Kenneth Jarrendahl

Works (10)

Updated: February 10th, 2025 16:17

2001 journal article

Ordinary and extraordinary dielectric functions of 4H-and 6H-SiC from 3.5 to 9.0 eV

APPLIED PHYSICS LETTERS, 78(18), 2715–2717.

By: O. Lindquist*, K. Jarrendahl*, S. Peters *, J. Zettler*, C. Cobet *, N. Esser *, D. Aspnes n , A. Henry *, N. Edwards*

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Sources: Web Of Science, NC State University Libraries
Added: August 6, 2018

2000 journal article

Ion implanted dopants in GaN and AlN: Lattice sites, annealing behavior, and defect recovery

JOURNAL OF APPLIED PHYSICS, 87(5), 2149–2157.

By: C. Ronning*, M. Dalmer*, M. Uhrmacher*, M. Restle*, U. Vetter*, L. Ziegeler*, H. Hofsass*, T. Gehrke n, K. Jarrendahl n, R. Davis n

Source: Web Of Science
Added: August 6, 2018

2000 article

Real-time assessment of overlayer removal on 4H-SiC surfaces: Techniques and relevance to contact formation

SILICON CARBIDE AND RELATED MATERIALS - 1999 PTS, 1 & 2, Vol. 338-3, pp. 1033–1036.

By: N. Edwards*, L. Madsen *, K. Robbie*, G. Powell n, K. Jarrendahl*, C. Cobet *, N. Esser *, W. Richter *, D. Aspnes n 

author keywords: cleaning; contact; spectroscopic ellipsometry; surface preparation; synchrotron
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Sources: Web Of Science, NC State University Libraries
Added: August 6, 2018

2000 journal article

Real-time assessment of selected surface preparation regimens for 4H-SiC surfaces using spectroscopic ellipsometry

SURFACE SCIENCE, 464(1), L703–L707.

By: N. Edwards*, K. Jarrendahl*, D. Aspnes n , K. Robbie*, G. Powell n, C. Cobet *, N. Esser *, W. Richter *, L. Madsen *

author keywords: contact; ellipsometry; etching; semiconducting surfaces; silicon carbide; vicinal single crystal surfaces
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Sources: Web Of Science, NC State University Libraries
Added: August 6, 2018

1998 article

Growth of highly (0001)-oriented aluminum nitride thin films with smooth surfaces on silicon carbide by gas-source molecular beam epitaxy

Jarrendahl, K., Smith, S. A., Zheleva, T., Kern, R. S., & Davis, R. F. (1998, March). VACUUM, Vol. 49, pp. 189–191.

By: K. Jarrendahl n, S. Smith n, T. Zheleva n, R. Kern n & R. Davis n

Source: Web Of Science
Added: August 6, 2018

1998 journal article

Materials properties and characterization of SiC

SIC MATERIALS AND DEVICES, 52, 1–20.

By: K. Jarrendahl* & R. Davis n

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7. Affordable and Clean Energy (Web of Science; OpenAlex)
Source: Web Of Science
Added: August 6, 2018

1998 article

Multiple sample analysis of spectroscopic ellipsometry data of semi-transparent films

Jarrendahl, K., & Arwin, H. (1998, February). THIN SOLID FILMS, Vol. 313, pp. 114–118.

By: K. Jarrendahl n & H. Arwin *

author keywords: spectroscopic ellipsometry; multiple sample analysis; Ta2O5; ScN; CeO2
Source: Web Of Science
Added: August 6, 2018

1997 article

Growth and doping via gas-source molecular beam epitaxy of SiC and SiC/AlN heterostructures and their microstructural and electrical characterization

Kern, R. S., Jarrendahl, K., Tanaka, S., & Davis, R. F. (1997, August). DIAMOND AND RELATED MATERIALS, Vol. 6, pp. 1282–1288.

By: R. Kern n, K. Jarrendahl n, S. Tanaka  n & R. Davis n

author keywords: silicon carbide; aluminum nitride; molecular beam epitaxy; kinetics
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Source: Web Of Science
Added: August 6, 2018

1997 journal article

Homoepitaxial SiC growth by molecular beam epitaxy

Physica Status Solidi. B, Basic Solid State Physics, 202(1), 379–404.

By: R. Kern, K. Jarrendahl, S. Tanaka & R. Davis

Source: NC State University Libraries
Added: August 6, 2018

1997 journal article

Microstructure evolution in amorphous Ge/Si multilayers grown by magnetron sputter deposition

JOURNAL OF MATERIALS RESEARCH, 12(7), 1806–1815.

By: K. Jarrendahl*, I. Ivanov *, J. Sundgren*, G. Radnoczi*, Z. Czigany * & J. Greene*

Source: Web Of Science
Added: August 6, 2018

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