weeks_basceri_2008, title={Method of manufacturing gallium nitride based high-electron mobility devices}, volume={7,364,988}, number={2008 Apr. 29}, publisher={Washington, DC: U.S. Patent and Trademark Office}, author={Harris, C. and Gehrke, T. and Weeks, T. W. and Basceri, C.}, year={2008} } @misc{harris_konstantinov_basceri_2008, title={Vertical junction field effect transistor having an epitaxial gate}, volume={7,355,223}, number={2008 Apr. 8}, publisher={Washington, DC: U.S. Patent and Trademark Office}, author={Harris, C. and Konstantinov, A. and Basceri, C.}, year={2008} } @misc{harris_konstantinov_basceri_2007, title={Method of manufacturing a vertical junction field effect transistor having an epitaxial gate}, volume={7,279,368}, number={2007 Oct. 9}, publisher={Washington, DC: U.S. Patent and Trademark Office}, author={Harris, C. and Konstantinov, A. and Basceri, C.}, year={2007} } @article{bachmann_sukidi_hopfner_harris_dietz_tran_beeler_ito_banks_1998, title={Real-time monitoring of steady-state pulsed chemical beam epitaxy by p-polarized reflectance}, volume={183}, DOI={10.1016/s0022-0248(97)00410-7}, number={3}, journal={Journal of Crystal Growth}, author={Bachmann, K. J. and Sukidi, N. and Hopfner, C. and Harris, C. and Dietz, N. and Tran, Hien and Beeler, S. and Ito, K. and Banks, H. T.}, year={1998}, pages={323–337} } @article{bachmann_hopfner_sukidi_miller_harris_aspnes_dietz_tran_beeler_ito_et al._1997, title={Molecular layer epitaxy by real-time optical process monitoring}, volume={112}, DOI={10.1016/S0169-4332(96)00975-0}, number={1997 Mar.}, journal={Applied Surface Science}, author={Bachmann, K. J. and Hopfner, C. and Sukidi, N. and Miller, A. E. and Harris, C. J. and Aspnes, D. E. and Dietz, N. A. and Tran, Hien and Beeler, S. C. and Ito, K. and et al.}, year={1997}, pages={38–47} } @article{dietz_sukidi_harris_bachmann_1997, title={Real-time monitoring of surface processes by p-polarized reflectance}, volume={15}, DOI={10.1116/1.580712}, number={3 pt.1}, journal={Journal of Vacuum Science & Technology. A, Vacuum, Surfaces, and Films}, author={Dietz, N. and Sukidi, N. and Harris, C. Jay and Bachmann, K. J.}, year={1997}, pages={807–815} }